Operation of Single-Chip MOSFET and IGBT Devices after failure due to repetitive avalanche [Electronic resource]
statement of authorship
Andrei Blinov, Staffan Norrga and Gabriel Tibola
location of publication
[S.l.]
publisher
year of publication
pages
p. 1-9 : ill. [USB]
conference name, date
17th European Conference on Power Electronics and Applications, EPE 2015 ECCE Europe, 8-10 September, 2015
conference location
Geneva, Switzerland
subject term
keyword
device characterisation
ISBN
9789075815238
notes
Bibliogr.: 7 ref
CERN = European Organization for Nuclear Research
TTÜ department
language
inglise
Blinov, A., Norrga, S., Tibola, G. Operation of Single-Chip MOSFET and IGBT Devices after failure due to repetitive avalanche [Electronic resource] // EPE'15 ECCE Europe : 8-10 September 2015, Geneva, Switzerland : 17th European Conference on Power Electronics and Applications. [S.l.] : CERN, 2015. p. 1-9 : ill. [USB].