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Cibakova, Tatiana (author)
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1
book article
Defect oriented fault coverage of 100stuck-at fault test sets
Blyzniuk, M.
;
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Lobur, M.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 2000
2000
/
p. 511-516 : ill
book article
2
book article
Defect-oriented library builder and hierarchical test generation
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 2001
2001
/
p. 163-168 : ill
book article
3
book article
Defect-oriented test generation using probabilistic estimation
Cibakova, Tatiana
;
Fischerova, Maria
;
Gramatova, Elena
;
Kuzmicz, W.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the 8th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2001 : Zakopane, Poland, 21-23 June 2000
2001
/
p. 131-136 : ill
book article
4
book article
Hierarchical defect level test quality analysis
Blyzniuk, M.
;
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Lobur, M.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
VILAB User Forum
2000
/
[11] p
book article
5
book article
Hierarchical defect-oriented fault simulation for digital circuits
Blyzniuk, M.
;
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Lobur, M.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE European Test Workshop : 23-26 May 2000, Cascais, Portugal : ETW 2000 : proceedings
2000
/
p. 69-74 : ill
book article
6
book article
Hierarchical defect-oriented fault simulation for digital circuits
Blyzniuk, M.
;
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Lobur, M.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE European Test Workshop
2000
/
p. 151-156
https://ieeexplore.ieee.org/document/873781
book article
7
journal article
Hierarchical test generation for combinational circuits with real defects coverage
Cibakova, Tatiana
;
Fischerova, Maria
;
Gramatova, Elena
;
Kuzmicz, W.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Microelectronics reliability
2002
/
p. 1141-1149 : ill
https://www.sciencedirect.com/science/article/pii/S002627140200080X
journal article
8
book article
Internet-based collaborative test generation with MOSCITO [Electronic resource]
Schneider, Andre
;
Ivask, Eero
;
Miklos, P.
;
Raik, Jaan
;
Diener, Karl-Heinz
;
Ubar, Raimund-Johannes
;
Cibakova, Tatiana
;
Gramatova, Elena
SIGDA publications on CD-ROM : DATE'02 : Design, Automation and Test in Europe, Paris, France, March 4-8, 2002
2002
/
[6] p. [CD-ROM]
https://www.cecs.uci.edu/~papers/date07/PAPERS/2002/DATE02/PDFFILES/02E_2.PDF
book article
9
book article
Test pattern generation at the behavioral level from VHDL circuit description containing several processes
Gramatova, Elena
;
Bezakova, Jana
;
Cibakova, Tatiana
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 145-148
book article
Number of records 9, displaying
1 - 9
author
20
1.
Cibakova, Tatiana
2.
Andrienko, Tatiana
3.
Anisimova, Tatiana
4.
Baranenko, Tatiana
5.
Bochun, Tatiana
6.
Bukanova, Tatiana
7.
Churyumo, Tatiana
8.
Kozyreva, Tatiana
9.
Kruzhilina, Tatiana
10.
Kudriavtseva, Tatiana
11.
Kudryavtseva, Tatiana
12.
Kuznetsova, Tatiana
13.
Moiseeva, Tatiana
14.
Netzeva, Tatiana
15.
Polyakova, Tatiana
16.
Shults, Tatiana
17.
Tennikova, Tatiana
18.
Totskaya, Tatiana
19.
Voropayeva, Tatiana
20.
Yakovleva, Tatiana
name of the person
2
1.
Kudriavtseva, Tatiana
2.
Moiseeva, Tatiana
CV
2
1.
Kulashova, Tatiana 1995
2.
Moiseeva, Tatiana
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