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30601
book article
Higher spins and leptonic decay oriented leptons
Loide, Rein-Karl
;
Ots, I.
;
Saar, R.
Proceedings of the International Tallinn Symposium on Neutrino Physics, Lohusalu, 10-12 Oct., 1990
1990
book article
30602
book article
Higher-order attribute semantics of flat declarative languages
Grigorenko, Pavel
20th Nordic Workshop on Programming Theory : NWPT 2008 : Tallinn, Estonia, 19-21 November 2008 : abstracts
2008
/
p. 37-39 : ill
https://artiklid.elnet.ee/record=b1072901*est
book article
30603
book article
Higher-order attribute semantics of flat languages
Grigorenko, Pavel
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja
2008
/
p. 97-100 : ill
book article
30604
dissertation
Higher-order attribute semantics of flat languages = Lamedate keelte kõrgemat järku atribuutsemantika
Grigorenko, Pavel
2010
https://digi.lib.ttu.ee/i/?510
https://www.ester.ee/record=b2637394*est
dissertation
30605
journal article EST
/
journal article ENG
Higher-order Haar wavelet method for vibration analysis of nanobeams
Majak, Jüri
;
Shvartsman, Boris
;
Ratas, Mart
;
Bassir, David
;
Pohlak, Meelis
;
Karjust, Kristo
;
Eerme, Martin
Materials today communications
2020
/
art. 101290, 6 p. : tab
https://doi.org/10.1016/j.mtcomm.2020.101290
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
30606
journal article
Higher-spin equations with variable mass and spin and causality
Loide, Rein-Karl
;
Ots, Ilmar
;
Saar, Rein
;
Liivat, H.
Hadronic journal
2003
/
p. 193-202
journal article
30607
book article
High-frequency automated observing systems to meet the monitoring and assessment needs in the Baltic Baltic Sea
Lips, Urmas
;
Lips, Inga
Abstracts : [BSSC 2019]
2019
/
p. 20
https://www.su.se/polopoly_fs/1.446756.1566224624!/menu/standard/file/abstracts_A5_ny.pdf
book article
30608
book article
High-frequency current sensor for power network on-line mea[s]urements
Kütt, Lauri
;
Järvik, Jaan
;
Vaimann, Toomas
;
Shafiq, Muhammad
;
Lehtonen, Matti
;
Kilter, Jako
Proceedings of the 13th International Scientific Conference Electric Power Engineering 2012 : EPE 2012 : Brno. Vol. 1
2012
/
p. 367-371 : ill
https://www.researchgate.net/publication/262674502_High-Frequency_Current_Sensor_for_Power_Network_On-line_Measurements
book article
30609
book article
High-frequency split-bobbin transformer design with adjustable leakage inductance
Rahman, Showrov
;
Sidorov, Vadim
;
Chub, Andrii
;
Vinnikov, Dmitri
2021 IEEE 62nd International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON), 15-17 Nov. 2021 : conference proceedings
2021
/
p. 1-5 : ill
https://doi.org/10.1109/RTUCON53541.2021.9711708
book article
Seotud publikatsioonid
1
Universal galvanically isolated DC-DC converters with topology morphing control = Universaalsed topoloogiat muutva juhtimisega galvaaniliselt isoleeritud alalispingemuundurid
30610
journal article
High-Gain Seven-Level Switched-Capacitor Two-Stage Multi-Level Inverter
Ahmed, Hassan Yousif
;
Abdelrahim Abdelghafour, Omar Mohamed
;
Ali, Ziad M.
Frontiers in Energy Research
2022
/
art. 869662
https://doi.org/10.3389/fenrg.2022.869662
journal article
30611
book article
High-K ZrO2 thin films by chemical spray pyrolysis method [Online resource]
Oluwabi, Abayomi Titilope
;
Oja Acik, Ilona
;
Katerski, Atanas
;
Krunks, Malle
Tartu Ülikooli ASTRA projekt PER ASPERA : Funktsionaalsed materjalid ja tehnoloogiad : [7-8 märtsil 2018, Tallinn : teesid]
GSFMT Scientific Conference 2018 : Tallinn, March 7-8, 2018 : abstracts
2018
/
1 p
http://fmtdk.ut.ee/teesid-2018/
book article
30612
journal article
High-key paljundus
Fotokunst
1930
/
lk. 153-154
journal article
30613
journal article EST
/
journal article ENG
High-level axioms for graphical linear algebra
Paixao, Joao
;
Rufino, Lucas
;
Sobocinski, Pawel Maria
Science of computer programming
2022
/
art. 102791 ; 26 p
https://doi.org/10.1016/j.scico.2022.102791
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
30614
newspaper article
High-level CERN delegation visiting Estonia [Online resource]
baltictimes.com
2021
"High-level CERN delegation visiting Estonia"
newspaper article
30615
book article
High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
2019 IEEE European Test Symposium (ETS) : ETS 2019, May 27-31, 2019, Baden-Baden, Germany : Proceedings
2019
/
6 p. : ill
https://doi.org/10.1109/ETS.2019.8791526
book article
30616
book article
High-level combined deterministic and pseudo-exhuastive test generation for RISC processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Gürsoy, Cemil Cem
;
Raik, Jaan
2019 IEEE European Test Symposium (ETS) : proceedings
2019
/
6 p. : ill
https://doi.org/10.1109/ETS.2019.8791526
book article
30617
book article
High-level decision diagram based fault models for targeting FSMs
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Viilukas, Taavi
9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings
2006
/
p. 353-358 : ill
http://dx.doi.org/10.1109/DSD.2006.60
book article
30618
book article
High-Level Decision Diagram manipulations for code coverage analysis
Minakova, Karina
;
Reinsalu, Uljana
;
Tšepurov, Anton
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 207-210 : ill
book article
30619
book article
High-level decision diagram simulation for diagnosis and soft-error analysis
Raik, Jaan
;
Repinski, Urmas
;
Jenihhin, Maksim
;
Chepurov, Anton
Design and test technology for dependable systems-on-chip
2011
/
p. 294-309 : ill
book article
30620
book article
High-level decision diagrams based coverage metrics for verification and test
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Reinsalu, Uljana
;
Ubar, Raimund-Johannes
LATW 2009 : 10th IEEE Latin American Test Workshop : Buzios, Rio de Janero, Brazil, March 2-5, 2009
2009
/
[6] p. : ill
http://dx.doi.org/10.1109/LATW.2009.4813792
book article
30621
book article
High-level decision diagrams for improving simulation performance of digital systems
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Morawiec, Adam
SCI 2000 : World Multiconference on Systemics, Cybernetics and Informatics : July 23-26, 2000, Orlando, Florida, USA : proceedings. Volume IX, Industrial Systems
2000
/
p. 62-67 : ill
book article
30622
book article
High-level design error diagnosis using backtrace on decision diagrams
Raik, Jaan
;
Repinski, Urmas
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Tšepurov, Anton
28th Norchip Conference : Tampere, Finland, 15-16 November 2010 : conference program and papers
2010
/
[4] p. : ill
http://dx.doi.org/10.1109/NORCHIP.2010.5669486
book article
30623
book article
High-level fault diagnosis in RISC processors with Implementation-Independent Functional Test
Oyeniran, Adeboye Stephen
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 2022
2022
/
p. 32-37
https://doi.org/10.1109/ISVLSI54635.2022.00019
book article
30624
book article
High-level functional test generation for microprocessor modules
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
Proceedings of 26th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2019 : Rzeszów, Poland, June 27 - 29, 2019
2019
/
p. 356-361 : ill
https://doi.org/10.23919/MIXDES.2019.8787131
book article
30625
journal article
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Journal of electronic testing : theory and applications
2020
/
p. 87-103
https://doi.org/10.1007/s10836-020-05856-7
journal article
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30601 - 30625
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