List of Index: DOI
- https://doi.org/10.53964/jmn.2021002 (1)
- https://doi.org/10.54007/ijmaf.2022.14.1.91 (1)
- https://doi.org/10.55643/fcaptp.1.42.2022.3646 (1)
- https://doi.org/10.55643/fcaptp.1.42.2022.3723 (1)
- https://doi:10.1007/s10698-016-9257-0 (1)
- https://doi.org////10.1109/ESSDERC.1997.194403 (1)
- https://doi.org//10.1002/ejoc.202100624 (1)
- https://doi.org//10.1007/978-3-030-73955-3 (1)
- https://doi.org//10.1039/d1an01198g (1)
- https://doi.org//10.1063/5.0152628 (1)
- https://doi.org//10.1109/ACCESS.2023.3302348 (1)
- https://doi.org//10.1109/ACCESS.2024.3399168 (1)
- https://doi.org//10.1109/ACCESS.2025.3532858 (1)
- https://doi.org//10.1109/ATS64447.2024.10915463 (1)
- https://doi.org//10.1109/CPE-POWERENG58103.2023.10227480 (1)
- https://doi.org//10.1109/DDECS57882.2023.10139468 (1)
- https://doi.org//10.1109/ICEDEG52154.2021.9530954 (1)
- https://doi.org//10.1109/ICEET60227.2023.10526157 (1)
- https://doi.org//10.1109/RTUCON53541.2021.9711711 (1)
- https://doi.org//10.1109/TCAD.2018.2889772 (1)
- https://doi.org//10.1109/TCSII.2023.3273821 (1)
- https://doi.org//10.1109/TVLSI.2025.3534658 (1)
- https://doi.org//10.1109/VLSI-SoC62099.2024.10767798 (1)
- https://doi.org//10.1371/journal.pone.0300100 (1)
- https://doi.org//10.2139/ssrn.4506432 (1)
Number of records 11649, displaying
1001 - 1025