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2026

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Reliability evaluation of isolated buck-boost DC-DC series resonant converterBakeer, Abualkasim Ahmed Ali; Chub, Andrii; Shen, YanfengIEEE open journal of power electronics2022 / p. 131-141 https://doi.org/10.1109/OJPEL.2022.3157200 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Fault-tolerant galvanically isolated DC‑DC converters with zero redundancy = Null-liiasusega veatolerantsed galvaanilise isolatsiooniga alalispingemuundurid

2027

book article

Reliability evaluation of the universal power electronic interface converter for PV applicationsKhan, Salman; Chub, Andrii; Vinnikov, Dmitri; Kasper, Matthias; Deboy, Gerald2024 IEEE 21st International Power Electronics and Motion Control Conference (PEMC)2024 / 8 p https://doi.org/10.1109/PEMC61721.2024.10726360

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2028

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Reliability improvements for multiprocessor systems by health-aware task schedulingSchmidt, Robert; Massoud, Rehab; Raik, Jaan; Garcia-Ortiz, Alberto; Drechsler, Rolf2018 IEEE 24th International Symposium on On-Line Testing and Robust System Design (IOLTS 2018) : 2 - 4 July 2018, Spain2018 / p. 247-250 : ill http://dx.doi.org/10.1109/IOLTS.2018.8474101

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2029

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Reliability of DC-link capacitors in two-stage micro-inverters under different PV module sizesSangwongwanich, Ariya; Shen, Yanfeng; Chub, Andrii; Liivik, Elizaveta; Vinnikov, Dmitri; Wang, Huai; Blaabjerg, FredeICPE 2019 - ECCE Asia : 10th International Conference on Power Electronics - ECCE Asia : "Green World with Power Electronics" : May 27-30, 2019 BEXCO, Busan, Korea2019 / p. 1867-1872 : ill https://ieeexplore.ieee.org/xpl/conhome/8786807/proceeding

book article

2030

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Reliability of electroencephalogram-based individual markers - case studyUudeberg, Tuuli; Päeske, Laura; Hinrikus, Hiie; Lass, Jaanus; Bachmann, Maie2020 42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC)2020 / p. 276 - 279 https://doi.org/10.1109/EMBC44109.2020.9175274 Conference Proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG

2031

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Reliability study of input side capacitors in impedance-source PV microconvertersLiivik, Elizaveta; Vinnikov, Dmitri; Chub, Andrii; Shen, YanfengIECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society : proceedings2019 / p. 5026–5032 : ill https://doi.org/10.1109/IECON.2019.8927173 Conference proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG

2032

journal article EST / journal article ENG

Reliability-critical computation offloading in UAV swarmsRahbari, Dadmehr; Ahmed, Foisal; Jenihhin, Maksim; Alam, Muhammad Mahtab; Le Moullec, YannickIEEE Systems Journal2024 / p. 1871-1882 https://doi.org/10.1109/JSYST.2024.3432449 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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2033

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Reliable health monitoring and fault management infrastructure based on embedded instrumentation and IEEE 1687Jutman, Artur; Shibin, Konstantin; Devadze, SergeiIEEE AUTOTESTCON 2016 : Anaheim, California, USA, September 12-15, 2016 : proceedings2016 / p. 240-249 : ill https://doi.org/10.1109/AUTEST.2016.7589605

book article

2034

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Remote data transfer and comparative performance through PyBaMM and mathematical techniques in battery applicationsZequera, Rolando Antonio Gilbert; Rassõlkin, Anton; Belolipetskaja, Diana2025 IEEE Seventh International Conference on DC Microgrids (ICDCM)2025 / 6 p https://doi.org/10.1109/ICDCM63994.2025.11144690

book article EST / book article ENG

2035

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Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cellsAzad, Siavoosh Payandeh; Oyeniran, Adeboye Stephen; Ubar, Raimund-Johannes21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings2018 / p. 21-26 : ill https://doi.org/10.1109/DDECS.2018.00011

book article

2036

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Representing gate-level SET faults by multiple SEU faults on RT-levelBagbaba, Ahmet Cagri; Jenihhin, Maksim; Ubar, Raimund-Johannes; Sauer, Christian2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020 : proceedings2020 / art. 19889351, 6 p. : ill https://doi.org/10.1109/IOLTS50870.2020.9159715

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Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks

2037

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Requirements elicitation and specification using the agent paradigm : the case study of an aircraft turnaround simulatorMiller, Tim; Lu, Bin; Sterling, Leon; Beydoun, Ghassan; Taveter, KuldarIEEE transactions on software engineering2014 / p. 1007-1024 : ill https://doi.org/10.1109/TSE.2014.2339827 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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2038

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Requirements to data acquisition and signal analysis for electrical grid condition monitoringAnijärv, Toomas Erik; Shabbir, Noman; Kütt, Lauri; Iqbal, Muhammad Naveed2020 IEEE 61st International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON), Riga, Latvia, Nov. 5-7, 2020 : conference proceedings2020 https://doi.org/10.1109/RTUCON51174.2020.9316487

book article

2039

journal article

RESAA: A Removal and Structural Analysis Attack Against Compound Logic LockingAlmeida, Felipe; Aksoy, Levent; Pagliarini, Samuel NascimentoIEEE Transactions on Very Large Scale Integration (VLSI) Systems2025 / p. 1348-1360 https://doi.org//10.1109/TVLSI.2025.3534658

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Advanced Hardware Protection Mechanisms : A Study on Logic Locking and Circuit Obfuscation Techniques [Võrguteavik] = Täiustatud riistvara kaitsemehhanismid : uuring loogikalukustamise ja hägustamise tehnikate kohta

2040

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RESCUE : cross-sectoral PhD training concept for interdependent reliability, security and qualityVierhaus, Heinrich Theodor; Jenihhin, Maksim; Sonza Reorda, Matteo2018 12th European Workshop on Microelectronics Education (EWME) : September 24–26, 20182018 / p. 45-50 : ill https://doi.org/10.1109/EWME.2018.8629465

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2041

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Research and training environment for digital design and testUbar, Raimund-Johannes; Wuttke, Heinz-Dietrich34th ASEE/IEEE Frontiers in Education Conference : October 20-23, 2004, Savannah, GA2004 / p. S3F-18-S3F-23 : ill http://dx.doi.org/10.1109/FIE.2004.1408779

book article

2042

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Research of voltage stability in 10 kV distribution networks during integrating the 2 MW solar power plantKeshuov, S.A.; Shokolakova, S.; Tokhtibakiev, K.K.; Šuvalova, Jelena2nd International Conference on Smart Grid and Smart Cities : (ICSGSC 2018), August 12-14, 2018, Kuala Lumpur, Malaysia2018 / p. 91-94 : ill https://doi.org/10.1109/ICSGSC.2018.8541303

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2043

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Reseeding using compaction of pre-generated LFSR sub-sequencesJutman, Artur; Aleksejev, Igor; Raik, Jaan; Ubar, Raimund-JohannesICECS 2008 : The 15th IEEE International Conference on Electronics, Circuits and Systems : Malta2008 / p. 1290-1295 : ill http://dx.doi.org/10.1109/ICECS.2008.4675096

book article

2044

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Residental load harmonics in distribution gridNiitsoo, Jaan; Palu, Ivo; Kilter, Jako; Taklaja, Paul; Vaimann, ToomasThe 3rd International Conference on Electric Power and Energy Conversion Systems (EPECS 2013) : [proceedings]2013 / p. 1-6 : ill

book article

2045

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Residential DC load forecasting using long short-term memory network (LSTM)Shabbir, Noman; Ahmadiahangar, Roya; Rosin, Argo; Husev, Oleksandr; Jalakas, Tanel; Martins, Joao2023 IEEE 11th International Conference on Smart Energy Grid Engineering (SEGE)2023 / p. 131-136 https://doi.org/10.1109/SEGE59172.2023.10274596

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2046

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Residential load forecasting for flexibility prediction using machine learning-based regression modelAhmadiahangar, Roya; Häring, Tobias; Rosin, Argo; Korõtko, Tarmo; Martins, Joao2019 IEEE International Conference on Environment and Electrical Engineering and 2019 IEEE Industrial and Commercial Power Systems Europe (EEEIC / I&CPS Europe)2019 / 4 p. : ill https://doi.org/10.1109/EEEIC.2019.8783634

book article

2047

book article

Residential load forecasting using recurrent neural networksShabbir, Noman; Ahmadiahangar, Roya; Raja, Hadi Ashraf; Kütt, Lauri; Rosin, Argo2020 IEEE 14th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG) : proceedings2020 / p. 478-481 : ill https://doi.org/10.1109/CPE-POWERENG48600.2020.9161565

book article

2048

book article

A resilience-enhancing system restoration method considering voltage balancePang, Kaiyuan; Wang, Yizheng; Wen, Fushuan; Palu, Ivo; Yang, Zeng; Chen, Minghui; Zhao, Hongwei; Shang, Huiyu2020 IEEE Power & Energy Society General Meeting (GM 2020)2020 / 5 l https://doi.org/10.1109/PESGM41954.2020.9281725

book article

2049

book article

Resonant DC transformer for grid-interactive energy efficient buildingsCarvalho da Silva, Edivan Laercio; Blinov, Andrei; Chub, Andrii; Rathore, Akshay Kumar; Vinnikov, Dmitri2024 IEEE 18th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG)2024 / 6 p https://doi.org/10.1109/CPE-POWERENG60842.2024.10604353 Article at Scopus Article at WOS

book article

2050

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Resource-aware scene text recognition using learned features, quantization, and contour-based character extractionAdemola, Olutosin Ajibola; Petlenkov, Eduard; Leier, MairoIEEE Access2023 / p. 56865 - 56874 https://doi.org/10.1109/ACCESS.2023.3283931 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Related publications 1

Efficient Deep Learning Model Optimization for Resource Constrained Devices = Tõhus süvaõppe mudeli optimeerimine piiratud ressurssidega seadmete jaoks

IEEE (publisher)

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