Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
Single Stuck-at Faults (keyword)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publications
..
year
year of publication
Loading..
author
Loading..
TalTech department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
1
Look more..
(1/104)
Export
export all inquiry results
(1)
Save TXT fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
book article
Gate-level graph representation learning : a step towards the improved stuck-at faults analysis
Balakrishnan, Aneesh
;
Alexandrescu, Dan
;
Jenihhin, Maksim
;
Lange, Thomas
;
Glorieux, Maximilien
Proceedings of the Twenty Second International Symposium on Quality Electronic Design (ISQED) : Santa Clara, USA, 7-9 April 2021
2021
/
p. 24-30
https://doi.org/10.1109/ISQED51717.2021.9424256
book article
Related publications
1
A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
Number of records 1, displaying
1 - 1
keyword
104
1.
Single Stuck-at Faults
2.
stuck-at-faults
3.
stuck-at fault model
4.
arc faults
5.
Avoiding Mutual Masking of Multiple Faults
6.
broken rotor bar faults
7.
circuit faults
8.
classification of faults
9.
control faults
10.
Cross-level Modeling of Faults in Digital Systems
11.
faults
12.
faults classification
13.
faults in power system
14.
hard-to-detect faults
15.
high impedance faults
16.
high-level control faults
17.
indefinite faults
18.
inter-disk and inter-turn faults
19.
localization of faults
20.
motor faults
21.
multiple faults
22.
non-robust and functional sensitization of delay faults
23.
power distribution faults
24.
power system faults
25.
rotor faults
26.
Safe Faults
27.
tectonic faults
28.
terms-transient faults
29.
Test Group Generation for Detecting Multiple Faults
30.
transient faults
31.
transition delay faults
32.
unknown faults
33.
untestable faults
34.
cryoelectron microscopy single-particle analysis
35.
digital single market
36.
digital single market
37.
Equivalent single layer
38.
EU digital single market
39.
EU single digital gateway
40.
EU single market
41.
heavyweight and lightweight (timberframed) single-family buildings
42.
single
43.
single and dual internal variables
44.
single- and multi-walled carbon nanotubes
45.
single board computer
46.
single cell incubation
47.
single channel
48.
single crystal
49.
single crystal analysis
50.
single crystal structure
51.
single crystal X-ray diffraction
52.
single crystals
53.
single digital gateway
54.
single digital gateway regulation (SDGR)
55.
single electron transfer
56.
single energy market
57.
single event effects
58.
Single Event Transient (SET) and Soft Errors
59.
Single Event Upset (SEU)
60.
single event upsets
61.
single far-field measurement
62.
Single far-field pattern
63.
single market integration
64.
single measurement
65.
single nucleotide
66.
single phase
67.
single phase inverter
68.
single phase system
69.
Single Point Positioning (SPP)
70.
single room ventilation unit
71.
single sheet tester
72.
single sheet tester (SST)
73.
single slit
74.
single stage converter
75.
single switch
76.
single switch modulation
77.
single walled carbon nanotubes
78.
single-active bridge
79.
single-board computer
80.
single-cell model
81.
single-cell RNA-seq
82.
single-ended primary-inductor converter (SEPIC)
83.
single-event effects
84.
Single-Event Upset (SEU)
85.
single-event upsets
86.
single-family buildings
87.
single-family households
88.
single-molecule magnet
89.
single-molecule measurement
90.
single-nucleotide polymorphism
91.
single-phase
92.
single-phase induction motor
93.
single-phase inverter
94.
single-phase system
95.
single-stage
96.
single-stage AC-DC converter
97.
single-stage boost inverter
98.
single-stage inverter
99.
single-stage isolated ac-dc converters
100.
single-stage matrix converter
101.
single-stage system
102.
single-switch converter
103.
single-walled carbon nanotubes
104.
single‐walled carbon nanotubes
×
match
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TalTech department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TalTech department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT