DefSim-based exercises for studying defects in CMOS gates
author
statement of authorship
Artur Jutman, Witold Pleskacz, Nikolai Boiko, Raimund Ubar
location of publication
Stockholm
publisher
year of publication
pages
p. 23-26 : ill
ISBN
91-7178-402-0
notes
Bibliogr.: 8 ref
Jutman, A., Pleskacz, W., Boiko, N., Ubar, R.-J. DefSim-based exercises for studying defects in CMOS gates // EWME 2006 proceedings : 6th International Workshop on Microelectronics Education : 8-9 June, 2006, Stockholm, Sweden. Stockholm : Royal Institute of Technology, 2006. p. 23-26 : ill.