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book article
Ways for board and system test to benefit from FPGA embedded instrumentation
Ehrenberg, Heiko
;
Odintsov, Sergei
;
Devadze, Sergei
;
Jutman, Artur
;
Aleksejev, Igor
;
Wenzel, Thomas
2019 IEEE AUTOTESTCON
2019
/
10 p : ill
https://doi.org/10.1109/AUTOTESTCON43700.2019.8961057
book article
Number of records 1, displaying
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keyword
37
1.
FPGA-Embedded Instrument
2.
business school learning rate measurement instrument
3.
instrument transformers
4.
voltage instrument transformer
5.
Field Programmable Gate Array (FPGA)
6.
Field-Programmable Gate Array (FPGA)
7.
FPGA
8.
FPGA (field-programmable gate array)
9.
FPGA based lab kit
10.
FPGA based test
11.
FPGA implementation
12.
FPGA redaction
13.
FPGA/PSoC design
14.
FPGA-Assisted Test
15.
FPGA-based development boards
16.
FPGA-based prototyping
17.
FPGA-centric test
18.
Opal Kelly field programmable gate array (FPGA)
19.
recycled FPGA detection
20.
dependable embedded systems
21.
digital embedded work
22.
embedded control
23.
embedded deep learning
24.
embedded devices
25.
embedded electronics
26.
Embedded hardware
27.
embedded instrumentation
28.
embedded instruments
29.
embedded networks/NoC
30.
embedded platform
31.
embedded sensor
32.
embedded sensors
33.
embedded software
34.
embedded system
35.
embedded systems
36.
embedded test
37.
laminate embedded printed circuit board
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