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IEEE Electron Devices Society (publisher)
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1
book article
An approach to synthesis of mixed synchronous/asynchronous digital devices
Sudnitsõn, Aleksander
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings
2002
/
p. 695-698
book article
2
book article
Internet-based software for teaching test of digital circuits
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Wuttke, Heinz-Dietrich
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 2
2002
/
p. 659-662 : ill
https://ieeexplore.ieee.org/document/1003344
book article
3
book article
Low power synthesis based on information theoretic measures
Fomina, Jelena
;
Keevallik, Andres
;
Sudnitsõn, Aleksander
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings
2002
/
p. 699-702
https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=1003354
book article
4
book article
Mixed-level defect simulation in data-paths of digital systems
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Ivask, Eero
;
Brik, Marina
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 2
2002
/
p. 617-620 : ill
https://ieeexplore.ieee.org/document/1003333
book article
5
book article
Multi-valued simulation of digital circuits
Ubar, Raimund-Johannes
Proceedings : 1997 21st International Conference on Microelectronics : Niš, Yugoslavia, 14-17 September 1997. Vol. 2
1997
/
p. 721-724 : ill
book article
6
book article
On efficient logic-level simulation of digital circuits represented by the SSBDD model
Jutman, Artur
;
Raik, Jaan
;
Ubar, Raimund-Johannes
23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 2
2002
/
p. 621-624 : ill
https://ieeexplore.ieee.org/document/1003334
book article
Number of records 6, displaying
1 - 6
keyword
59
1.
Auger electron spectroscopy
2.
electron
3.
electron backscatter diffraction (EBSD)
4.
electron backscattered diffraction analysis
5.
electron beam induced current
6.
electron beam melting
7.
Electron beams
8.
electron density measurement
9.
electron donor number
10.
electron donor-acceptor complex
11.
electron guns
12.
electron holography
13.
electron irradiation
14.
electron linear accelerator
15.
electron microscopeGrain sizeHolocene Thermal MaximumBaltic SeaGulf of Riga
16.
electron microscopy
17.
electron phonon interaction
18.
electron tomography
19.
electron transport layer
20.
electron transport layers
21.
electron transporting materials
22.
electron-phonon interaction
23.
lone pair electron
24.
scanning electron microscope
25.
scanning electron microscopy
26.
selective electron beam melting
27.
single electron transfer
28.
TiO2 electron transport layer
29.
transmission electron microscopy
30.
bi-directional fault monitoring devices
31.
biomedical devices
32.
cardiac implantable electronic devices
33.
cardiac implanted electronic devices
34.
chirality devices
35.
constrained devices
36.
embedded devices
37.
energy storage devices
38.
FACTs devices
39.
GaAs power devices
40.
homecare medical devices
41.
implanted devices
42.
In vitro diagnostic medical devices
43.
intelligent electronic devices
44.
lab-on-chip devices
45.
medical devices
46.
miniaturized devices
47.
on-scene available devices
48.
peripheral devices
49.
power devices
50.
power semiconductor devices
51.
resource-constrained devices
52.
semiconductor devices
53.
series Protection devices
54.
smart autonomous devices
55.
smart devices
56.
testing of digital devices
57.
thermoelectric devices
58.
wearable devices
59.
wide band gap semiconductor devices
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