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1
book article
Method for testing the brain
Hinrikus, Hiie
;
Bachmann, Maie
;
Lass, Jaanus
;
Tuulik, Viiu
;
Ubar, Raimund-Johannes
5th European Conference of the International Federation for Medical and Biological Engineering : 14-18 September 2011, Budapest, Hungary
2012
/
p. 1198-1201 : ill
book article
2
book article
On BTI aging rejuvenation in memory address decoders
Gürsoy, Cemil Cem
;
Kraak, Daniel
;
Ahmed, Foisal
;
Taouil, Mottaqiallah
;
Jenihhin, Maksim
;
Hamdioui, Said
2022 IEEE 23rd Latin American Test Symposium, LATS 2022
2022
/
Code 184360
https://doi.org/10.1109/LATS57337.2022.9936940
book article
3
book article
Software-based mitigation for memory address decoder aging
Kraak, D. H. P.
;
Gürsoy, Cemil Cem
;
Jenihhin, Maksim
;
Raik, Jaan
LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019
2019
/
6 p. : ill
https://doi.org/10.1109/LATW.2019.8704595
book article
Number of records 3, displaying
1 - 3
keyword
32
1.
activation memory
2.
cache memory
3.
Digital Object Memory
4.
learning and memory
5.
long short term memory
6.
long short -term memory (LSTM)
7.
long short-term memory
8.
long short-term memory (LSTM)
9.
Long Short-Term Memory Networks (LSTMs)
10.
long-short term memory
11.
long-short-term memory (LSTM)
12.
material with memory
13.
memory
14.
memory architecture
15.
memory bottleneck
16.
memory effect
17.
memory efficiency
18.
memory interconnect test
19.
memory kernels
20.
memory management
21.
memory network
22.
memory systems
23.
memory testing
24.
memory-induced resonance
25.
National memory
26.
non-volatile memory
27.
processing-in-memory
28.
random access memory
29.
relaxed memory
30.
shape memory alloy
31.
Shape memory alloys
32.
shape memory efect
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