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DefSim: CMOS defects on chip for research and educationPleskacz, Witold A.; Borejko, Tomasz; Walkanis, A.; Stopjakova, Viera; Jutman, Artur; Ubar, Raimund-Johannes7th IEEE Latin American Test Workshop LATW'06 : Buenos Aires, Argentina, March 26th-29th, 2006 : proceedings2006 / p. 74-79 : ill

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DefSim: measurement environment for CMOS defectsBorejko, Tomasz; Jutman, Artur; Pleskacz, Witold A.; Ubar, Raimund-Johannes2006 25th International Conference on Microelectronics : Belgrade, Serbia and Montenegro, 14-17 May 2006 : proceedings. Volume 22006 / p. 679-682 https://ieeexplore.ieee.org/document/1651048

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Design error localization in digital circuits by stuck-at fault test patternsJutman, Artur; Ubar, Raimund-Johannes[MIEL] 2000 : 22nd International Conference on Microelectronics : Niš, Yugoslavia, 14-17 May 2000 : proceedings. Volume 22000 / p. 723-726 https://ieeexplore.ieee.org/document/838792

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journal article EST / journal article ENG

Determining asphalt binder aging by using limiting phase angle temperatureLill, Kristjan; Kontson, Karli; Aavik, AndrusBaltic journal of road and bridge engineering2024 / p. 28-49 https://doi.org/10.7250/bjrbe.2024-19.647 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Applicability of limiting phase angle temperatures for measuring the low temperature performance and aging of asphalt binders = Piiravate faasinurga temperatuuride rakendatavus bituumenite madala temperatuuri ja vananemisalase toimivuse mõõtmiseks

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Diagnostic modeling of digital systems with multi-level decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Jutman, Artur; Jenihhin, MaksimDesign and test technology for dependable systems-on-chip2011 / p. 92-118 : ill https://www.researchgate.net/publication/344994231_Diagnostic_Modeling_of_Digital_Systems_with_Multi-Level_Decision_Diagrams

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Digital measurement of periodic signals root-mean-square valueCitavicius, A.BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 317-320: ill

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Digital twin of wind generator for modelling various turbine characteristicsRaja, Hadi Ashraf; Autsou, Siarhei; Kudelina, Karolina; Rjabtšikov, Viktor; Vaimann, Toomas; Kallaste, Ants; Pomarnacki, Raimondas; Hyunh, Van Khang2023 International Conference on Electrical Drives and Power Electronics (EDPE)2023 / p. 1-5 https://doi.org/10.1109/EDPE58625.2023.10274050

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Digital twin of wind generator to simulate different turbine characteristics using IoTRaja, Hadi Ashraf; Kudelina, Karolina; Rjabtšikov, Viktor; Vaimann, Toomas; Kallaste, Ants; Pomarnacki, Raimondas; Hyunh, Van KhangProceedings of the Future Technologies Conference (FTC) 2023. Vol. 12023 / p. 123-132 https://doi.org/10.1007/978-3-031-47454-5_9 Conference proceedings at Scopus Article at Scopus

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Digital twin service unit development for an EV induction motor fault detectionRjabtšikov, Viktor; Mohamed, Mahmoud Ibrahim Hassanin; Asad, Bilal; Rassõlkin, Anton; Vaimann, Toomas; Kallaste, Ants; Kuts, Vladimir; Stepien, Mariusz; Krawczyk, Mateusz2023 IEEE International Conference on Electric Machines and Drives (IEMDC)2023 / 5 p https://doi.org/10.1109/IEMDC55163.2023.10239085

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Development methodology for creating the digital twin for propulsion drive of an electric vehicle = Elektrisõiduki veoajami digitaalse kaksiku arendusmetoodika

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journal article

Early RTL analysis for SCA vulnerability in fuzzy extractors of memory-based PUF enabled devicesLai, Xinhui; Jenihhin, Maksim; Selims, GeorgiosarXiv.org2020 / 6 p. : ill https://doi.org/10.48550/arXiv.2008.08409 https://arxiv.org/abs/2008.08409

journal article

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Approaches to extra-functional verification of security and reliability aspects in hardware designs = Riistvaraprojektide turva- ja töökindlusaspektide ekstrafunktsionaalse verifitseerimise lähenemisviisid

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journal article

Ehitamise ja ehitiste hooldamise vigadestÕiger, KarlTehnika ja Tootmine1983 / lk. 17-19 https://www.ester.ee/record=b1073047*est

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newspaper article

Ehitusvead kollitavad ka uuselamuid : [sisaldab K.Õigeri kommentaari]Õiger, Karl; Tamm, LiiviÄripäev2004 / 27. okt., lk. 16 https://www.aripaev.ee/uudised/2004/10/26/ehitusvead-kollitavad-ka-uuselamuid

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newspaper article

Ekspert hindab kaubamaja tunneli tilkumise pisiveaks : [Vello Otsmaa jt. kommentaaridega]Alas, Askur; Otsmaa, VelloEesti Päevaleht2002 / 25. okt., lk. 2 https://epl.delfi.ee/artikkel/50937489/ekspert-hindab-kaubamaja-tunneli-tilkumise-pisiveaks

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Electronic structure and defect states in bismuth and antimony sulphides identified by energy-resolved electrochemical impedance spectroscopyMiliaieva, D.; Nadaždy, V.; Koltsov, M. A.; Lopez, C.; Saeeyekta, H.; Kuliček, J.; Cazorla, C.; Saucedo, E.; Grzibovskis, Raitis; Vembris, Aivars; Krunks, Malle; Spalatu, NicolaeJournal of Physics Energy2025 / art. 035012 https://doi.org/10.1088/2515-7655/add59f

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Enabling cross-layer reliability and functional safety assessment through ML-based compact modelsAlexandrescu, Dan; Balakrishnan, Aneesh; Lange, Thomas; Glorieux, MaximilienProceedings : 2020 26th IEEE International Symposium on On-Line Testing and Robust System Design : IOLTS 2020, Napoli, Italy, July 13-16, 2020 : virtual edition2020 / 6 p. : ill https://doi.org/10.1109/IOLTS50870.2020.9159750

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Related publications 1

A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks

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journal article

Error sources in analog ASICs and ways for their minimizationMihhailov, JuriInternational journal of engineering and applied sciences (EAAS)2013 / p. 32-41 : ill

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newspaper article

"Estonia" hukutasid konstrueerimisveadTiidemann, TiitSõnumileht1999 / lk. 2

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journal article EST / journal article ENG

Experimental analysis of end mill axis inclination and its influence on 3D areal surface texture parametersLogins, Andris; Rosado Castellano, Pedro; Torims, Toms; Gutierrez, Santiago C.; Sergejev, FjodorProceedings of the Estonian Academy of Sciences2017 / p. 194-201 : ill https://doi.org/10.3176/proc.2017.2.09 http://www.ester.ee/record=b2355998*est https://artiklid.elnet.ee/record=b2820942*est Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Experimental comparison of different diagnosis algorithms in the BIST environmentUbar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan; Kruus, MargusProceedings of the 16th IASTED International Conference on Applied Simulation and Modelling : August 29-31, 2007, Palma de Mallorca, Spain2007 / p. 271-276 : ill https://www.researchgate.net/publication/262275431_Experimental_comparison_of_different_diagnosis_algorithms_in_the_BIST_environment

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Explainable AI based fault detection and diagnosis system for air handling unitsBelikov, Juri; Meas, Molika; Machlev, Ram; Köse, Ahmet; Tepljakov, Aleksei; Loo, Lauri; Petlenkov, Eduard; Levron, YoashProceedings of the 19th International Conference on Informatics in Control, Automation and Robotics - ICINCO, 2022 , Lisbon, Portugal2022 / p. 271-279 https://doi.org/10.5220/0011350000003271

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newspaper article

Facebooki, Instagrami ja Whatsappi tabas tohutu ülemaailmne rike [Võrguväljaanne]ohtuleht.ee2021 "Facebooki, Instagrami ja Whatsappi tabas tohutu ülemaailmne rike"

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book article EST / book article ENG

Fault collapsing in digital circuits using fast fault dominance and equivalence analysis with SSBDDsUbar, Raimund-Johannes; Jürimägi, Lembit; Orasson, Elmet; Raik, JaanVLSI-SoC : Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015 Daejeon, Korea, October 5-7, 2015 : revised selected papers2016 / p. 23-45 : ill https://doi.org/10.1007/978-3-319-46097-0_2 Conference Proceedings at Scopus Article at Scopus Article at WOS

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book article

Fault diagnosis in the BIST environment based on bisection of detected faultsUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanLATW2007 : 8th IEEE Latin-American Test Workshop : March 11-14, 2007, Cuzco, Peru2007 / [6] p. : ill

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Fault modeling and test generation with low- and high-level decision diagramsUbar, Raimund-Johannes24. GI/GMM/ITG-Workshop : Testmethoden und Zuverlässigkeit von Schaltungen und Systemen2012 / p. 1-12

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Fault oriented test pattern generation for sequential circuits using Genetic AlgorithmsIvask, Eero; Raik, Jaan; Ubar, Raimund-JohannesThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 129-132 : ill

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