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13201
book article
DeepHLS: A complete toolchain for automatic synthesis of deep neural networks to FPGA
Riazati, Mohammad
;
Daneshtalab, Masoud
;
Sjodin, Mikael
;
Lisper, Bjorn
ICECS 2020 - 27th IEEE International Conference on Electronics, Circuits and Systems, November 23-25, 2020, Virtual Conference : Proceedings
2020
/
4 p
https://doi.org/10.1109/ICECS49266.2020.9294881
book article
13202
book article
Deep-learning based blood cells classification and initial edge device implementation
Islam, Md. Raisul
;
Le Moullec, Yannick
;
Afrin, Fariha
;
Ahmed, Faisal
2022 18th Biennial Baltic Electronics Conference (BEC)
2022
/
6 p. : ill
https://doi.org/10.1109/BEC56180.2022.9935610
book article
13203
journal article
Deep-level photoluminescence of doped CdTe in 0,8 eV region
Krustok, Jüri
;
Lõo, A.
;
Piibe, Toomas
Journal of physics and chemistry of solids
1991
/
8, p. 1037-1038
journal article
13204
newspaper article
Deeptech Sandbox toob Eestisse süvatehnoloogia eksperdid tippkeskustest üle Euroopa : Järgmisel Deeptech Sandboxil on kohal valdkonna tipptegijad Cambridge’i ülikoolist
digi.geenius.ee
2023
Deeptech Sandbox toob Eestisse süvatehnoloogia eksperdid tippkeskustest üle Euroopa : Järgmisel Deeptech Sandboxil on kohal valdkonna tipptegijad Cambridge’i ülikoolist
newspaper article
13205
journal article EST
/
journal article ENG
Deep-ultraviolet emitter : rare-earth-free ZnAl2O4 nanofibers via a simple wet chemical route
Rojas Hernandez, Rocio Estefania
;
Rubio-Marcos, Fernando
;
Romet, Ivo
;
Del Campo, Adolfo
;
Gorni, Giulio
;
Hussainova, Irina
;
Fernandez, Jose Francisco
;
Nagirnyi, Vitali
Inorganic Chemistry
2022
/
p. 11886-11896
https://doi.org/10.1021/acs.inorgchem.2c01646
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
13206
book article
DeepVigor: VulnerabIlity Value RanGes and FactORs for DNNs’ Reliability Assessment
Ahmadilivani, Mohammad Hasan
;
Taheri, Mahdi
;
Raik, Jaan
;
Daneshtalab, Masoud
;
Jenihhin, Maksim
IEEE European Test Symposium (ETS) : Venice, Italy, 22-26 May 2023 : proceedings
2023
/
6 p. : ill
https://doi.org/10.1109/ETS56758.2023.10174133
book article
Related publications
2
Assessment and Enhancement of Hardware Reliability for Deep Neural Networks = Riistvara töökindluse hindamine ja täiustamine süvanärvivõrkude jaoks
Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
13207
journal article
DeepVigor+: Scalable and Accurate Semi-Analytical Fault Resilience Analysis for Deep Neural Networks
Ahmadilivani, Mohammad Hasan
;
Raik, Jaan
;
Daneshtalab, Masoud
;
Jenihhin, Maksim
arXiv.org
2024
/
14 p. : ill
https://doi.org/10.48550/arXiv.2410.15742
journal article
Related publications
1
Assessment and Enhancement of Hardware Reliability for Deep Neural Networks = Riistvara töökindluse hindamine ja täiustamine süvanärvivõrkude jaoks
13208
journal article
Deering rohuniitja proovitööde valgusel
Tehnika Põllumajanduses
1939
/
lk. 30
journal article
13209
journal article
[Deeringi reaskülvimasin]
Uus Talu
1927
/
lk. 259 : fot
journal article
13210
journal article
"Deeringi" uus niidumasin
Põllumees
1932
/
lk. 291-292 : joon
journal article
13211
journal article
"Deering-Mc Cormik" niidumasina 100 a. juubel 1831-1931
Tehnika Põllumajanduses
1931
/
lk. 45-48 : fot
journal article
13212
book article
Defect analysis of renovated facade walls with etics solutions in cold climate conditions
Liisma, Eneli
;
Sepri, Raili
;
Raado, Lembi-Merike
;
Lill, Irene
;
Witt, Emlyn David Qivitoq
;
Sulakatko, Virgo
;
Põldaru, Mattias
CESB 16 - Central Europe Towards Sustainable Building 2016 : Innovations for Sustainable Future : [book of abstracts]
2016
/
p. 65-66
book article
13213
book article
Defect analysis of renovated facade walls with etics solutions in cold climate conditions [Online resource]
Liisma, Eneli
;
Sepri, Raili
;
Raado, Lembi-Merike
;
Lill, Irene
;
Witt, Emlyn David Qivitoq
;
Sulakatko, Virgo
;
Põldaru, Mattias
CESB 16 - Central Europe Towards Sustainable Building 2016 : Innovations for Sustainable Future : [electronic proceedings]
2016
/
p. 174-181 : ill
book article
13214
book article
Defect oriented fault coverage of 100stuck-at fault test sets
Blyzniuk, M.
;
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Lobur, M.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 2000
2000
/
p. 511-516 : ill
https://repo.pw.edu.pl/info.seam?ps=20&id=WUT7e20f35d67ae45d3b2d1264d7a4ba722&lang=en&pn=1&cid=156607
book article
13215
journal article
Defect structure of Cl and Cu doped CdS heat treated in Cd and S2 vapour
Kukk, Peeter-Enn
;
Altosaar, Mare
Journal of solid state chemistry
1983
/
p. 1-11
journal article
13216
journal article
Defect structure of Cu‐doped cadmium selenide
Öpik, Andres
;
Varvas, Jüri
Physica status solidi (a) : applications and materials science
1982
/
p. 467-473 : ill
https://doi.org/10.1002/pssa.2210740212
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article
13217
journal article
Defect structure of silver-doped cadmium telluride
Nirk, Tiit
Tallinna Tehnikaülikooli Toimetised
1994
/
lk. 3-12: ill
journal article
13218
journal article EST
/
journal article ENG
Defect studies in Cu2ZnSnSe4 and Cu2ZnSn(Se0.75S0.25)4 by admittance and photoluminescence spectroscopy
Kask, Erkki
;
Grossberg, Maarja
;
Josepson, Raavo
;
Salu, Pille
;
Timmo, Kristi
;
Krustok, Jüri
Materials science in semiconductor processing
2013
/
p. 992-996 : ill
https://doi.org/10.1016/j.mssp.2013.02.009
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
13219
book article
Defect-oriented BIST quality analysis
Kruus, Helena
;
Ubar, Raimund-Johannes
;
Raik, Jaan
BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia
2010
/
p. 153-156 : ill
book article
13220
book article
Defect-oriented fault simulation and test generation in digital circuits
Kuzmicz, W.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE ISQED 2001 : proceedings of the IEEE 2001 2nd International Symposium on Quality Electronic Design : March 26-28, 2001, San Jose, California
2001
/
p. 365-371
https://ieeexplore.ieee.org/document/915257
book article
13221
book article
Defect-oriented library builder and hierarchical test generation
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 2001
2001
/
p. 163-168 : ill
book article
13222
journal article
Defect-oriented mixed-level fault simulation in digital systems
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Ivask, Eero
;
Brik, Marina
Facta Universitatis [Niš]. Series electronics and energetics
2002
/
1, April, p. 123-136 : ill
journal article
13223
book article
Defect-oriented modul-level fault diagnosis in digital circuits
Kostin, Sergei
;
Ubar, Raimund-Johannes
;
Raik, Jaan
Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany
2011
/
p. 81-86
book article
13224
book article
Defect-oriented test- and layout-generation for standard-cell ASIC designs
Sudbrock, Joachim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Kuzmicz, Wieslaw
;
Pleskacz, Witold A.
Proceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 2005
2005
/
p. 79-82 : ill
https://ieeexplore.ieee.org/document/1559781
book article
13225
book article
Defect-oriented test generation and fault simulation in the environment of MOSCITO
Schneider, Andre
;
Diener, Karl-Heinz
;
Gramatova, Elena
;
Fisherova, Maria
;
Ivask, Eero
;
Ubar, Raimund-Johannes
;
Pleskacz, Witold A.
;
Kuzmicz, W.
BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia
2002
/
p. 303-306 : ill
book article
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