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1
book article
Accurate NBTI-induced gate delay modeling based on intensive SPICE simulations
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
MEDIAN Finale : Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : November 10-11, 2015, Tallinn, Estonia
2015
/
p. 21-26 : ill
book article
2
book article
Analysis and evaluation of PWM and PSM shoot-through control methods for voltage-fed qZSI based DC/DC converters
Roasto, Indrek
;
Vinnikov, Dmitri
EPE-PEMC 2010 : 14th International Power Electronics and Motion Control Conference : 6-8 September 2010, Ohrid, Republic of Macedonia
2010
/
p. T3-100 - T3-105
book article
3
book article
Analysis of switching properties of different high voltage IGBTs operating under hard-switching conditions
Blinov, Andrei
;
Jalakas, Tanel
;
Vinnikov, Dmitri
;
Laugis, Juhan
BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia
2010
/
p. 323-326 : ill
book article
4
book article
Classical electrodynamics, charge distributions of currents and the metal transistor
Taniloo, Rainer
BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia
2002
/
p. 61-64 : ill
book article
5
book article
Complex simulation of punchthrough, tunneling and high-speed characteristics of scaled bipolar devices and circuits
Bubennikov, Alexander N.
;
Ishevsky, D.V.
Automation, simulation & measurement : ASM'91 : 3rd biennal conference, Tallinn, October 7-11, 1991. Section S / Tallinn Technical University
1992
/
p. 26-31: ill
book article
6
book article
Computation of MOS transistor channel currents using Gear methods in SPICE
Cremascoli, Paolo
;
Gubian, Paolo
;
Zanella, Marina
Automation, simulation & measurement : ASM'91 : 3rd biennal conference, Tallinn, October 7-11, 1991. Section S / Tallinn Technical University
1992
/
p. 59-68: ill
book article
7
book article
Determination of transistor low freqency noise parameters for SPICE programme
Zeltinš, M.
;
Slaidinš, I.
Automation, simulation & measurement : ASM'91 : 3rd biennal conference, Tallinn, October 7-11, 1991. Section S / Tallinn Technical University
1992
/
p. 127-131: ill
book article
8
journal article
Energeetika : pooljuhid - otsapidi uueneva energiatehnika küljes
Lehtla, Tõnu
Horisont
2012
/
lk. 34-39 : ill
https://artiklid.elnet.ee/record=b2467567*est
journal article
9
book article
Feasibility study of 200 kW half-bridge and full-bridge DC/DC converters with 6.5 kV IGBTs
Vinnikov, Dmitri
;
Lehtla, Madis
19th International Symposium on Power Electronics, Electrical Drives, Automation and Motion : Speedam 2008 : Ischia (Italy), June 11th-13th, 2008 : conference proceedings
2008
/
p. 1537-1541 : ill. [CD-ROM]
https://ieeexplore.ieee.org/document/4581238
book article
10
book article
A high-frequency small-geometry MOSFET model
Kanunnikov, A.I.
;
Shilin, V.A.
Automation, simulation & measurement : ASM'91 : 3rd biennal conference, Tallinn, October 7-11, 1991. Section A. Section M / Tallinn Technical University
1992
/
p. 29-33: ill
book article
11
dissertation
High-κ metal oxide thin film by chemical spray pyrolysis : from optimization of material properties to application in thin film transistor = Metallioksiidi õhukesed kiled keemilise pihustuspürolüüsi meetodil : materjali omaduste optimeerimine ja rakendamine õhukesekilelistes transistorides
Oluwabi, Abayomi Titilope
2020
https://digikogu.taltech.ee/et/Item/4b6d9afd-74d2-40ac-9c12-335d2f608474
https://www.ester.ee/record=b5362429*est
dissertation
12
journal article
Impact of orientation on the bias of SRAM-based PUFs
Abideen, Zain Ul
;
Wang, Rui
;
Perez, Tiago Diadami
;
Schrijen, Geert-Jan
;
Pagliarini, Samuel Nascimento
IEEE design & test
2024
/
p. 14-20
https://doi.org/10.1109/MDAT.2023.3322621
journal article
Seotud publikatsioonid
1
Leveraging FPGA Reconfigurability as an Obfuscation Asset = FPGA ümberkonfigureeritavuse rakendamine hägustamise vahendina
13
book article
Inseneri ja tehnoloogia võidujooksust nanomeeterdistantsil, ehk, Tehnoloogia valitsemisest ja usaldamisest : akadeemiline ettekanne 10. novembril 2010 Eesti Teaduste Akadeemias
Ubar, Raimund-Johannes
Tallinna Tehnikaülikooli aastaraamat 2010
2011
/
lk. 249-260
book article
14
newspaper article
Jaan Raik: kiibidisain aitaks saada Eestil jõukaks tehnoloogiamaaks
Maidla, Margus
novaator.err.ee
2023
newspaper article
15
journal article
Lihtne toiteallikas
Gerasimtšuk, Valeri
Side. Raadio. Televisioon : infoseeria 10
1980
/
lk. 14-16
https://www.ester.ee/record=b1232303*est
journal article
16
journal article
Mikroprotsessor Tehnikaülikoolist transistori 50. sünnipäevaks
Ubar, Raimund-Johannes
Horisont
1997
/
8, lk. 10-11: ill
https://artiklid.elnet.ee/record=b2325971*est
journal article
17
book article
New high-gain step-up DC/DC converter with high-frequency isolation
Vinnikov, Dmitri
;
Zakis, Janis
;
Husev, Oleksandr
;
Strzelecki, Ryszard
2012 Twenty-Seventh Annual IEEE Applied Power Electronics Conference and Exposition (APEC), Orlando (FL), USA, 5-9 Feb. 2012
2012
/
p. 1204-1209 : ill
https://ieeexplore.ieee.org/document/6165972
book article
18
book article
Numerical calculations of transient characteristics of a vertical field effect phototransistor taking into account resistance on the gate
Abashkina, S.
;
Rimshans, J.
;
Korolkov, V.I.
;
Tabarov, T.
Automation, simulation & measurement : ASM'91 : 3rd biennal conference, Tallinn, October 7-11, 1991. Section S / Tallinn Technical University
1992
/
p. 83-88: ill
book article
19
book article
Numerical scaling and speed-pover-optimization of polysilicon transistors & circuits
Bubennikov, Alexander
Automation, simulation & measurement : ASM'91 : 3rd biennal conference, Tallinn, October 7-11, 1991. Section S / Tallinn Technical University
1992
/
p. 41-46: ill
book article
20
book article
A simulation framework for 3-dimension networks-on-chip with different vertical channel density configurations
Ying, Haoyuan
;
Jaiswal, Ashok
;
Abd El Ghany, Mohamed A
;
Hollstein, Thomas
;
Hofmann, Klaus
Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia
2012
/
p. 83-88 : ill
book article
21
journal article EST
/
journal article ENG
Simulations of graphene nanoribbon field effect transistor for the detection of propane and butane gases : a first principles study
Rashid, Muhammad Haroon
;
Koel, Ants
;
Rang, Toomas
Nanomaterials
2020
/
art. 98
https://doi.org/10.3390/nano10010098
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
22
book article
Study of MOSFET post-fault operation in fault-tolerant DC-DC converters
Bakeer, Abualkasim Ahmed Ali
;
Chub, Andrii
;
Vinnikov, Dmitri
2022 IEEE 7th International Energy Conference (ENERGYCON)
2022
/
Code 181231, 5 p
https://doi.org/10.1109/ENERGYCON53164.2022.9830216
book article
Seotud publikatsioonid
1
Fault-tolerant galvanically isolated DC‑DC converters with zero redundancy = Null-liiasusega veatolerantsed galvaanilise isolatsiooniga alalispingemuundurid
23
dissertation
Techniques for robust routing, communication and computation in multiprocessor systems = Robustse marsruutimise, side ja arvutuse tehnikad mitmeprotsessorilistes süsteemides
Janson, Karl
2021
https://www.ester.ee/record=b5396084*est
https://digikogu.taltech.ee/et/Item/c9091d5c-dcd8-4b21-95a7-84ead85241e6
https://doi.org/10.23658/taltech.3/2021
dissertation
24
book article
The investigation of distributed non-quasi-static high-current-density effects in advanced transistors
Bubennikov, Alexander
;
Kargashin, A.
Automation, simulation & measurement : ASM'91 : 3rd biennal conference, Tallinn, October 7-11, 1991. Section S / Tallinn Technical University
1992
/
p. 32-40: ill
book article
25
book article
A three-level voltage-source gate driver for SiC MOSFETs in synchronous rectification mode
Giannakis, Andreas
;
Philipps, Daniel
;
Blinov, Andrei
;
Peftitsis, Dimosthenis
2023 IEEE 17th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG)
2023
/
6 p
https://doi.org/10.1109/CPE-POWERENG58103.2023.10227462
book article
Number of records 68, displaying
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