Testability guided hierarchical test generation with decision diagrams
statement of authorship
R.Ubar, J.Raik, T.Nõmmeots
location of publication
Copenhagen
publisher
year of publication
pages
p. 265-271
language
inglise
Ubar, R.-J., Raik, J., Nõmmeots, T. Testability guided hierarchical test generation with decision diagrams // 20th IEEE NORCHIP Conference : Copenhagen, Denmark, November 11-12, 2002. Copenhagen : TechnoData, 2002. p. 265-271.