Synthesis of high-level decision diagrams for functional test pattern generation
statement of authorship
Raimund Ubar, Jaan Raik, Anton Karputkin, Mati Tombak
source
Proceedings of the 16th International Conference Mixed Design of Integrated Circuits and Systems MIXDES 2009 : Lodz, Poland, 25-27 June, 2009
location of publication
Lodz
publisher
year of publication
pages
p. 519-524 : ill
subject term
keyword
register transfer level modeling decision diagams
symbolic execution
superposition of graphs
ISBN
978-83-928756-0-4
notes
Bibliogr.: 33 ref
TTÜ department
language
inglise
Ubar, R.-J., Raik, J., Karputkin, A., Tombak, M. Synthesis of high-level decision diagrams for functional test pattern generation // Proceedings of the 16th International Conference Mixed Design of Integrated Circuits and Systems MIXDES 2009 : Lodz, Poland, 25-27 June, 2009. Lodz : Technical University of Lodz, 2009. p. 519-524 : ill.