Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
Equivalent single layer (keyword)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publications
..
year
year of publication
Loading..
author
Loading..
TalTech department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
4
Look more..
(1/135)
Export
export all inquiry results
(4)
Save TXT fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
journal article EST
/
journal article ENG
Application of equivalent single layer approach for ultimate strength analyses of ship hull girder
Putranto, Teguh
;
Kõrgesaar, Mihkel
;
Tabri, Kristjan
Journal of marine science and engineering
2022
/
art. 1530
https://doi.org/10.3390/jmse10101530
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
Related publications
1
Equivalent single layer approach for ultimate strength assessment of ship structures = Ekvivalentne koorikelement laeva konstruktsioonide piirtugevuse hindamiseks
2
book article EST
/
book article ENG
Numerical investigation on the buckling response of stiffened panel subjected to biaxial compression with non-linear equivalent single layer approach
Putranto, Teguh
;
Kõrgesaar, Mihkel
31st International Ocean and Polar Engineering Conference, ISOPE 2021 Virtual, Online 20 June 2021 through 25 June 2021 : proceedings of the International Offshore and Polar Engineering Conference
2021
/
p. 2893−2900
https://publications.isope.org/proceedings/ISOPE/ISOPE%202021/data/pdfs_Vol4/4206-21TPC-0462.pdf
Conference Proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
3
journal article EST
/
journal article ENG
Ultimate strength assessment of stiffened panel under uni-axial compression with non-linear equivalent single layer approach
Putranto, Teguh
;
Kõrgesaar, Mihkel
;
Jelovica, Jasmin
;
Tabri, Kristjan
;
Naar, Hendrik
Marine structures
2021
/
art. 103004, 17 p. : ill
https://doi.org/10.1016/j.marstruc.2021.103004
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
Related publications
1
Equivalent single layer approach for ultimate strength assessment of ship structures = Ekvivalentne koorikelement laeva konstruktsioonide piirtugevuse hindamiseks
4
journal article EST
/
journal article ENG
Ultimate strength assessment of stiffened panels using Equivalent Single Layer approach under combined in-plane compression and shear
Putranto, Teguh
;
Kõrgesaar, Mihkel
;
Jelovica, Jasmin
Thin-Walled Structures
2022
/
art. 109943
https://doi.org/10.1016/j.tws.2022.109943
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
Related publications
1
Equivalent single layer approach for ultimate strength assessment of ship structures = Ekvivalentne koorikelement laeva konstruktsioonide piirtugevuse hindamiseks
Number of records 4, displaying
1 - 4
keyword
135
1.
Equivalent single layer
2.
ac side equivalent admittance
3.
equivalent circuit
4.
equivalent circuit model
5.
equivalent circuits
6.
equivalent control
7.
equivalent transformations of SSBDDs
8.
magnetic equivalent circuit (MEC)
9.
sodium equivalent
10.
water vapour diffusion equivalent thickness
11.
absorber layer
12.
abstraction layer
13.
additive layer manufacturing
14.
atomic layer deposition
15.
atomic layer deposition (ALD)
16.
average graphene layer curvature
17.
bottom boundary layer
18.
boundary layer
19.
buffer layer
20.
Cd-free buffer layer
21.
composite layer
22.
cross-layer
23.
cross-layer fault tolerance
24.
cross-layer reliability
25.
deep layer
26.
double-layer capacitance
27.
Ekman layer
28.
electric double-layer
29.
electron transport layer
30.
glaze layer
31.
hole transport layer
32.
interface layer
33.
layer fusion
34.
layer growing curvature method
35.
layer removing
36.
layer-wise displacement theory
37.
MAC layer
38.
maximal two-layer exchange
39.
mechanically mixed layer (MML)
40.
mixed layer drifter
41.
monograin layer solar cell
42.
monograin layer solar cells
43.
network layer
44.
oxide layer
45.
physical layer
46.
seed layer
47.
selenium capping layer
48.
SiO2 interface layer
49.
sub-maximal two-layer exchange
50.
zero-strenght-layer
51.
zero‐strength layer
52.
zero-strength layer
53.
zero‐strength layer
54.
ZnS buffer layer
55.
thin layer chromatography
56.
Thin layer chromatography (TLC)
57.
thin-layer chromatography
58.
thin-layer rendering
59.
thin-layer rendering system
60.
thin-layer rendering systems
61.
TiO2 electron transport layer
62.
tribo-layer
63.
upper mixed layer
64.
cryoelectron microscopy single-particle analysis
65.
digital single market
66.
digital single market
67.
EU digital single market
68.
EU single digital gateway
69.
EU single market
70.
heavyweight and lightweight (timberframed) single-family buildings
71.
single
72.
single and dual internal variables
73.
single- and multi-walled carbon nanotubes
74.
single board computer
75.
single cell incubation
76.
single channel
77.
single crystal
78.
single crystal analysis
79.
single crystal structure
80.
single crystal X-ray diffraction
81.
single crystals
82.
single digital gateway
83.
single digital gateway regulation (SDGR)
84.
single electron transfer
85.
single energy market
86.
single event effects
87.
Single Event Transient (SET) and Soft Errors
88.
Single Event Upset (SEU)
89.
single event upsets
90.
single far-field measurement
91.
Single far-field pattern
92.
single market integration
93.
single measurement
94.
single nucleotide
95.
single phase
96.
single phase inverter
97.
single phase system
98.
Single Point Positioning (SPP)
99.
single room ventilation unit
100.
single sheet tester
101.
single sheet tester (SST)
102.
single slit
103.
single stage converter
104.
Single Stuck-at Faults
105.
single switch
106.
single switch modulation
107.
single walled carbon nanotubes
108.
single-active bridge
109.
single-active-bridge
110.
single-board computer
111.
single-cell model
112.
single-cell RNA-seq
113.
single-ended primary-inductor converter (SEPIC)
114.
single-event effects
115.
Single-Event Upset (SEU)
116.
single-event upsets
117.
single-family buildings
118.
single-family households
119.
single-molecule magnet
120.
single-molecule measurement
121.
single-nucleotide polymorphism
122.
single-phase
123.
single-phase induction motor
124.
single-phase inverter
125.
single-phase system
126.
single-stage
127.
single-stage AC-DC converter
128.
single-stage boost inverter
129.
single-stage inverter
130.
single-stage isolated ac-dc converters
131.
single-stage matrix converter
132.
single-stage system
133.
single-switch converter
134.
single-walled carbon nanotubes
135.
single‐walled carbon nanotubes
×
match
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TalTech department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TalTech department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT