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Jenihhin, Maksim (TTÜ author)
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1
book article
A scalable model based RTL framework zamiaCAD for static analysis
Tšepurov, Anton
;
Jenihhin, Maksim
;
Raik, Jaan
;
Tihhomirov, Valentin
2012 IEEE/IFIP 20th International Conference on VLSI and System-on-Chip (VLSI-SoC) : October 7-10, 2012 Santa Cruz, USA Dream Inn, Santa Cruz, USA : [proceedings]
2012
/
p. 171-176 : ill
book article
2
book article
A scalable technique to identify true critical paths in sequential circuits
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Jenihhin, Maksim
;
Raik, Jaan
Proceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany
2017
/
p. 152-157 : ill
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553
book article
3
book article
Abstraction of clock interface for conversion of RTL VHDL to SystemC
Saif Abrar, Syed
;
Jenihhin, Maksim
;
Raik, Jaan
2014 IEEE International Advance Computing Conference (IACC) : February 21-22, 2014, Gurgaon, India
2014
/
p. 50-55 : ill
book article
4
book article
Accelerating transient fault injection campaigns by using Dynamic HDL Slicing
Bagbaba, Ahmet Cagri
;
Jenihhin, Maksim
;
Raik, Jaan
;
Sauer, Christian
2019 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC), 29-30 October 2019, Helsinki, Finland : proceedings in IEEE Xplore
2019
/
7 p. : ill
https://doi.org/10.1109/NORCHIP.2019.8906932
book article
Seotud publikatsioonid
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
5
book article
Accurate NBTI-induced gate delay modeling based on intensive SPICE simulations
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
MEDIAN Finale : Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : November 10-11, 2015, Tallinn, Estonia
2015
/
p. 21-26 : ill
book article
6
book article
An Accelerator-based architecture utilizing an efficient memory link for modern computational requirements
Yousefzadeh, Saba
;
Basharkhah, Katayoon
;
Raik, Jaan
;
Jenihhin, Maksim
2019 IEEE East-West Design & Test Symposium (EWDTS)
2019
/
6 p. : ill
https://doi.org/10.1109/EWDTS.2019.8884481
book article
7
book article
An approach for PSL assertion coverage analysis with high-level decision diagrams
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Shchenova, Tatjana
Proceedings of IEEE East-West Design & Test Symposium (EWDTS'10) : St. Petersburg, Russia, September 17-20, 2010
2010
/
p. 13-16 : ill
https://ieeexplore.ieee.org/document/5742048
book article
8
journal article
An approach for verification assertions reuse 2 in RTL test pattern generation
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Viilukas, Taavi
;
Fujiwara, Hideo
Journal of Shanghai Normal University : Natural Sciences
2010
/
p. 441-447 : ill
https://www.researchgate.net/publication/240613999_An_Approach_for_Verification_Assertions_Reuse_in_RTL_Test_Pattern_Generation
journal article
9
book article
An approach for verification assertions reuse in RTL test pattern generation
Jenihhin, Maksim
;
Raik, Jaan
;
Fujiwara, Hideo
;
Ubar, Raimund-Johannes
;
Viilukas, Taavi
Digest of papers : IEEE 11th Workshop on RTL and High Level Testing : WRTLT'10 : December 5-6, 2010, Shanghai, China
2010
/
p. 107-110 : ill
book article
10
journal article EST
/
journal article ENG
An optimization framework for dynamic pipeline management in computing systems
Naqvi, Syed Rameez
;
Zahid, Anjum
;
Sawalha, Lina
;
Jenihhin, Maksim
Computers & electrical engineering
2019
/
p. 242-258 : ill
https://doi.org/10.1016/j.compeleceng.2019.07.013
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
11
journal article
Application of high-level decision diagrams for simulation-based verification tasks
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
Estonian journal of engineering
2010
/
1, p. 56-77 : ill
journal article
12
book article
Application specific true critical paths identification in sequential circuits
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
;
Devadze, Sergei
;
Oyeniran, Adeboye Stephen
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece
2019
/
p. 299-304 : ill
https://doi.org/10.1109/IOLTS.2019.8854442
book article
13
book article
Applications of the open source HW design framework zamiaCAD
Tšepurov, Anton
;
Tihhomirov, Valentin
;
Saif Abrar, Syed
;
Jenihhin, Maksim
;
Raik, Jaan
DATE 2012 University Booth : Design Automation and Test in Europe : Dresden, Germany, March 12-16, 2012
2012
/
1 p
book article
14
journal article EST
/
journal article ENG
Applying RIS-based communication for collaborative computing in a swarm of drones
Rahbari, Dadmehr
;
Alam, Muhammad Mahtab
;
Le Moullec, Yannick
;
Jenihhin, Maksim
IEEE Access
2023
/
p. 70093−70109
https://doi.org/10.1109/ACCESS.2023.3293737
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
15
book article
APPRAISER : DNN fault resilience analysis employing approximation errors
Taheri, Mahdi
;
Ahmadilivani, Mohammad Hasan
;
Jenihhin, Maksim
;
Raik, Jaan
;
Daneshtalab, Masoud
26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, May 3-5, 2023, Tallinn
2023
/
p. [?]
https://ddecs2023.taltech.ee/
book article
16
dissertation
Approaches to extra-functional verification of security and reliability aspects in hardware designs = Riistvaraprojektide turva- ja töökindlusaspektide ekstrafunktsionaalse verifitseerimise lähenemisviisid
Lai, Xinhui
2022
https://doi.org/10.23658/taltech.29/2022
https://digikogu.taltech.ee/et/Item/cff1aeb9-b0b2-49ce-b81a-bfb9dc25fd56
https://www.ester.ee/record=b5502807*est
dissertation
Seotud publikatsioonid
5
Towards multidimensional verification : where functional meets non-functional
PASCAL : timing SCA resistant design and verification flow
Early RTL analysis for SCA vulnerability in fuzzy extractors of memory-based PUF enabled devices
On antagonism between side-channel security and soft-error reliability in BNN inference engines
Understanding multidimensional verification : where functional meets non-functional
17
book article
APRICOT : a framework for teaching digital systems verification
Raik, Jaan
;
Jenihhin, Maksim
;
Tšepurov, Anton
;
Reinsalu, Uljana
;
Ubar, Raimund-Johannes
19th EAEEIE Annual Conference : June 29-July 2, 2008, Tallinn, Estonia : formal proceedings
2008
/
p. 172-177 : ill
http://dx.doi.org/10.1109/EAEEIE.2008.4610181
book article
18
book article
Assertion checking with PSL and high-level decision diagrams
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
Digest of papers IEEE 8th Workshop on RTL and High Level Testing : WRTLT'07 : October 12-13, 2007, Beijing, China
2007
/
p. 105-110 : ill
https://pld.ttu.ee/~maksim/phd_papers/%5B12%5D%20wrtlt%2707.pdf
book article
19
book article
Assessment of diagnostic test for automated bug localization
Tihhomirov, Valentin
;
Tšepurov, Anton
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
LATW2013 : 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013 : [proceedings]
2013
/
[6] p. : ill
book article
20
journal article
Automated design error debug using high-level decision diagrams and mutation operators
Raik, Jaan
;
Repinski, Urmas
;
Tšepurov, Anton
;
Hantson, Hanno
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
Microprocessors and microsystems
2013
/
p. 505-513 : ill
journal article
21
journal article
Automated design error localization in RTL designs
Jenihhin, Maksim
;
Tšepurov, Anton
;
Tihhomirov, Valentin
;
Raik, Jaan
;
Hantson, Hanno
;
Ubar, Raimund-Johannes
;
Bartsch, Günter
;
Meza Escobar, Jorge Hernan
;
Wuttke, Heinz-Dietrich
IEEE design & test of computers
2014
/
p. 83-92 : ill
http://dx.doi.org/10.1109/MDAT.2013.2271420
journal article
22
journal article EST
/
journal article ENG
Automated identification of application-dependent safe faults in automotive systems-on-a-chips
Bagbaba, Ahmet Cagri
;
Augusto da Silva, Felipe
;
Sonza Reorda, Matteo
;
Hamdioui, Said
;
Jenihhin, Maksim
;
Sauer, Christian
Electronics
2022
/
art. 319
https://doi.org/10.3390/electronics11030319
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
Seotud publikatsioonid
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
23
journal article EST
/
journal article ENG
An automated method for mining high-quality assertion sets
Heidari Iman, Mohammad Reza
;
Raik, Jaan
;
Jenihhin, Maksim
;
Jervan, Gert
;
Ghasempouri, Tara
Microprocessors and microsystems
2023
/
art. 104773
https://doi.org/10.1016/j.micpro.2023.104773
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
Seotud publikatsioonid
1
Enhancing assertion-based verification in hardware designs through data mining algorithms = Andmekaeve algoritmide kasutamine riistvarasüsteemide väidete-põhise verifitseerimise parendamiseks
24
book article
Automated test bench generation for high-level synthesis flow ABELITE
Viilukas, Taavi
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Baranov, Samary
Proceedings of IEEE East-West Design & Test Symposium (EWDTS'2011) : Sevastopol, Ukraine, September 9-12, 2011
2011
/
p. 13-16 : ill
https://ieeexplore.ieee.org/document/6116601
book article
25
book article
BASTION : board and SoC test instrumentation for ageing and no failure found
Jutman, Artur
;
Lotz, Christophe
;
Larsson, Erik
;
Sonza Reorda, Matteo
;
Jenihhin, Maksim
;
Raik, Jaan
Proceedings of the 2017 Design, Automation & Test in Europe (DATE) : 27-31 March 2017, Swisstech, Lausanne, Switzerland
2017
/
p. 115-120 : ill
https://doi.org/10.23919/DATE.2017.7926968
book article
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15
1.
Jenihhin, Maksim
2.
Andrijaškin, Maksim
3.
Antonov, Maksim
4.
Butsenko, Maksim
5.
Gorev, Maksim
6.
Maksim, Antonov
7.
Maksim, I.
8.
Maksim, Tiit
9.
Mõttus, Maksim
10.
Ošeka, Maksim
11.
Radzvilovits, Maksim
12.
Ruchkin, Maksim
13.
Saat, Maksim
14.
Säkki, Maksim
15.
Zelenski, Maksim
CV
9
1.
Jenihhin, Maksim 1981
2.
Antonov, Maksim 1978
3.
Butsenko, Maksim
4.
Gazizov, Maksim 1918
5.
Oseka, Maksim
6.
Osheka, Maksim
7.
Ošeka, Maksim 1988
8.
Saat, Maksim 1944
9.
Säkki, Maksim 1977
name of the person
7
1.
Jenihhin, Maksim
2.
Antonov, Maksim
3.
Butsenko, Maksim
4.
Gorev, Maksim
5.
Gorki, Maksim, pseud., 1868-1936
6.
Ošeka, Maksim
7.
Saat, Maksim
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