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76

journal article

Post-RISC-arhitektuurToomsalu, ArvoA & A2001 / 2, lk. 8-14 ; 3, lk. 7-16 https://artiklid.elnet.ee/record=b1006602*est

journal article

77

book article

Power-performance trade-offs in second level memory used by an ARM-like Risc architecturePuttaswamy, Kiran; Ellervee, PeeterPower aware computing2002 / ? p. [chapter 11] https://link.springer.com/chapter/10.1007/978-1-4757-6217-4_11

book article

78

book article EST / book article ENG

PrefaceHollstein, Thomas; Raik, Jaan; Kostin, Sergei; Tšertov, Anton; O’Connor, Ian; Reis, RicardoVLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability, 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016 : Revised Selected Papers2017 / p. V-VI https://link.springer.com/book/10.1007/978-3-319-67104-8 Conference proceedings at Scopus Article at Scopus

book article EST / book article ENG

79

journal article

Protsessor mälusToomsalu, ArvoA & A2001 / 4, lk. 9-16 https://artiklid.elnet.ee/record=b1007646*est

journal article

80

journal article

RISC-arhitektuuri arengusuundade peegeldusi mikroprotsessoris R10000Toomsalu, ArvoArvutustehnika ja Andmetöötlus1996 / 7, lk. 14-19; 8, lk. 16-22; 9, lk. 2-9

journal article

81

journal article

RISC-mikroprotsessorid reaalajasüsteemidesToomsalu, ArvoArvutustehnika ja Andmetöötlus1994 / 10, lk. 2-5 ; 11, lk. 2-6

journal article

82

book

RISC-mikroprotsessorite arhitektuurToomsalu, Arvo1995 https://www.ester.ee/record=b1069536*est

book

83

journal article EST / journal article ENG

Runtime contention and bandwidth-aware adaptive routing selection strategies for networks-on-chipSamman, Faizal; Hollstein, Thomas; Glesner, ManfredIEEE transactions on parallel and distributed systems2013 / p. 1411-1421 : ill https://doi.org/10.1109/TPDS.2012.200 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

84

dissertation

Software-based self-test for microprocessors with high-level decision diagrams = Mikroprotsessorite tarkvara-põhine enesetestimine kõrgtasandi otsustusdiagrammide põhjalJasnetski, Artjom2018 https://digi.lib.ttu.ee/i/?10629 https://www.ester.ee/record=b5151486*est

dissertation

85

journal article EST / journal article ENG

Software-based self-test generation for microprocessors with high-level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, Anton; Brik, MarinaProceedings of the Estonian Academy of Sciences2014 / p. 48-61 : ill https://artiklid.elnet.ee/record=b2665215*est https://doi.org/10.3176/proc.2014.1.08 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

86

book article

Software-based self-test generation for microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Tšertov, Anton; Jasnetski, Artjom; Brik, MarinaLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

book article

87

book

Software-based self-test with decision diagrams for microprocessorsUbar, Raimund-Johannes; Jasnetski, Artjom; Tšertov, Anton; Oyeniran, Adeboye Stephen2018

book

88

journal article

SPARC-V8- ja V9-arhitektuuriga mikroprotsessoridToomsalu, ArvoArvutustehnika ja Andmetöötlus1995 / 7, lk. 14-23: ill

journal article

89

journal article

SPEC92 jõudlustesti vahetab välja SPEC95Toomsalu, ArvoArvutustehnika ja Andmetöötlus1996 / 2, lk. 6-8

journal article

90

book article

Special session: in-field ML-assisted intermittent fault localization and management in RISC-V SoCsSelg, Hardi; Shibin, Konstantin; Tsertov, Anton; Jenihhin, Maksim; Ellervee, Peeter; Raik, Jaan2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)2024 https://doi.org/10.1109/DFT63277.2024.10753541 Article at Scopus

book article

91

book article

Stepper motor drive as a control object for teaching microprocessor control of electrical drivesKährik, Rainer; Lehtla, Madis6th International Symposium "Topical Problems in the Field of Electrical and Power Engineering" : Doctoral School of Energy and Geotechnology : [Kuressaare, January 12-17, 2009]2009 / p. 140-143 : ill

book article

92

journal article

SuperH-arhitektuuriga protsessortuum kiipsüsteemideleToomsalu, ArvoA & A2001 / 1, lk. 11-18 : ill https://artiklid.elnet.ee/record=b1006239*est

journal article

93

journal article

Z-RAM-mäluToomsalu, ArvoA & A2008 / 3, lk. 10-19 https://artiklid.elnet.ee/record=b1022321*est

journal article

94

book article

Teaching digital system testOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Kruus, MargusThe 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble2017 / [6] p

book article

95

book article

Test generation for microprocessor control mechanismsLohuaru, Tõnu; Ubar, Raimund-JohannesFTSD-10 : Deseta Mezdunarodnaja Konferencija "Nadezdnost i Diagnostika na ECM. Mikrokompjutri i Sistemi", Varna, Bulgaria, 1987 = 10th International Conference on Fault-Tolerant Systems and Diagnostics (1987)1987 / p. 305-311

book article

96

book article

Test generation for microprocessors on alternative graphsAlango, Villem; Kont, Toomas; Ubar, Raimund-Johannes33. Internationales Wissenschaftliches Kolloquium : 24.-28.10.1988. H.3 Vortragsreihe B, technische und angewandte Informatik/Computertechnik1988 / p. 11-14

book article

97

book article

Test pattern generation for microprocessor systems on the alternative graph modelUbar, Raimund-JohannesProceedings of the 3rd Symposium of the IMEKO Technical Committee on Technical Diagnostics (TC10), held in Moscow, October 3 - 5, 19831985 / p. 403-410

book article

98

dissertation

Test program generation for microprocessor systemsDušina, Julia1993 https://www.ester.ee/record=b2090526*est

dissertation

99

journal article

Test system for fault detection and diagnosis in microprocessor control devicesUbar, Raimund-Johannes; Lohuaru, Tõnu; Männisalu, Mati; Pukk, P.; Vanamölder, E.Tallinna Tehnikaülikooli Toimetised1990 / lk. 63-77: ill

journal article

100

book article

Testentwicklung für Mikroprozessorsystem mit Hilfe der alternativen GraphenAlango, Villem; Kont, Toomas; Ubar, Raimund-Johannes33. Internationales wissenschaftliches Kolloquium : 24.-28.10.1988. H.1.1988 / S- 11-14 https://www.ester.ee/record=b2936968*est

book article

mikroprotsessorid (subject term)

types of item

subject term 1