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76

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Internet-based software for teaching test of digital circuitsUbar, Raimund-Johannes; Jutman, Artur; Orasson, Elmet; Raik, Jaan; Evartson, Teet; Wuttke, Heinz-DietrichMicroelectronics education : proceedings of the 4th European Workshop on Microelectronics Education : EWME 2002, Spain, May 23-24, 20022002 / p. 317-320 : ill https://ieeexplore.ieee.org/document/1003344

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77

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Invited paper: System-Wide Fault Management based on IEEE P1687 IJTAGJutman, Artur; Devadze, Sergei; Aleksejev, Jevgeni6th International Workshop on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC) : 20-22 June 2011, Montpeillier, France2011 / [4] p.: ill https://ieeexplore.ieee.org/document/5981520

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78

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Java applets support for an asynchronous-mode learning of digital design and testJutman, Artur; Sudnitsõn, Aleksander; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichITHET 2003 proceedings : 4th International Conference on Information Technology Based Higher Education and Training : July 7-9, 2003, Marrakech, Morocco2003 / p. 397-401 : ill https://citeseerx.ist.psu.edu/document?repid=rep1&type=pdf&doi=92f0b0e5011a2192d5a1b98baa751cb8cd2f7ff3

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79

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Java technology based training system for teaching digital design and testDevadze, Sergei; Jutman, Artur; Sudnitsõn, Aleksander; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 283-286 : ill

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80

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Keynote: cost-efficient reliability for Edge-AI chipsJenihhin, Maksim; Taheri, Mahdi; Cherezova, Natalia; Ahmadilivani, Mohammad Hasan; Selg, Hardi; Jutman, Artur; Shibin, Konstantin; Tsertov, Anton; Devadze, Sergei; Kodamanchili, Rama Mounika; Rafiq, Ahsan; Raik, Jaan; Daneshtalab, Masoud2024 IEEE 25th Latin American Test Symposium (LATS)2024 / 2 p https://doi.org/10.1109/LATS62223.2024.10534610 Article at Scopus

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Related publications 1

Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine

81

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Laboratory training for teaching design and test of digital circuitsJutman, Artur; Ubar, Raimund-JohannesProceedings of the 8th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2001 : Zakopane, Poland, 21-23 June 20002001 / p. 521-524 : ill https://pld.ttu.ee/~artur/papers/TestLabs-MIXDES01.pdf

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82

journal article

Learning digital test and diagnostics via internetUbar, Raimund-Johannes; Jutman, Artur; Kruus, Margus; Orasson, Elmet; Devadze, Sergei; Wuttke, Heinz-DietrichInternational journal of online engineering2007 / 1, [9] p. : ill https://www.db-thueringen.de/servlets/MCRFileNodeServlet/dbt_derivate_00032681/iJOE_1681-1221_03_2007_1_361.pdf

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83

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Learning digital test and diagnostics via internet [Electronic resource]Ubar, Raimund-Johannes; Jutman, Artur; Kruus, Margus; Orasson, Elmet; Devadze, Sergei; Wuttke, Heinz-DietrichInternational journal of computing & information sciences2006 / 2, p. 86-96 : ill

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84

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LFSR polynomial and seed selection using genetic algorithmAleksejev, E.; Jutman, Artur; Ubar, Raimund-JohannesBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 179-182 : ill

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85

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Maagiline miljonipiir on peagi ületatud : [2003. a. ületab TTÜ Arengufondi ja Vilistlaskogu stipendiumide kogusumma 1 miljoni : stipendiumitunnistuste pidulikust kätteandmisest 7. nov. Tallinna Raekojas rohkem kui 30-le TTÜ stipendiaadile, ka vastavad küsimustele: Gunnar Okk, Artur Jutman ja Toomas Luman]Ummelas, Mart; Okk, Gunnar; Jutman, Artur; Luman, ToomasMente et Manu2002 / lk. 1 https://www.ester.ee/record=b1242496*est

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86

book article EST / book article ENG

Marginal PCB assembly defect detection on DDR3/4 memory busOdintsov, Sergei; Jutman, Artur; Devadze, Sergei2017 IEEE International Test Conference (ITC 2017) : Forth Worth, Texas, USA, 31 October - 2 November 20172017 / p. 238-247 : ill https://doi.org/10.1109/TEST.2017.8242070 Conference proceedings at Scopus Article at Scopus Article at WOS

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87

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A method for crosstalk fault detection in on-chip busesBengtsson, Tomas; Jutman, Artur; Ubar, Raimund-Johannes; Kumar, ShashiNorchip : proceedings : Oulu, Finland, 21-22 November 20052005 / p. 285-288 : ill https://doi.org/10.1109/NORCHP.2005.1597045

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88

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Microprocessor modeling for board level test access automationDevadze, Sergei; Jutman, Artur; Tšertov, Anton; Ubar, Raimund-JohannesProceedings of 10th IEEE Workshop on RTL and High Level Testing : Hong Kong, November 27-28, 20092009 / ? p

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89

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Microprocessor-based system test using debug interfaceDevadze, Sergei; Jutman, Artur; Tšertov, Anton; Instenberg, Martin; Ubar, Raimund-Johannes26th Norchip Conference : Tallinn, Estonia, 17-18 November 2008 : formal proceedings2008 / p. 98-101 : ill http://dx.doi.org/10.1109/NORCHP.2008.4738291

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90

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Modeling microprocessor faults on high-level decision diagrams [Electronic resource]Ubar, Raimund-Johannes; Raik, Jaan; Jutman, Artur; Jenihhin, Maksim; Istenberg, Martin; Wuttke, Heinz-DietrichDSN 2008 : supplemental : 2008 IEEE International Conference on Dependable Systems & Networks With FTCS & DCC (DSN) : June 24-27, 2008, Anchorage, Alaska2008 / p. C17-C22 : ill. [CD-ROM] https://webhost.laas.fr/TSF/WDSN08/2ndWDSN08(LAAS)_files/Slides/WDSN08S-04-Ubar.pdf

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91

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New built-in self-test scheme for SoC interconnectJutman, Artur; Ubar, Raimund-Johannes; Raik, JaanThe 9th World Multi-Conference on Systemics, Cybernetics and Informatics : WMSCI 2005 : July 10-13, 2005, Orlando, Florida, USA. Vol. IV2005 / p. 19-24 : ill https://www.researchgate.net/publication/237375234_New_Built-In_Self-Test_Scheme_for_SoC_Interconnect

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92

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A new FPGA-based detection method for spurious variations in PCBA power distribution networkOdintsov, Sergei; Bozzoli, Ludovica; De Sio, Corrado; Sterpone, Luca; Jutman, Artur2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings2019 / 6 p. : ill https://doi.org/10.1109/DDECS.2019.8724662

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93

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A novel artificial neural networks based automatic adaptive fault detection technique for analog circuitsPetlenkov, Eduard; Jutman, Artur; Nõmm, Sven; Ubar, Raimund-JohannesBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 167-170 : ill

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94

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Off-line testing of crosstalk induced glitch faults in NoC InterconnectsBengtsson, Tomas; Kumar, Shashi; Jutman, Artur; Ubar, Raimund-JohannesProceedings [of] 24th IEEE Norchip Conference : Linköping, Sweden, 20-21 November 20062006 / p. 221-225 : ill http://dx.doi.org/10.1109/NORCHP.2006.329215

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95

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Off-line testing of delay faults in NoC interconnectsBengtsson, Tomas; Jutman, Artur; Kumar, Shashi; Peng, Zebo; Ubar, Raimund-Johannes9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings2006 / p. 677-680 : ill http://dx.doi.org/10.1109/DSD.2006.72

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96

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On coverage of timing related faults at board levelJutman, Artur; Aleksejev, Igor; Devadze, Sergei2016 21st IEEE European Test Symposium (ETS) : May 23rd-26th 2016, Amsterdam, The Netherlands : proceedings2016 / [2] p. : ill https://doi.org/10.1109/ETS.2016.7519295

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97

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On efficient logic-level simulation of digital circuits represented by the SSBDD modelJutman, Artur; Raik, Jaan; Ubar, Raimund-Johannes23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 22002 / p. 621-624 : ill https://ieeexplore.ieee.org/document/1003334

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98

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On in-system programming of non-volatile memoriesTšertov, Anton; Devadze, Sergei; Jutman, Artur; Jasnetski, ArtjomInternational journal of microelectronics and computer science2013 / p. 72-78 : ill

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99

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On in-system programming of non-volatile memoriesTšertov, Anton; Devadze, Sergei; Jutman, Artur; Jasnetski, ArtjomProceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2013, Gdynia, Poland, June 20-22, 20132013 / p. 408-413 : ill

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100

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On LFSR polynomial calculation for test time reductionJutman, ArturComputer Science Meets Automation : 10-13 September 2007 : proceedings. Volume II2007 / p. 153-158 : ill https://www.db-thueringen.de/receive/dbt_mods_00008867

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Jutman, Artur (author)

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author 34

name of the person 26

CV 24

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