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601

journal article

Software-based self-test generation for microprocessors with high-level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, Anton; Brik, MarinaProceedings of the Estonian Academy of Sciences2014 / p. 48-61 : ill https://artiklid.elnet.ee/record=b2665215*est

journal article

602

book

Software-based self-test with decision diagrams for microprocessorsUbar, Raimund-Johannes; Jasnetski, Artjom; Tšertov, Anton; Oyeniran, Adeboye Stephen2018

book

603

book article

SPICE-inspired fast gate-level computation of NBTI-induced delays in nanoscale logicKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, Maksim2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 223-228 : ill

book article

604

book article

SSBDD model : advantageous properties and efficient simulation algorithmsRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesETW'02 : 7th IEEE European Test Workshop, Gorfu Greece, May 26-29, 2002 : informal digest2002 / p. 345-346 : ill

book article

605

book article

SSBDDs : advantageous model and efficient algorithms for digital circuit modeling, simulation & testJutman, Artur; Raik, Jaan; Ubar, Raimund-Johannes5th International Workshop on Boolean Problems : September 19-20, 2002, Freiberg (Sachsen) : proceedings2002 / p. 157-166 : ill

book article

606

book article

SSBDDs and double topology for multiple fault reasoningUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanProceedings of IEEE East-West Design & Test Symposium (EWDTS’2012) : Kharkov, Ukraine, September 14–17, 20122012 / p. 23-28

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607

book article

Structural fault collapsing by superposition of BDDs for test generation in digital circuitsUbar, Raimund-Johannes; Mironov, Dmitri; Raik, Jaan; Jutman, ArturProceedings of the Eleventh International Symposium on Quality Electronic Design ISQED 2010 : March 22-24, 2010 San Jose, California USA2010 / p. 250-257 : ill https://ieeexplore.ieee.org/document/5450451

book article

608

book article

Structurally synthesized binary decision diagramsJutman, Artur; Peder, Ahti; Raik, Jaan; Tombak, Mati; Ubar, Raimund-JohannesBoolean Problems : 6th International Workshop : September 23-24, 2004, Freiberg2004 / p. 271-278 : ill

book article

609

book article

Structurally synthesized multiple input BDDs for simulation of digital circuitsUbar, Raimund-Johannes; Mironov, Dmitri; Raik, Jaan; Jutman, Artur16th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2009 : Yasmine Hammamet, Tunesia, 13-19 December, 20092009 / p. 451-454 : ill http://dx.doi.org/10.1109/ICECS.2009.5410895

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610

book article

Structurally synthesized multiple input BDDs for speeding up logic-level simulation of digital circuitsMironov, Dmitri; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan; Jutman, Artur13th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : DSD 2010 : Lille, France, 1-3 September 2010 : proceedings2010 / p. 658-663 : ill

book article

611

journal article

Success story of the Computer Engineering Department at the Tallinn University of Technology in EU projectsUbar, Raimund-Johannes; Kruus, MargusThe parliament magazine : European politics and policy2006 / p. 33 : ill

journal article

612

newspaper article

Suure eksperimendi ootelUbar, Raimund-JohannesTehnikaülikool1998 / 19. jaan., lk. 1, 3 https://www.ester.ee/record=b5309277*est

newspaper article

613

newspaper article

Sünergiline teaduskeskus : Integreeritud elektroonikasüsteemide ja biomeditsiinitehnika tippkeskus CEBEUbar, Raimund-JohannesMente et Manu2011 / lk. 2, 5 : portr https://www.ester.ee/record=b1242496*est

newspaper article

614

book article

Sünkroonsete järjestiklülituste testide deduktiivse analüüsi meetodEvartson, Teet; Ubar, Raimund-JohannesXXIX vabariiklik üliõpilaste teaduslik- tehniline konverents 30. märtsist - 1. aprillini 1977 : ettekannete teesid1977 / lk. 42 https://www.ester.ee/record=b2449987*est

book article

615

book article

Synthesis of decision diagrams from clock-driven multi-process VHDL descriptions for test generationLeveugle, R.; Ubar, Raimund-JohannesProceedings of the 5th International Conference on Mixed Design of Integrated Circuits and Systems, Lodz, Poland, June 18-20, 19981998 / p. 353-358

book article

616

journal article

Synthesis of decision diagrams from clock-driven multi-process VHDL descriptions for test generationLeveugle, R.; Ubar, Raimund-JohannesElectron technology1999 / 3, p. 282-287 : ill

journal article

617

book article

Synthesis of high-level decision diagrams for functional test pattern generationUbar, Raimund-Johannes; Raik, Jaan; Karputkin, Anton; Tombak, MatiProceedings of the 16th International Conference Mixed Design of Integrated Circuits and Systems MIXDES 2009 : Lodz, Poland, 25-27 June, 20092009 / p. 519-524 : ill

book article

618

book article

Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]Ubar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE2013 / p. 36-41 : ill [CD-ROM]

book article

619

dissertation

System modeling for processor-centric test automation = Süsteemide modelleerimine protsessorikesksete testprogrammide sünteesi automatiseerimiseksTšertov, Anton2012 https://www.ester.ee/record=b2751131*est

dissertation

620

book article

Targeting conditional operations in sequential test pattern generationRaik, Jaan; Ubar, Raimund-Johannes9th European Test Symposium : ETS'04 : Congress Center, Ajaccio, Corsica, France, May 23-26, 20042004 / p. 17-18 : ill

book article

621

book article

Teaching advanced test issues in digital electronicsUbar, Raimund-Johannes; Orasson, Elmet; Raik, Jaan; Wuttke, Heinz-DietrichProceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic2005 / p. S2B-1 - S2B-6 : ill http://dx.doi.org/10.1109/ITHET.2005.1560318

book article

622

book article

Teaching dependability issues in system engineering at the Technical University of TallinnUbar, Raimund-Johannes90th Anniversary Jubilee Seminar on Engineering Education, University of Wismar, Germany, May 6-8, 1998 : preprints of proceedings1998 / p. 1-5 (invited paper)

book article

623

journal article

Teaching dependability issues in systems engineering at the Technical University of TallinnUbar, Raimund-JohannesGlobal journal of engineering education1998 / 2, p. 215-218

journal article

624

book article

Teaching diagnostic modeling of digital systems with decision diagrams [Electronic resource]Ubar, Raimund-Johannes; Raik, Jaan; Mironov, Dmitri; Evartson, Teet; Orasson, Elmet; Aarna, Margit; Wuttke, Heinz-DietrichProceedings of 12th IASTED International Conference on Computers and Advanced Technology in Education - CATE 2009 : St.Thomas, US, November 22-24, 20092009 / p. 1-6. [CD-ROM]

book article

625

book article

Teaching digital RT-level self-test using a Java appletDevadze, Sergei; Jutman, Artur; Sudnitsõn, Aleksander; Ubar, Raimund-Johannes; Wuttke, Heinz-Dietrich20th IEEE NORCHIP Conference : Copenhagen, Denmark, November 11-12, 20022002 / p. 322-328 : ill

book article

Ubar, Raimund-Johannes (TTÜ author)

types of item

CV 61

author 57

name of the person 28

subject term 1