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20th IEEE NORCHIP Conference : Copenhagen, Denmark, November 11-12, 2002 (source)
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1
book article
Teaching digital RT-level self-test using a Java applet
Devadze, Sergei
;
Jutman, Artur
;
Sudnitsõn, Aleksander
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
20th IEEE NORCHIP Conference : Copenhagen, Denmark, November 11-12, 2002
2002
/
p. 322-328 : ill
book article
2
book article
Testability guided hierarchical test generation with decision diagrams
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Nõmmeots, Tanel
20th IEEE NORCHIP Conference : Copenhagen, Denmark, November 11-12, 2002
2002
/
p. 265-271
https://www.semanticscholar.org/paper/Testability-Guided-Hierarchical-Test-Generation-Ubar-Raik/c6301ac35d003c92f3867f26e2e75b87e1ad9b47
book article
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