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Design for accelerated testing of DC-link capacitors in photovoltaic inverters based on mission profilesSangwongwanich, Ariya; Shen, Yanfeng; Chub, Andrii; Liivik, Elizaveta; Vinnikov, Dmitri; Wang, Huai; Blaabjerg, FredeIEEE transactions on industry applications2021 / p. 741−753 https://doi.org/10.1109/TIA.2020.3030568 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Mission profile-based accelerated testing of DC-link capacitors in photovoltaic invertersSangwongwanich, Ariya; Shen, Yanfeng; Chub, Andrii; Liivik, Elizaveta; Vinnikov, Dmitri; Wang, Huai; Blaabjerg, FredeThirty-Fourth Annual IEEE Applied Power Electronics Conference and Exposition, March 17 – 21, 2019, Anaheim, California2019 / p. 2833-2840 : ill https://doi.org/10.1109/APEC.2019.8721794 Conference proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG

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Reliability analysis of battery energy storage system for various stationary applicationsBakeer, Abualkasim Ahmed Ali; Chub, Andrii; Shen, Yanfeng; Sangwongwanich, AriyaJournal of energy storage2022 / art. 104217 https://doi.org/10.1016/j.est.2022.104217 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Reliability evaluation of an impedance-source PV microconverterShen, Yanfeng; Liivik, Elizaveta; Blaabjerg, Frede; Vinnikov, Dmitri; Wang, Huai; Chub, Andrii17th International Symposium “Topical Problems in the Field of Electrical and Power Engineering”. Doctoral school of energy and geotechnology. III : Kuressaare, Estonia, January 15-20, 20182018 / p. 108-110 : ill http://ise.elnet.ee/record=b2950026~S2*est

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book article EST / book article ENG

Reliability evaluation of an impedance-source PV microconverterShen, Yanfeng; Liivik, Elizaveta; Blaabjerg, Frede; Vinnikov, Dmitri; Wang, Huai; Chub, Andrii2018 IEEE Applied Power Electronics Conference and Exposition (APEC 2018), San Antonio, Texas, USA, 4-8 March 20182018 / p. 1104–1108 : ill https://doi.org/10.1109/APEC.2018.8341154 Conference proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG

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Reliability evaluation of isolated buck-boost DC-DC series resonant converterBakeer, Abualkasim Ahmed Ali; Chub, Andrii; Shen, YanfengIEEE open journal of power electronics2022 / p. 131-141 https://doi.org/10.1109/OJPEL.2022.3157200 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Seotud publikatsioonid 1

Fault-tolerant galvanically isolated DC‑DC converters with zero redundancy = Null-liiasusega veatolerantsed galvaanilise isolatsiooniga alalispingemuundurid

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book article

Reliability of DC-link capacitors in two-stage micro-inverters under different PV module sizesSangwongwanich, Ariya; Shen, Yanfeng; Chub, Andrii; Liivik, Elizaveta; Vinnikov, Dmitri; Wang, Huai; Blaabjerg, FredeICPE 2019 - ECCE Asia : 10th International Conference on Power Electronics - ECCE Asia : "Green World with Power Electronics" : May 27-30, 2019 BEXCO, Busan, Korea2019 / p. 1867-1872 : ill https://ieeexplore.ieee.org/xpl/conhome/8786807/proceeding

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Reliability study of input side capacitors in impedance-source PV microconvertersLiivik, Elizaveta; Vinnikov, Dmitri; Chub, Andrii; Shen, YanfengIECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society : proceedings2019 / p. 5026–5032 : ill https://doi.org/10.1109/IECON.2019.8927173 Conference proceedings at Scopus Article at Scopus Article at WOS

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Wear-out failure analysis of an impedance-source PV microinverter based on system-level electrothermal modelingShen, Yanfeng; Chub, Andrii; Wang, Huai; Vinnikov, Dmitri; Liivik, Elizaveta; Blaabjerg, FredeIEEE transactions on industrial electronics2019 / p. 3914-3927 https://doi.org/10.1109/TIE.2018.2831643 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Wear-out failure analysis of solar optiverter operating with 60- and 72-cell Si crystalline PV modulesLiivik, Liisa; Chub, Andrii; Sangwongwanich, Ariya; Shen, Yanfeng; Vinnikov, Dmitri; Blaabjerg, FredeIECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society : proceedings2018 / p. 6134-6140 : ill https://doi.org/10.1109/IECON.2018.8592925

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Shen, Yanfeng (author)

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