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Functional level testability analysis for digital circuits (title)
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Functional level testability analysis for digital circuits
Ubar, Raimund-Johannes
1992
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2
book article
Functional level testability analysis for digital circuits
Ubar, Raimund-Johannes
;
Kuchcinski, Ktzysztof
ETC '93 : European Test Conference, Rotterdam, The Netherlands, April 19-22, 1993
1993
/
p. 545-546
book article
Number of records 2, displaying
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keyword
18
1.
testability analysis
2.
high-level functional fault model
3.
digital circuits
4.
digital circuits and systems
5.
functional data analysis
6.
functional gene analysis
7.
functional institutional analysis
8.
level-crossing analog-to-digital converters
9.
level-crossing analogue-to-digital converters (ADC)
10.
gate-level analysis
11.
hierarchical two-level analysis
12.
system-level analysis
13.
digital image analysis
14.
droplet digital image analysis
15.
logic level and high level BDDs
16.
design for testability
17.
design-for-testability
18.
testability
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