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Ubar, Raimund-Johannes (author)
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501
book article
New built-in self-test scheme for SoC interconnect
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Raik, Jaan
The 9th World Multi-Conference on Systemics, Cybernetics and Informatics : WMSCI 2005 : July 10-13, 2005, Orlando, Florida, USA. Vol. IV
2005
/
p. 19-24 : ill
https://www.researchgate.net/publication/237375234_New_Built-In_Self-Test_Scheme_for_SoC_Interconnect
book article
502
book article
New categories of Safe Faults in a processor-based Embedded System
Gürsoy, Cemil Cem
;
Jenihhin, Maksim
;
Oyeniran, Adeboye Stephen
;
Piumatti, Davide
;
Raik, Jaan
;
Sonza Reorda, Matteo
;
Ubar, Raimund-Johannes
2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings
2019
/
4 p. : ill
https://doi.org/10.1109/DDECS.2019.8724642
book article
503
book article
New curricula and a competence centre through TEMPUS at the Technical University of Tallinn
Glesner, M.
;
Hollstein, Thomas
;
Courtois, B.
;
Amblar, P.
;
Ubar, Raimund-Johannes
;
Vainomaa, Kaido
Workshop on Design Methodologies for Microelectronics, Smolenice castle, Slovakia, September 11-13, 1995 : proceedings
1995
/
p. 347-353
book article
504
book article
New fault models and self-test generation for microprocessors using High-Level Decision Diagrams
Jasnetski, Artjom
;
Raik, Jaan
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
2015
/
p. 251-254 : ill
book article
505
book article
New method of testability calculation to guide RT-level test generation
Raik, Jaan
;
Nõmmeots, Tanel
;
Ubar, Raimund-Johannes
4th IEEE Latin-American Test Workshop : LATW2003 : Natal, Brazil, February 16-19, 2003
2003
/
p. 46-51 : ill
https://link.springer.com/article/10.1007/s10836-005-5288-5
book article
506
book article
New technique for hierarchical identification of untestable faults in sequential circuits
Krivenko, Anna
;
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Kruus, Margus
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja
2008
/
lk. 155-158 : ill
book article
507
journal article
New test design techniques for fault detection in digital objects
Alango, Villem
;
Kont, Toomas
;
Ubar, Raimund-Johannes
Tallinna Tehnikaülikooli Toimetised
1990
/
lk. 45-62: ill
journal article
508
book article
A novel artificial neural networks based automatic adaptive fault detection technique for analog circuits
Petlenkov, Eduard
;
Jutman, Artur
;
Nõmm, Sven
;
Ubar, Raimund-Johannes
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 167-170 : ill
book article
509
book article
A novel random approach to diagnostic test generation
Osimiry, Emmanuel Ovie
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark
2016
/
[4] p. : ill
https://doi.org/10.1109/NORCHIP.2016.7792915
book article
510
book article
Off-line testing of crosstalk induced glitch faults in NoC Interconnects
Bengtsson, Tomas
;
Kumar, Shashi
;
Jutman, Artur
;
Ubar, Raimund-Johannes
Proceedings [of] 24th IEEE Norchip Conference : Linköping, Sweden, 20-21 November 2006
2006
/
p. 221-225 : ill
http://dx.doi.org/10.1109/NORCHP.2006.329215
book article
511
book article
Off-line testing of delay faults in NoC interconnects
Bengtsson, Tomas
;
Jutman, Artur
;
Kumar, Shashi
;
Peng, Zebo
;
Ubar, Raimund-Johannes
9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings
2006
/
p. 677-680 : ill
http://dx.doi.org/10.1109/DSD.2006.72
book article
512
book article
On automatic software-based self-test program generation based on high-Level decision diagrams
Jasnetski, Artjom
;
Ubar, Raimund-Johannes
;
Tšertov, Anton
LATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 2016
2016
/
p. 177
http://dx.doi.org/10.1109/LATW.2016.7483357
book article
513
book article
On efficient logic-level simulation of digital circuits represented by the SSBDD model
Jutman, Artur
;
Raik, Jaan
;
Ubar, Raimund-Johannes
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 2
2002
/
p. 621-624 : ill
https://ieeexplore.ieee.org/document/1003334
book article
514
book article
On reusability of verification assertions for testing
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Tšepurov, Anton
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 151-154 : ill
book article
515
book article EST
/
book article ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
516
book article
On the combined use of HLDDs and EFSMs for functional ATPG
Di Guglielmo, Giuseppe
;
Fummi, Franco
;
Jenihhin, Maksim
;
Pravadelli, Graziano
;
Raik, Jaan
;
Ubar, Raimund-Johannes
5th IEEE East-West Design & Test Symposium EWDTS 2007 : September 7-10, 2007, Yerevan, Armenia
2007
/
p. 503-508 : ill
book article
517
journal article
On the reuse of TLM mutation analysis at RTL
Guarnieri, Valerio
;
Hantson, Hanno
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications
2012
/
p. 435-448 : ill
journal article
518
book article
On using genetic algorithm for test generation
Brik, Marina
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Ivask, Eero
BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia
2004
/
p. 233-236 : ill
book article
519
book article
On-line monitoring of dialysis adequacy using diasens optical sensor: accurate Kt/V estimation by smoothing algorithms
Talisainen, Aleksei
;
Kostin, Sergei
;
Karai, Deniss
;
Fridolin, Ivo
;
Ubar, Raimund-Johannes
BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia
2010
/
p. 273-276 : ill
book article
520
journal article
Open-source JTAG simulator bundle for labs
Shibin, Konstantin
;
Devadze, Sergei
;
Rosin, Vjatšeslav
;
Jutman, Artur
;
Ubar, Raimund-Johannes
International journal of electronics and telecommunications
2012
/
p. 233-239 : ill
https://journals.pan.pl/Content/87192/PDF/32.pdf
journal article
521
book
Operatsioonautomaadid digitaalarvutites : metoodiline materjal
1987
https://www.ester.ee/record=b1234461*est
book
522
book article
Optimierte Steuerung der Fehlersuche auf digitalen Leiterplatten
Thomä, E.
;
Ubar, Raimund-Johannes
Proceedings of the 27th International Conference, Technical University of Ilmenau, October, 1982
1982
/
p. 65-68
book article
523
dissertation
Optimization of built-in self-test in digital systems = Sisseehitatud enesetestimise optimeerimine digitaalsüsteemides
Kruus, Helena
2011
dissertation
524
book article
Optimization of memory-constrained hybrid BIST for testing core-based systems
Jervan, Gert
;
Kruus, Helena
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
Proceedings of the IEEE 2nd International Symposium on Industrial Embedded Systems : SIES'2007 : Lisbon, Portugal, 4-6 July 2007
2007
/
p. 71-77
https://ieeexplore.ieee.org/document/4297319
book article
525
book article
Optimization of memory-constrained hybrid BIST for testing core-based systems
Jervan, Gert
;
Kruus, Helena
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum
2007
/
lk. 133-136 : ill
book article
Number of records 834, displaying
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CV
63
1.
Ubar, Raimund-Johannes 1941
2.
Palm, Raimund
3.
Räämet, Raimund 1918-2004
4.
Aare, Johannes 1915-2000
5.
Aavik, Eduard-Johannes
6.
Ahrenschild, Johannes (-1936)
7.
Alaots, Johannes
8.
Aljak, Arnold Johannes
9.
Allik, Erich-Johannes
10.
Avik, Eduard Johannes 1891-1942
11.
Drechsler, Wolfgang Johannes Max
12.
Ehala, Johannes 1986
13.
Hint, Johannes 1914-1985
14.
Johannes, Ille 1939
15.
Johannson, Johannes
16.
Johanson, Johannes
17.
Juhans, Johannes 1874-1956
18.
Kajander, Aleksi Oskar Johannes 1994
19.
Kiiwet, Johannes
20.
Kiivet, Johannes 1879-1967
21.
Kivit, Johannes
22.
Kollist, Johannes 1884-1937
23.
Kollist, Johannes Theodor
24.
Korv, August Johannes 1911-1981
25.
Krimmer, Robert Johannes
26.
Käpp, Martin Johannes
27.
Langel, Johannes 1900-1985
28.
Langell, Johannes
29.
Livländer, Robert Johannes
30.
Lutsar, Richard-Johannes
31.
Madise, Johannes 1920-?
32.
Maltenek, Evald Leonhard Johannes
33.
Matsulevitš, Johannes
34.
Meitre, Johannes 1906-1978
35.
Messer, Johannes
36.
Muru, Johannes 1995
37.
Mäll, Johannes 1911-1981
38.
Mühlman, Johannes
39.
Mühlmann, Johannes 1888-1936
40.
Notermans, Antonius Johannes Hubertus 1959
41.
Nuudi, Johannes 1895-1975
42.
Palo, Johannes 1925-1960
43.
Pals, Johannes 1903-1941
44.
Pello, Johannes 1958
45.
Pervik, Johannes 1892-1958
46.
Pervik, Johannes-Eduard
47.
Presmann, Johannes 1942
48.
Putk, Aksel-Johannes 1928-1999
49.
Püümann, Mait Johannes
50.
Renter, Olav-Johannes
51.
Roes, Johannes 1914
52.
Russwurm, Johannes
53.
Russvurm, Johannes 1855-1939
54.
Russvurm, Johannes Carl Gysbert Immanuel
55.
Sakeus, Johannes 1880-1934
56.
Taimsalu, Johannes 1891-1942
57.
Teiman, Johannes
58.
Teimann, Johannes Rudolf (kuni 22.05.1935)
59.
Tomson, Johannes
60.
Tuulre, Feliks Johannes 1908-1987
61.
Veerus, Johannes Voldemar 1897-1972
62.
Verus, Johannes Voldemar
63.
Vuhk, Oskar Johannes
author
57
1.
Ubar, Raimund-Johannes
2.
Hagelberg, Raimund
3.
Räämet, Raimund
4.
Aare, Johannes
5.
Allas, Johannes-Emmanuel
6.
Avik, Eduard Johannes
7.
Bauer, Johannes
8.
Bender, Naatan Johannes
9.
Buchmann, Johannes
10.
Deelstra, Johannes
11.
Ehala, Johannes
12.
Engelmayer, Johannes
13.
Gotzmann, Johannes
14.
Helander, Johannes
15.
Hint, Johannes
16.
Hüsse, Johannes
17.
Johannes, Anu
18.
Johannes, Ellen
19.
Johannes, Ille
20.
Johannes, Kaljo-Mihkel
21.
Järv, Johannes
22.
Kadak, Johannes
23.
Kajander, Aleksi Oskar Johannes
24.
Karstensen, Johannes
25.
Kerkhoven, Eduard Johannes
26.
Kiivet, Johannes
27.
Krimmer, Robert Johannes
28.
Kukebal, Johannes
29.
Meitre, Johannes
30.
Miller, Johannes
31.
Mühlman, Johannes
32.
Norberg, Johannes
33.
Notermans, Antonius Johannes Hubertus
34.
Ortlepp, Johannes
35.
Parikas, Johannes
36.
Pello, Johannes
37.
Pervik, Johannes-Eduard
38.
Piiper, Johannes
39.
Presmann, Johannes
40.
Putk, Aksel-Johannes
41.
Pätsch, Johannes
42.
Saar, Johannes
43.
Sautter, Johannes
44.
Sinisalo, Touko Johannes
45.
Steinbrunn, Johannes
46.
Sutt, Johannes
47.
Zeiringer, Johannes Paul
48.
Taimsalu, Johannes
49.
Talu, Martin Johannes
50.
Tammekänd, Johannes
51.
Tilk, Johannes
52.
Tralla, Johannes
53.
Veerus, Johannes
54.
Vibur, Johannes Ferdinand
55.
Vind, Johannes
56.
Voll, Johannes
57.
Voltri, Johannes
name of the person
28
1.
Ubar, Raimund-Johannes, 1941-
2.
Hagelberg, Raimund, 1927-2012
3.
Räämet, Raimund, 1918-2004
4.
Aare, Johannes, 1915-2000
5.
Aavik, Johannes, 1880-1973
6.
Avik, Eduard Johannes, 1891-1942
7.
Bender, Naatan Johannes
8.
Erm, Johannes, 1998-
9.
Granö, Johannes Gabriel
10.
Hint, Johannes, 1914-1985
11.
Johannes Paulus II, paavst, 1920-2005
12.
Kert, Johannes
13.
Kiivet, Johannes, 1879-1967
14.
Kollist, Johannes
15.
Käis, Johannes
16.
Lang, Johannes
17.
Maide, Johannes Voldemar
18.
Mossov, Johannes
19.
Pals, Johannes, 1903-1941
20.
Pello, Johannes
21.
Putk, Aksel-Johannes
22.
Rammul, Aleksander Johannes, 1875-1949
23.
Steinbrunn, Johannes
24.
Taimsalu, Johannes, 1891-1942
25.
Talu, Martin Johannes
26.
Veerus, Johannes Voldemar, 1897-1972
27.
Veski, Johannes Voldemar, 1873-1968
28.
Voll, Johannes
subject term
1
1.
Johannes Mittus, vasevalamise tööstus
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