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33126
book article
High-Level Decision Diagram manipulations for code coverage analysis
Minakova, Karina
;
Reinsalu, Uljana
;
Tšepurov, Anton
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 207-210 : ill
book article
33127
book article
High-level decision diagram simulation for diagnosis and soft-error analysis
Raik, Jaan
;
Repinski, Urmas
;
Jenihhin, Maksim
;
Chepurov, Anton
Design and test technology for dependable systems-on-chip
2011
/
p. 294-309 : ill
https://www.igi-global.com/chapter/high-level-decision-diagram-simulation/51406
book article
33128
book article
High-level decision diagrams based coverage metrics for verification and test
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Reinsalu, Uljana
;
Ubar, Raimund-Johannes
LATW 2009 : 10th IEEE Latin American Test Workshop : Buzios, Rio de Janero, Brazil, March 2-5, 2009
2009
/
[6] p. : ill
http://dx.doi.org/10.1109/LATW.2009.4813792
book article
33129
book article
High-level decision diagrams for improving simulation performance of digital systems
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Morawiec, Adam
SCI 2000 : World Multiconference on Systemics, Cybernetics and Informatics : July 23-26, 2000, Orlando, Florida, USA : proceedings. Volume IX, Industrial Systems
2000
/
p. 62-67 : ill
https://hal.science/hal-01396447v1
book article
33130
book article
High-level design error diagnosis using backtrace on decision diagrams
Raik, Jaan
;
Repinski, Urmas
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Tšepurov, Anton
28th Norchip Conference : Tampere, Finland, 15-16 November 2010 : conference program and papers
2010
/
[4] p. : ill
http://dx.doi.org/10.1109/NORCHIP.2010.5669486
book article
33131
book article
High-level fault diagnosis in RISC processors with Implementation-Independent Functional Test
Oyeniran, Adeboye Stephen
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 2022
2022
/
p. 32-37
https://doi.org/10.1109/ISVLSI54635.2022.00019
book article
33132
book article
High-level functional test generation for microprocessor modules
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
Proceedings of 26th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2019 : Rzeszów, Poland, June 27 - 29, 2019
2019
/
p. 356-361 : ill
https://doi.org/10.23919/MIXDES.2019.8787131
book article
33133
journal article
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Journal of electronic testing : theory and applications
2020
/
p. 87-103
https://doi.org/10.1007/s10836-020-05856-7
journal article
33134
dissertation
High-level implementation-independent software-based self-test for RISC type microprocessors = Mikroprotsessorite tarkvarapõhine implementatsioonist mittesõltuv funktsionaalne enesekontroll
Oyeniran, Adeboye Stephen
2020
https://digikogu.taltech.ee/et/Item/08a75fbb-3f71-4fe4-b3d0-3f37a9a5f36d
dissertation
33135
book article
High-level intellectual property obfuscation via decoy constants
Aksoy, Levent
;
Nguyen, Quang-Linh
;
Almeida, Felipe
;
Raik, Jaan
;
Flottes, Marie-Lise
;
Dupuis, Sophie
;
Pagliarini, Samuel Nascimento
2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) : Torino, Italy, 28-30 June 2021
2021
/
p. 1-7
https://doi.org/10.1109/IOLTS52814.2021.9486714
book article
33136
book article
High-level modeling and testing of multiple control faults in digital systems
Jasnetski, Artjom
;
Oyeniran, Adeboye Stephen
;
Tšertov, Anton
;
Schölzel, Mario
;
Ubar, Raimund-Johannes
Formal proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 20-22, 2016, Košice, Slovakia
2016
/
[6] p. : ill
http://dx.doi.org/10.1109/DDECS.2016.7482445
book article
33137
book article
High-level path activation technique to speed up sequential circuit test generation
Raik, Jaan
;
Ubar, Raimund-Johannes
European Test Workshop 1999 : proceedings, May 25-28, 1999, Constance, Germany
1999
/
p. 84-89 : ill
https://ieeexplore.ieee.org/document/804289
book article
33138
book
High-level regional mapping of CO2 emission sources, utilization industry and infrastructure in the Baltic Sea and Mediterranean Sea regions
Ringstad, Cathrine
;
Falck da Silva, Eirik
;
Skagestad, Ragnhild
;
Heyn, Richard
;
Biragnet, Cécile
;
Frykman, Peter
;
Anthonsen, Karen Lyng
;
Gravaud, Isaline
;
Wójcicki, Adam
;
Šogenova, Alla
;
Šogenov, Kazbulat
;
Sınayuç, Çağlar
;
Yıldırım, Betül
;
Bulbul, Sevtac
;
Sousa, Leandro-Henrique
;
Perimenis, Anastasios
2023
https://doi.org/10.5281/zenodo.14392847
book
33139
book article
High-level specification of games
Henno, Jaak
Towards Intelligent Engineering and Information Technology
2009
/
p. 307-322
https://link.springer.com/chapter/10.1007/978-3-642-03737-5_22
book article
33140
book article
High-level synthesis and test in the MOSCITO-based virtual laboratory
Schneider, Andre
;
Diener, Karl-Heinz
;
Jervan, Gert
;
Peng, Z.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Hollstein, Thomas
;
Glesner, M.
BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia
2002
/
p. 287-290 : ill
book article
33141
dissertation
High-level synthesis of control and memory intensive applications : thesis submitted to the Royal Institute of Technology in partial fulfillment of the requirements for the degree of Doctor of Technology
Ellervee, Peeter
2000
dissertation
33142
book article
High-level synthesis of control and memory intensive communication systems
Ellervee, Peeter
Eighth Annual IEEE International ASIC Conference and Exhibit : proceedings : Stouffer Renaissance Austin Hotel, Austin, Texas, September 18-22, 1995
1995
/
p. 185-191 : ill
book article
33143
book article
High-level test data generation for software based self-test in microprocessors
Oyeniran, Adeboye Stephen
;
Jasnetski, Artjom
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 2017
2017
/
p. 86-91 : ill
https://doi.org/10.1109/MECO.2017.7977167
book article
33144
book article
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
book article
33145
book article
High-level test synthesis with hierarchical test generation
Jervan, Gert
;
Eles, Petru
;
Peng, Zebo
;
Raik, Jaan
;
Ubar, Raimund-Johannes
17th NORCHIP Conference : Oslo, Norway, 8-9 November 1999 : proceedings
1999
/
p. 291-296
book article
33146
book article
Highlight of photocurrent generation in garbon-based nanohybrids combined with HfO2 nanoparticles
Rauwel, Protima
;
Galeckas, Augustinas
;
Ducroquet, Frederiquet
;
Rauwel, Erwan
5th International Conference on Competitive Materials and Technology Processes : Miskolc-Lillafüred, Hungary, October 8-12, 2018 : book of abstracts
2018
/
p. 166
https://www.ic-cmtp5.eu/doc/book_of_abstract_iccmtp5.pdf
book article
33147
journal article
Highlights from REHVA Supporters’ Seminar 2015
Kurnitski, Jarek
The REHVA European HVAC journal
2015
/
56-59
journal article
33148
book article
Highlights of Estonian Engineering and Technology Sciences
Higher Education and Research in Estonia
2019
/
p. 45 : ill
https://www.digar.ee/viewer/et/nlib-digar:434236/368591/page/47
https://www.ester.ee/record=b5246114*est
book article
33149
journal article
Highlights of the physical oceanography of the Gulf of Finland reflecting potential climate changes
Soomere, Tarmo
;
Leppäranta, Matti
;
Myrberg, Kai
Boreal environment research
2009
/
p. 152-165 : ill
journal article
33150
book article EST
/
book article ENG
Highly active Fe-N/C oxygen electrocatalysts based on silicon carbide derived carbon
Teppor, Patrick
;
Jäger, Rutha
;
Hints, J.
;
Volobujeva, Olga
;
Valk, Peeter
;
Koppel, Miriam
;
Lust, Enn
Polymer Electrolyte Fuel Cells & Electrolyzers 20 (PEFC & E 20)
2020
/
p. 607 - 615
https://doi.org/10.1149/09809.0607ecst
Conference Proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
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