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1
book article
High-level modeling and testing of multiple control faults in digital systems
Jasnetski, Artjom
;
Oyeniran, Adeboye Stephen
;
Tšertov, Anton
;
Schölzel, Mario
;
Ubar, Raimund-Johannes
Formal proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 20-22, 2016, Košice, Slovakia
2016
/
[6] p. : ill
http://dx.doi.org/10.1109/DDECS.2016.7482445
book article
2
book article
How to prove that a circuit is fault-free?
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
Proceedings : 15th Euromicro Conference on Digital System Design DSD 2012 : 5-8 September 2012, Cesme, Izmir, Turkey
2012
/
p. 427-430 : ill
https://www.researchgate.net/publication/262271409_How_to_Prove_that_a_Circuit_is_Fault-Free
book article
3
book article
Multiple fault testing in systems-on-chip with high-level decision diagrams
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
;
Schölzel, Mario
;
Vierhaus, Heinrich Theodor
Proceedings of 2015 10th International Design & Test Symposium (IDT) : Dead Sea, Jordan, 14-16 December 2015
2015
/
p. 66-71 : ill
http://dx.doi.org/10.1109/IDT.2015.7396738
book article
4
book article
Multiple stuck-at-fault detection theorem
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia
2012
/
p. 236-241 : ill
book article
5
book article
Representing gate-level SET faults by multiple SEU faults on RT-level
Bagbaba, Ahmet Cagri
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
;
Sauer, Christian
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020 : proceedings
2020
/
art. 19889351, 6 p. : ill
https://doi.org/10.1109/IOLTS50870.2020.9159715
book article
Related publications
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
6
book article
Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
2013
/
p. 36-41 : ill [CD-ROM]
book article
Number of records 6, displaying
1 - 6
keyword
66
1.
Avoiding Mutual Masking of Multiple Faults
2.
multiple faults
3.
Test Group Generation for Detecting Multiple Faults
4.
multiple-input multiple output system
5.
broken rotor bar faults
6.
circuit faults
7.
classification of faults
8.
control faults
9.
Cross-level Modeling of Faults in Digital Systems
10.
faults
11.
faults classification
12.
faults in power system
13.
hard-to-detect faults
14.
high impedance faults
15.
high-level control faults
16.
indefinite faults
17.
inter-disk and inter-turn faults
18.
localization of faults
19.
motor faults
20.
non-robust and functional sensitization of delay faults
21.
power distribution faults
22.
power system faults
23.
rotor faults
24.
Safe Faults
25.
Single Stuck-at Faults
26.
stuck-at-faults
27.
tectonic faults
28.
terms-transient faults
29.
transient faults
30.
transition delay faults
31.
unknown faults
32.
untestable faults
33.
carrier sense multiple access/collision avoidance (CSMA/CA)
34.
consistency in multiple microplastic datasets
35.
multiple
36.
multiple active bridge
37.
multiple case study
38.
Multiple cases study
39.
Multiple criteria analysis
40.
multiple criteria approach
41.
multiple criteria assessment
42.
multiple criteria decision making
43.
multiple criteria modeling
44.
multiple factorial analysis
45.
multiple headspace extraction
46.
multiple inheritance
47.
Multiple Linear Regression
48.
multiple melting events
49.
multiple regression models
50.
multiple scales
51.
multiple scattering
52.
multiple sclerosis
53.
multiple source localization
54.
multiple streams framework
55.
multiple stressor effect sizes
56.
multiple stressor effect types
57.
multiple stressors
58.
multiple UAVs
59.
Non Orthogonal Multiple Access (NOMA)
60.
nonorthogonal multiple access (NOMA)
61.
Non-Orthogonal Multiple Access (NOMA)
62.
Orthogonal Multiple Access (OMA)
63.
progressive-onset multiple sclerosis
64.
secondary progressive multiple sclerosis
65.
SSBDDs with multiple inputs
66.
time division multiple access (TDMA)
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