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A DSP-based EBI, ECG and PPG measurement platformAbdullayev, Anar; Rist, Marek; Märtens, Olev; Metshein, Margus; Larras, Benoit; Frappe, Antoine; Gautier, Antoine; Min, Mart; John, Deepu; Cardiff, Barry; Krivosei, Andrei; Annus, PaulIEEE transactions on instrumentation and measurement2023 / art. 2007808, 8 p https://doi.org/10.1109/TIM.2023.3320771 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Dual-source Linear Energy Prediction (LINE-P) model in the context of WSNsAhmed, Faisal; Tamberg, Gert; Le Moullec, Yannick; Annus, PaulSensors2017 / art. 1666, p. 1-22 : ill https://doi.org/10.3390/s17071666 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Dynamic slot allocation using non overlapping backoff algorithm in IEEE 802.15.6 WBANSaboor, Abdul; Ahmad, Rizwan; Ahmed, Waqas; Kiani, Adnan Khalid; Alam, Muhammad Mahtab; Kuusik, Alar; Le Moullec, YannickIEEE sensors journal2020 / p. 10862-10875 : ill https://doi.org/10.1109/JSEN.2020.2993795 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Effect of keysight 3458A jitter on precision of phase difference measurementPokatilov, Andrei; Kübarsepp, Toomas; Vabson, ViktorIEEE transactions on instrumentation and measurement2016 / p. 2595-2600 : ill https://doi.org/10.1109/TIM.2016.2593965 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Effect of nanoparticles on morphology and size of primary silicon and property of selective laser melted Al-high Si content alloysXi, Lixia; Guo, Shuang; Prashanth, Konda Gokuldoss; Sarac, Baran; Eckert, JürgenVacuum2021 / art. 110405 https://doi.org/10.1016/j.vacuum.2021.110405 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Effects of Ar+ etching of Cu2ZnSnSe4 thin films : An x-ray photoelectron spectroscopy and photoluminescence studyYakushev, Michael V.; Sulimov, Mikhail A.; Skidchenko, Ekaterina; Krustok, JüriJournal of Vacuum Science & Technology B2018 / art. 061208, 8 p. : ill https://doi.org/10.1116/1.5050243 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Effects of night ventilation on indoor air quality in educational buildings—a field studyLestinen, Sami; Kilpeläinen, Simo; Kosonen, Risto; Valkonen, Maria; Jokisalo, Juha; Pasanen, PerttiApplied sciences2021 / art. 4056, 20 p. : ill https://doi.org/10.3390/app11094056 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Efficient fixed-switching modulated finite control set-model predictive control based on artificial neural networksBakeer, Abualkasim Ahmed Ali; Alhasheem, Mohammed; Peyghami, SaeedApplied Sciences (Switzerland)2022 / art. 3134 https://doi.org/10.3390/app12063134 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Electrical bioimpedance analysis for evaluating the effect of pelotherapy on the human skin : methodology and experimentsMetshein, Margus; Tuulik, Varje-Riin; Tuulik, Viiu; Kumm, Monika; Min, Mart; Annus, PaulSensors2023 / art. 4251 https://doi.org/10.3390/s23094251 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Electrochemical sensor based on molecularly imprinted polymer for rapid quantitative detection of brain-derived neurotrophic factorAyankojo, Akinrinade George; Boroznjak, Roman; Reut, Jekaterina; Tuvikene, Jürgen; Timmusk, Tõnis; Sõritski, VitaliSensors and Actuators B: Chemical2023 / art. 134656 https://doi.org/10.1016/j.snb.2023.134656 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Electrochemically synthesized MIP sensors : applications in healthcare diagnosticsAyankojo, Akinrinade George; Reut, Jekaterina; Sõritski, VitaliBiosensors2024 / art. 71 https://doi.org/10.3390/bios14020071 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Electrode placement strategies for the measurement of radial artery bioimpedance : simulations and experimentsPesti, Ksenija; Metshein, Margus; Annus, Paul; Kõiv, Hip; Min, MartIEEE transactions on instrumentation and measurement2021 / 10 p. : ill https://doi.org/10.1109/TIM.2020.3011784 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Elliptic-curve crypto processor for RFID applicationsRashid, Muhammad; Jamal, Sajjad Shaukat; Khan, Sikandar Zulqarnain; Alharbi, Adel R.; Aljaedi, Amer; Imran, MalikApplied Sciences (Switzerland)2021 / art. 7079 https://doi.org/10.3390/app11157079 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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End-to-end multimodal sensor dataset collection framework for autonomous vehiclesGu, Junyi; Lind, Artjom; Chhetri, Tek Raj; Bellone, Mauro; Sell, RaivoSensors2023 / art. 6783, 25 p. : ill https://doi.org/10.3390/s23156783 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Enhanced IoT-based end-to-end emergency and disaster relief systemBen Arbia, Dhafer; Alam, Muhammad Mahtab; Kadri, Abdullah; Ben Hamida, Elyes; Attia, RabahJournal of sensor and actuator networks2017 / art. 19, p. 1-18 : ill https://doi.org/10.3390/jsan6030019 Journal metrics at Scopus Article at Scopus

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Enhanced sensing properties of cobalt bis-porphyrin derivative thin films by a magneto-plasmonic-opto-chemical sensorColombelli, A.; Manera, Maria Grazia; Borovkov, Victor; Giancane, GabrieleSensors and actuators B : chemical2017 / p. 1039-1048 : ill https://doi.org/10.1016/j.snb.2017.01.192 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Erratum: Multifractal analysis of high-temperature plasma irradiated tungsten surfaces (Surface Topography: Metrology and Properties (2021) 9 (035030) DOI: 10.1088/2051-672x/ac1dc3)Martsepp, Merike; Laas, Tõnu; Laas, Katrin; Priimets, Jaanis; Mikli, Valdek; Antonov, MaksimSurface topography : metrology and properties2023 / art. 029501 https://doi.org/10.1088/2051-672X/acc81c Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Estimation of flow turbulence metrics with a lateral line probe and regressionChen, Ke; Tuhtan, Jeffrey Andrew; Fuentes-Pérez, Juan Francisco; Toming, Gert; Musall, Mark; Strokina, Nataliya; Kämäräinen, Joni-Kristian; Kruusmaa, MaarjaIEEE transactions on instrumentation and measurement2017 / p. 651-660 : ill https://doi.org/10.1109/TIM.2017.2658278 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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