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1
book article
Method for testing the brain
Hinrikus, Hiie
;
Bachmann, Maie
;
Lass, Jaanus
;
Tuulik, Viiu
;
Ubar, Raimund-Johannes
5th European Conference of the International Federation for Medical and Biological Engineering : 14-18 September 2011, Budapest, Hungary
2012
/
p. 1198-1201 : ill
book article
2
book article
On BTI aging rejuvenation in memory address decoders
Gürsoy, Cemil Cem
;
Kraak, Daniel
;
Ahmed, Foisal
;
Taouil, Mottaqiallah
;
Jenihhin, Maksim
;
Hamdioui, Said
2022 IEEE 23rd Latin American Test Symposium, LATS 2022
2022
/
Code 184360
https://doi.org/10.1109/LATS57337.2022.9936940
book article
3
book article
Software-based mitigation for memory address decoder aging
Kraak, D. H. P.
;
Gürsoy, Cemil Cem
;
Jenihhin, Maksim
;
Raik, Jaan
LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019
2019
/
6 p. : ill
https://doi.org/10.1109/LATW.2019.8704595
book article
Number of records 3, displaying
1 - 3
keyword
34
1.
activation memory
2.
cache memory
3.
Digital Object Memory
4.
in-memory databases
5.
learning and memory
6.
long short term memory
7.
long short -term memory (LSTM)
8.
long short-term memory
9.
long short-term memory (LSTM)
10.
Long Short-Term Memory Networks (LSTMs)
11.
long-short term memory
12.
long-short-term memory (LSTM)
13.
material with memory
14.
memory
15.
memory architecture
16.
memory bottleneck
17.
memory effect
18.
memory efficiency
19.
memory interconnect test
20.
memory kernels
21.
memory management
22.
memory network
23.
memory overhead
24.
memory systems
25.
memory testing
26.
memory-induced resonance
27.
National memory
28.
non-volatile memory
29.
processing-in-memory
30.
random access memory
31.
relaxed memory
32.
shape memory alloy
33.
Shape memory alloys
34.
shape memory efect
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