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zamiaCAD : understand, develop and debug hardware designsJenihhin, Maksim; Tihhomirov, Valentin; Saif Abrar, Syed; Raik, Jaan; Bartsch, GünterDUHDe : 1st Workshop on Design Automation for Understanding Hardware Designs : March 28, 2014 : Friday Workshop at DATE 2014, Dresden, Germany2014 / p. 1-6

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227

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Zero-memory-overhead clipping-based fault tolerance for LSTM deep neural networksParchekani, Bahram; Nazari, Samira; Ahmadilivani, Mohammad Hasan; Azarpeyvand, Ali; Raik, Jaan; Ghasempouri, Tara; Daneshtalab, Masoud37th IEEE International Symposium on Defect and Fault Tolerancein VLSI and Nanotechnology Systems, Harwell, Oxfordshire, Didcot, UK, October 8th - 10th, 20242024 / 4 p. : ill https://doi.org/10.1109/DFT63277.2024.10753533 Conference proceedings at Scopus Article at Scopus Article at WOS

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Assessment and Enhancement of Hardware Reliability for Deep Neural Networks = Riistvara töökindluse hindamine ja täiustamine süvanärvivõrkude jaoks

228

newspaper article

TalTechi riistvara turvalisuse keskuse doktorandid saavutasid rahvusvahelisel konkurentsitihedal võistlusel kolmanda koha [Võrguväljaanne]digi.geenius.ee2022 "TalTechi riistvara turvalisuse keskuse doktorandid saavutasid rahvusvahelisel konkurentsitihedal võistlusel kolmanda koha"

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229

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TalTechi uus magistrikava avab lõpetajatele uksed looma uut nutikat maailma tarkadest majadest rohepöördeniarileht.delfi.ee2023 TalTechi uus magistrikava avab lõpetajatele uksed looma uut nutikat maailma tarkadest majadest rohepöördeni

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230

journal article

Tehnohack 2016 : ideid jagus plaastrilaadsest tootest bumeranginiInseneeria2016 / lk. [42]-43 : fot https://artiklid.elnet.ee/record=b2806776*est

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231

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TehnoHack 2017 : pissiandurist nullgravitatsiooniniMühlbach, MadleMente et Manu2017 / lk. 54-55 : fot http://www.ester.ee/record=b1242496*est https://artiklid.elnet.ee/record=b2830887*est

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232

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Temporally extended high-level decision diagrams for PSL assertions simulationJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Ubar, Raimund-JohannesProceedings : Thirteenth IEEE European Test Symposium : ETS 2008 : 25-29 May 2008, Verbania, Italy2008 / p. 61-68 : ill https://ieeexplore.ieee.org/document/4556029

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233

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Terminali riist- ja tarkvarakompleksPalmas, M.; Niinsalu, UdoXXXII üliõpilaste teaduslik-tehnilise konverentsi ettekannete teesid : pühendatud V. I. Lenini 110. sünniaastapäevale : 16.-18. aprill 19801981 / lk. 96 https://www.ester.ee/record=b1322611*est

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234

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The hardware for artificial noseMisans, Peteris; Dzilums, Guntars; Shirs, JurisBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 425-428: ill

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235

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The substation local PC workstation. Present and futureDmitrenko, Igor9th International Symposium "Topical problems in the field of electrical and power engineering". Doctoral school of energy and geotechnology. II : Pärnu, Estonia, June 14-19, 20102010 / p. 186-189 : ill

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236

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A 3-D crossbar architecture for both pipeline and parallel computationsAljafar, Muayad J.; Acken, John M.IEEE Transactions on Circuits and Systems I : regular papers2021 / p. 4456-4469 https://doi.org/10.1109/TCSI.2021.3108564 https://pdxscholar.library.pdx.edu/cgi/viewcontent.cgi?article=1680&context=ece_fac

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237

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Toimiva digiühiskonna tagavad usaldusväärne tarkvara, turvaline riistvara ning energiasäästlikud ja nutikad asjadHärmat, KarinMente et Manu2022 / lk. 32-33 https://www.ester.ee/record=b1242496*est

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238

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Towards multidimensional verification : where functional meets non-functionalJenihhin, Maksim; Lai, Xinhui; Ghasempouri, Tara; Raik, Jaan2018 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC) : 30-31 October 2018, Tallinn, Estonia : proceedings in IEEE Xplore2018 / 7 p. : ill https://doi.org/10.1109/NORCHIP.2018.8573495

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Related publications 1

Approaches to extra-functional verification of security and reliability aspects in hardware designs = Riistvaraprojektide turva- ja töökindlusaspektide ekstrafunktsionaalse verifitseerimise lähenemisviisid

239

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Trainer 1149 : a boundary scan simulation bundle with hardware support for labsShibin, Konstantin; Jutman, ArturInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve2011 / p. 135-138 : ill

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240

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Trainer 1149: a boundary scan simulation bundle for labsJutman, Artur; Ubar, Raimund-Johannes; Devadze, Sergei; Shibin, Konstantin; Rosin, VjatšeslavMIXDES 2011 : 18th International Conference "Mixed Design of Integrated Circuits and Systems" : June 16-18, 2011, Gliwice, Poland2011 / p. 520-525

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241

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Translating behavioral VHDL for emulationEllervee, Peeter; Reinsalu, Uljana; Arhipov, Anton25th IEEE NORCHIP Conference : Aalborg, Denmark, 19-20 November 20072007 / ? p https://ieeexplore.ieee.org/document/4481073

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TranspuutridToomsalu, ArvoArvutustehnika ja Andmetöötlus1997 / 4, lk. 14-16; 5, lk. 7-11; 6, lk. 6-9; 7/8, lk. 1-6: ill

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Triple fixed-point MAC unit for deep learningKerner, Madis; Tammemäe, Kalle; Raik, Jaan; Hollstein, ThomasProceedings of the 2021 Design, Automation & Test in Europe (DATE 2021), 1-5 February 2021 : Virtual Conference2021 / p. 1404-1407 https://doi.org/10.23919/DATE51398.2021.9474020

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Related publications 1

Novel Neural Network accelerator architectures for FPGAs = Uudsed närvivõrkude kiirendite arhitektuurid FPGAdele

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Tuleviku ootelVõhandu, LeoArvutimaailm1993 / 3, lk. 4

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Turning JTAG inside out for fast extended test accessDevadze, Sergei; Jutman, Artur; Aleksejev, Igor; Ubar, Raimund-Johannes10th IEEE Latin American Test Workshop : 2-5 March 2009, Brazil2009 / [6] p. : ill https://ieeexplore.ieee.org/document/4813799

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246

newspaper article

Twinkle ei ava Interneti salauksiTammemäe, KalleÄripäev1999 / 26. mai, lk. 11 https://www.aripaev.ee/uudised/1999/05/25/twinkle-ei-ava-interneti-salauksi

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Töökindla arvutusriistvara keskuse juht Maksim JenihhinJenihhin, Maksimforte.delfi.ee2024 Töökindla arvutusriistvara keskuse juht Maksim Jenihhin

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248

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Understanding multidimensional verification : where functional meets non-functionalLai, Xinhui; Balakrishnan, Aneesh; Lange, Thomas; Jenihhin, Maksim; Ghasempouri, Tara; Raik, Jaan; Alexandrescu, DanMicroprocessors and microsystems2019 / art. 102867, 13 p. : ill https://doi.org/10.1016/j.micpro.2019.102867 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Related publications 2

249

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UPS arvuti elektritoitesüsteemisToomsalu, ArvoArvutimaailm1998 / 6, lk. 18-22, 63: ill https://artiklid.elnet.ee/record=b2003508*est

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Using of industry automation software and hardware in education and trainingRosin, Argo; Laugis, Juhan; Lehtla, TõnuCAx Techniques : proceedings of the 4th International Scientific Colloquium : Bielefeld, Germany, September 13-15, 19991999 / p. 119-124 : ill

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