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Constraint-based test pattern generation at the register-transfer levelViilukas, Taavi; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-Johannes; Krivenko, AnnaProceedings of the 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 14-16, 2010, Vienna, Austria2010 / p. 352-357 : ill http://dx.doi.org/10.1109/DDECS.2010.5491752

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Control and protection of a traction supply systemLehtla, Madis3rd International Symposium "Topical Problems of Education in the Field of Electrical and Power Engineering" : Doctoral School of Energy and Geotechnology : Kuressaare, Estonia, January 16-21, 20062006 / p. 93-98 : ill

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Controller synthesis in control and memory centric high level synthesis systemEllervee, Peeter; Hemani, Ahmed; Kumar, Anshul; Svantesson, Bengt; Öberg, Johnny; Tenhunen, HannuBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 393-396: ill

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29

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Current sensing methods for portable power circuits : working out an accurate flexible integrated solutionMihhailov, Juri2013 https://www.ester.ee/record=b4533635*est

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journal article EST / journal article ENG

DC voltage sensorless predictive control of a high-efficiency PFC single-phase rectifier based on the versatile buck-boost converterGonzález-Castaño, Catalina; Restrepo, Carlos; Sanz, Fredy; Chub, Andrii; Giral, RobertoSensors2021 / art. 5107 https://doi.org/10.3390/s21155107 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

31

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Design and analysis of a DC solid-state circuit breaker for residential energy router applicationRahimpour, Saeed; Husev, Oleksandr; Vinnikov, DmitriEnergies2022 / art. 9434 https://doi.org/10.3390/en15249434 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

Related publications 1

Common-ground energy router structure with enhanced reliability and protection = Ühise nulljuhtmega suurendatud töökindluse ja kaitsega energiaruuter

32

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Determination of leakage inductances of three-winding transformer for HF-PSA resonant circuitŠklovski, Jevgeni; Janson, Kuno; Niilo, Helar11th International Symposium "Topical Problems in the Field of Electrical and Power Engineering." Doctoral School of Energy and Geotechnology II : Pärnu, Estonia, January 16-21, 20122012 / p. 113-116 : ill

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33

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Determination of the nonfaulty limits of circuit characteristics in the fault identification of discrete-type circuitsGadzheva, ElissavetaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 97-100: ill

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A dual-buck-boost DC–DC/AC universal converterOng, Yao Rong; Cao, Shuyu; Lee, Sze Sing; Lim, Chee Shen; Chen, Max M.; Vosoughi Kurdkandi, Naser; Barzegarkhoo, Reza; Siwakoti, Yam P.Electronics (Switzerland)2022 / art. 1973 https://doi.org/10.3390/electronics11131973 Journal metrics at scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

35

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Electrical and control engineeringKalm, Evald1990 https://www.ester.ee/record=b1233571*est

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36

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Electrical engineering and automaticsKull, Arvo; Kiitam, Andres; Bachverk, Aleksander; Kängsep, Eiko; Jõers, Rein; Peterson, Jaak; Toomet, Madis1989 https://www.ester.ee/record=b1212924*est

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37

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Elektrist, energiast ja füüsikast üldiseltKalda, JaanElektriala2019 / lk. 26-27 : ill http://www.ester.ee/record=b1240496*est

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Evaluation of dual-active bridge converter for DC energy buildingsCarvalho da Silva, Edivan Laercio; Blinov, Andrei; Sidorova, Aleksandra; Chub, Andrii; Vinnikov, Dmitri2023 IEEE 17th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG)2023 / 6 p https://doi.org/10.1109/CPE-POWERENG58103.2023.10227460

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Evaluation of equivalent cirquit diagrams and transfer functions for modeling of lithium-ion batteriesRahmoun, Ahmad; Biechl, Helmuth; Rosin, ArgoScientific Journal of Riga Technical University. Electrical, control and communication engineering2013 / p. 34-39 : ill

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Event driven method for transient simulation of high frequency digital circuitsPopescu, Gabriel-Stefan; Tarniceriu, DanielaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 253-256: ill

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41

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Exact static compaction of independent test sequencesRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 315-318 : ill

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42

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Exploiting high-level descriptions for circuits fault tolerance assessmentsBenso, A.; Prinetto, Paolo; Rebaudengo, M.; Sonza Reorda, Matteo; Raik, Jaan; Ubar, Raimund-Johannes1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Paris, October 20-22, 19971997 / p. 212-216 https://ieeexplore.ieee.org/document/628327

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43

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Fast static compaction of tests composed of independent sequences : basic properties and comparison of methodsRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesThe 9th IEEE International Conference on Electronics, Circuits and Systems : ICECS 2002 : September 15-18, 2002, Dubrovnik, Croatia. Volume II2002 / p. 445-448 : ill http://dx.doi.org/10.1109/ICECS.2002.1046190 https://ieeexplore.ieee.org/document/1046190

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44

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Fast test pattern generation for sequential circuits using decision diagram representationsRaik, Jaan; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications (JETTA)2000 / 3, p. 213-226 : ill https://link.springer.com/article/10.1023/A:1008335130158

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45

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Fault oriented test pattern generation for sequential circuits using genetic algorithmsIvask, Eero; Raik, Jaan; Ubar, Raimund-JohannesIEEE European Test Workshop2000 / p. 319-320

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Formalization of finite state machines with data path for the verification of high-level synthesisBorrione, Dominique; Dušina, Julia; Pierre, LaurenceXI Brasilian Symposium on Integrated Circuit Design, September 30 - October 3, 1998, Rio de Janeiro, Brazil : proceedings1998 / p. 99-102: ill https://ieeexplore.ieee.org/document/715419

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Fourier' rida : metoodiline juhend raadiotehiliste ahelate ja signaalide laboratoorse töö sooritamiseks1984 https://www.ester.ee/record=b1245512*est

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48

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Fractional order model identification of receptor-ligand complexes formation by equivalent electrical circuit modelingAtes, Abdullah; Alagoz, Baris Baykant; Tepljakov, Aleksei; Petlenkov, Eduard2019 International Artificial Intelligence and Data Processing Symposium (IDAP)2019 / 5 p. : ill https://doi.org/10.1109/IDAP.2019.8875913

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49

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Generation of tests for the localization of single gate design errors in combinational circuits using the stuck-at fault modelUbar, Raimund-Johannes; Borrione, DominiqueXI Brasilian Symposium on Integrated Circuit Design, September 30 - October 3, 1998, Rio de Janeiro, Brazil : proceedings1998 / p. 51-54 https://ieeexplore.ieee.org/document/715409

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Genetic optimization in circuit simulationHaikarainen, Sakari; Jokinen, Hannu; Valtonen, MarttiBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 381-384: ill

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