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26
journal article
Exact parallel critical path fault tracing to speed-up fault simulation in sequential circuits
Kõusaar, Jaak
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Devadze, Sergei
;
Raik, Jaan
International journal of microelectronics and computer science
2018
/
p. 9−18
https://ijmcs.dmcs.pl/web/guest/vol.-9-no.-1
https://ijmcs.dmcs.pl/documents/10630/345460/IJMCS_1_2018_2.pdf
journal article
27
book article
Experimental performance validation of Z-source DC circuit breaker for high impedance faults
Pogulaguntla, Aditya
;
Naik Banavath, Satish
;
Chub, Andrii
;
Vinnikov, Dmitri
;
Singh, Rajendra
2024 IEEE Sixth International Conference on DC Microgrids (ICDCM)
2024
/
5 p
https://doi.org/10.1109/ICDCM60322.2024.10664702
book article
28
book article
Fast and efficient static compaction of test sequences using bipartite graph representations
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
ECS'99 : proceedings of the 2nd Electronic Circuits and Systems Conference : September 6-8, 1999, Bratislava, Slovakia
1999
/
p. 17-20
book article
29
journal article EST
/
journal article ENG
Fast identification of true critical paths in sequential circuits
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Jenihhin, Maksim
;
Raik, Jaan
;
Jürimägi, Lembit
Microelectronics reliability
2018
/
p. 252-261 : ill
https://doi.org/10.1016/j.microrel.2017.11.027
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
30
book article
Fault simulation with parallel exact critical path tracing in multiple core environment
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Devadze, Sergei
2015 Design, Automation & Test in Europe Conference & Exhibition (DATE) : proceedings
2015
/
p. 1180-1185 : ill
book article
31
book
Handbook of testing electronic systems
Novak, Ondrej
;
Gramatova, Elena
;
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Raik, Jaan
2005
https://www.ester.ee/record=b2102523*est
book
32
book article
Hierarchical identification of NBTI-critical gates in nanoscale logic
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014
2014
/
[6] p. : ill
book article
33
book article
Hierarchical identification of untestable faults in sequential circuits
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Krivenko, Anna
;
Kruus, Margus
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings
2007
/
p. 668-671 : ill
http://dx.doi.org/10.1109/DSD.2007.4341539
book article
34
journal article EST
/
journal article ENG
Identification and rejuvenation of NBTI-critical logic paths in nanoscale circuits
Jenihhin, Maksim
;
Squillero, Giovanni
;
Tihhomirov, Valentin
;
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications (JETTA)
2016
/
p. 273-289 : ill
https://doi.org/10.1007/s10836-016-5589-x
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
35
book article
Identification and rejuvenation of NBTI-critical paths in nanoscale logic circuits
Jenihhin, Maksim
1st International Workshop on Reliability and Aging in Forthcoming Electronic Systems : May 28-29, 2015, Cluj-Napoca, Romania
2015
/
[1] p
book article
36
book
Impulss-seadmed : laboratoorne töö nr. 5 : trigerid loogikaelementidel
1986
https://www.ester.ee/record=b1240931*est
book
37
book
Impulss-seadmed : laboratoorne töö nr. 8 : lineaarpinge generaator
1986
https://www.ester.ee/record=b2618544*est
book
38
book
Informal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 2005
2005
https://www.ester.ee/record=b2055139*est
book
39
book article
Investigating defects in digital circuits by Boolean differential equations
Kruus, Helena
;
Orasson, Elmet
;
Robal, Tarmo
;
Ubar, Raimund-Johannes
The 4th International Conference "Distance Learning - Educational Sphere of XXI Century" (DLESC'04)
2004
/
p. 432-435
book article
40
journal article EST
/
journal article ENG
Low frequency acoustic method to measure the complex bulk modulus of porous materials
Napolitano, Marialuisa
;
Di Giulio, Elio
;
Auriemma, Fabio
The Journal of the Acoustical Society of America
2022
/
art. 1545
https://doi.org/10.1121/10.0009767
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
41
book article
Low voltage 2-GHz GaAs transmitter circuit modules
Kalajo, Sami
;
Kiraly, J.
;
Porra, Veikko
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 167-170: ill
book article
42
journal article EST
/
journal article ENG
Modeling and simulation of circuits with shared structurally synthesized BDDs
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Raik, Jaan
;
Viies, Vladimir
Microprocessors and microsystems
2017
/
p. 56-61 : ill
https://doi.org/10.1016/j.micpro.2016.09.006
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
43
book article
Modelling transients in oscillator circuits
Kukk, Vello
NDES'97, Moscow, June 26-27 : posters
1997
/
p. 520-525: ill
book article
44
book article
Multiple control fault testing in digital systems with high-level decision diagrams
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings
2016
/
[6] p. : ill
http://dx.doi.org/10.1109/AQTR.2016.7501287
book article
45
book article
Multiple fault analyses in logic circuits
Ubar, Raimund-Johannes
IFAC-Symposium Discrete Systems : Dresden, 14.-19. 3. 77
1977
/
p. [?]
book article
46
book article
Organ bio-impedance modelling with 3D mesh of equivalent circuits
Gordon, Rauno
Proceedings of the XII International Conference on Electrical Bioimpedance & the V Conference on Electrical Impedance Tomography : ICEBI/EIT 2004 : June 20-24, 2004, Gdansk, Poland. Vol. 2
2004
/
p. 715-718
book article
47
book article
Overcoming convergence problems in simulation
Aaltonen, Sakari
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 273-276: ill
book article
48
book article
Partition search for FSM low power synthesis
Sudnitsõn, Aleksander
Proceedings of the 4th International Conference "Computer-Aided Design of Discrete Devices" : CAD DD'2001 : Minsk, Belarus, 2001. Vol. 1
2001
/
p. 44-49
book article
49
book article
Performance optimization by Extended Peripheral Retiming
Fehlauer, Erhard
;
Rülke, Steffen
;
Franke, Günter
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 2
1994
/
p. 425-430: ill
https://www.ester.ee/record=b2150914*est
book article
50
book
Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia
2012
http://www.ester.ee/record=b2777270*est
book
Number of records 84, displaying
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