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book article

Fault simulation with parallel exact critical path tracing in multiple core environmentGorev, Maksim; Ubar, Raimund-Johannes; Devadze, SergeiProceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE) : 9-13 March 2015, Grenoble, France2015 / p. 1180-1185 : ill

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27

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Handbook of testing electronic systemsNovak, Ondrej; Gramatova, Elena; Ubar, Raimund-Johannes; Jutman, Artur; Raik, Jaan2005 https://www.ester.ee/record=b2102523*est

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28

book article

Hierarchical identification of NBTI-critical gates in nanoscale logicKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, MaksimLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

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29

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Hierarchical identification of untestable faults in sequential circuitsRaik, Jaan; Ubar, Raimund-Johannes; Krivenko, Anna; Kruus, Margus10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 668-671 : ill http://dx.doi.org/10.1109/DSD.2007.4341539

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30

journal article EST / journal article ENG

Identification and rejuvenation of NBTI-critical logic paths in nanoscale circuitsJenihhin, Maksim; Squillero, Giovanni; Tihhomirov, Valentin; Kostin, Sergei; Raik, Jaan; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications (JETTA)2016 / p. 273-289 : ill https://doi.org/10.1007/s10836-016-5589-x Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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31

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Identification and rejuvenation of NBTI-critical paths in nanoscale logic circuitsJenihhin, Maksim1st International Workshop on Reliability and Aging in Forthcoming Electronic Systems : May 28-29, 2015, Cluj-Napoca, Romania2015 / [1] p

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32

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Impulss-seadmed : laboratoorne töö nr. 5 : trigerid loogikaelementidel1986 https://www.ester.ee/record=b1240931*est

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33

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Impulss-seadmed : laboratoorne töö nr. 8 : lineaarpinge generaator1986 https://www.ester.ee/record=b2618544*est

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34

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Informal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 20052005 https://www.ester.ee/record=b2055139*est

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35

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Investigating defects in digital circuits by Boolean differential equationsKruus, Helena; Orasson, Elmet; Robal, Tarmo; Ubar, Raimund-JohannesThe 4th International Conference "Distance Learning - Educational Sphere of XXI Century" (DLESC'04)2004 / p. 432-435

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36

journal article EST / journal article ENG

Low frequency acoustic method to measure the complex bulk modulus of porous materialsNapolitano, Marialuisa; Di Giulio, Elio; Auriemma, FabioThe Journal of the Acoustical Society of America2022 / art. 1545 https://doi.org/10.1121/10.0009767 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

37

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Low voltage 2-GHz GaAs transmitter circuit modulesKalajo, Sami; Kiraly, J.; Porra, VeikkoBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 167-170: ill

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38

journal article EST / journal article ENG

Modeling and simulation of circuits with shared structurally synthesized BDDsUbar, Raimund-Johannes; Jürimägi, Lembit; Raik, Jaan; Viies, VladimirMicroprocessors and microsystems2017 / p. 56-61 : ill https://doi.org/10.1016/j.micpro.2016.09.006 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

39

book article

Multiple control fault testing in digital systems with high-level decision diagramsUbar, Raimund-Johannes; Oyeniran, Adeboye Stephen2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings2016 / [6] p. : ill http://dx.doi.org/10.1109/AQTR.2016.7501287

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40

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Multiple fault analyses in logic circuitsUbar, Raimund-JohannesIFAC-Symposium Discrete Systems : Dresden, 14.-19. 3. 771977 / p. [?]

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41

book article

Organ bio-impedance modelling with 3D mesh of equivalent circuitsGordon, RaunoProceedings of the XII International Conference on Electrical Bioimpedance & the V Conference on Electrical Impedance Tomography : ICEBI/EIT 2004 : June 20-24, 2004, Gdansk, Poland. Vol. 22004 / p. 715-718

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42

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Overcoming convergence problems in simulationAaltonen, SakariBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 273-276: ill

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43

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Performance optimization by Extended Peripheral RetimingFehlauer, Erhard; Rülke, Steffen; Franke, GünterBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 21994 / p. 425-430: ill https://www.ester.ee/record=b2150914*est

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44

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Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia2012 http://www.ester.ee/record=b2777270*est

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45

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Product and manufacturing in electronics : supplementary material in the subject "Technologies of electronic circuits"Rang, Toomas2003 https://www.ester.ee/record=b1766953*est

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46

book article

Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPGPalermo, N.; Tihhomirov, Valentin; Copetti, Thiago; Jenihhin, Maksim; Raik, Jaan; Kostin, Sergei2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102405

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47

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Research and training environment for digital design and testUbar, Raimund-Johannes; Wuttke, Heinz-DietrichProceedings of the Eighth IASTED International Conference on Computers and Advanced Technology in Education : August 29-31, 2005, Oranjestad, Aruba2005 / p. 232-237 : ill https://ieeexplore.ieee.org/document/1408779

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48

book article

Reuse-dominated synthesis of electronic designsConradi, PeterBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 21994 / p. 431-435: ill https://www.ester.ee/record=b2150914*est

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49

book article

Scalable algorithm for structural fault collapsing in digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Orasson, Elmet; Raik, Jaan2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) : October 5-7, 2015, Daejeon, Korea2015 / p. 171-176 : ill

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50

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A scalable technique to identify true critical paths in sequential circuitsUbar, Raimund-Johannes; Kostin, Sergei; Jenihhin, Maksim; Raik, JaanProceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany2017 / p. 152-157 : ill https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553

book article

elektronlülitused (subject term)

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