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IEEE Electron Devices Society (publisher)
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1
book article
An approach to synthesis of mixed synchronous/asynchronous digital devices
Sudnitsõn, Aleksander
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings
2002
/
p. 695-698
book article
2
book article
Internet-based software for teaching test of digital circuits
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Wuttke, Heinz-Dietrich
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 2
2002
/
p. 659-662 : ill
https://ieeexplore.ieee.org/document/1003344
book article
3
book article
Low power synthesis based on information theoretic measures
Fomina, Jelena
;
Keevallik, Andres
;
Sudnitsõn, Aleksander
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings
2002
/
p. 699-702
https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=1003354
book article
4
book article
Mixed-level defect simulation in data-paths of digital systems
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Ivask, Eero
;
Brik, Marina
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 2
2002
/
p. 617-620 : ill
https://ieeexplore.ieee.org/document/1003333
book article
5
book article
Multi-valued simulation of digital circuits
Ubar, Raimund-Johannes
Proceedings : 1997 21st International Conference on Microelectronics : Niš, Yugoslavia, 14-17 September 1997. Vol. 2
1997
/
p. 721-724 : ill
book article
6
book article
On efficient logic-level simulation of digital circuits represented by the SSBDD model
Jutman, Artur
;
Raik, Jaan
;
Ubar, Raimund-Johannes
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 2
2002
/
p. 621-624 : ill
https://ieeexplore.ieee.org/document/1003334
book article
Number of records 6, displaying
1 - 6
keyword
62
1.
Auger electron spectroscopy
2.
electron
3.
electron backscatter diffraction (EBSD)
4.
electron backscattered diffraction analysis
5.
electron beam induced current
6.
electron beam melting
7.
Electron beams
8.
electron density measurement
9.
electron donor number
10.
electron donor-acceptor complex
11.
electron guns
12.
electron holography
13.
electron irradiation
14.
electron linear accelerator
15.
electron microscopeGrain sizeHolocene Thermal MaximumBaltic SeaGulf of Riga
16.
electron microscopy
17.
electron phonon interaction
18.
electron tomography
19.
electron transport layer
20.
electron transport layers
21.
electron transporting materials
22.
electron-phonon interaction
23.
lone pair electron
24.
scanning electron microscope
25.
scanning electron microscopy
26.
selective electron beam melting
27.
single electron transfer
28.
TiO2 electron transport layer
29.
transmission electron microscopy
30.
acoustic devices
31.
bi-directional fault monitoring devices
32.
biomedical devices
33.
cardiac implantable electronic devices
34.
cardiac implanted electronic devices
35.
chirality devices
36.
constrained devices
37.
electronic devices
38.
embedded devices
39.
energy storage devices
40.
FACTs devices
41.
GaAs power devices
42.
homecare medical devices
43.
implanted devices
44.
In vitro diagnostic medical devices
45.
intelligent electronic devices
46.
lab-on-chip devices
47.
medical devices
48.
microfluidic devices
49.
miniaturized devices
50.
on-scene available devices
51.
peripheral devices
52.
power devices
53.
power semiconductor devices
54.
resource-constrained devices
55.
semiconductor devices
56.
series Protection devices
57.
smart autonomous devices
58.
smart devices
59.
testing of digital devices
60.
thermoelectric devices
61.
wearable devices
62.
wide band gap semiconductor devices
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