DefSim-based exercises for studying defects in CMOS gates

statement of authorship
Artur Jutman, Witold Pleskacz, Nikolai Boiko, Raimund Ubar
location of publication
Stockholm
year of publication
pages
p. 23-26 : ill
ISBN
91-7178-402-0
notes
Bibliogr.: 8 ref
Jutman, A., Pleskacz, W., Boiko, N., Ubar, R.-J. DefSim-based exercises for studying defects in CMOS gates // EWME 2006 proceedings : 6th International Workshop on Microelectronics Education : 8-9 June, 2006, Stockholm, Sweden. Stockholm : Royal Institute of Technology, 2006. p. 23-26 : ill.