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Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany2011 https://www.computer.org/csdl/proceedings/ddecs/2011/12OmNvTBBbs

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202

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Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia2012 http://www.ester.ee/record=b2777270*est

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203

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Pöörlevate elektrimasinate diagnostika staatorisignaalide analüüsi meetodilVaimann, Toomas; Kallaste, Ants; Kilk, AleksanderTaastuvate energiaallikate uurimine ja kasutamine : neljateistkümnenda konverentsi kogumik = Investigation and Usage of Renewable Energy Sources : fourteenth conference proceedings : [8. nov. 2012, Tartu]2012 / lk. 78-87 : ill

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204

journal article EST / journal article ENG

Red-brown pigmentation of acidipropionibacterium jensenii is tied to haemolytic activity and cyl-Like gene clusterSmolander, Olli-Pekka; Deptula, Paulina; Loivamaa, Iida; Laine, Pia; Roberts, Richard J.; Piironen, Vieno; Paulin, Lars; Savijoki, Kirsi; Auvinen, Petri; Varmanen, PekkaMicroorganisms2019 / p. 15 p. : ill https://doi.org/10.3390/microorganisms7110512 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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205

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Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPGPalermo, N.; Tihhomirov, Valentin; Copetti, Thiago; Jenihhin, Maksim; Raik, Jaan; Kostin, Sergei2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102405

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206

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Reliability and operation diagnostics of light rail electric transport in Estonia [Electronic resource]Rosin, Argo; Lehtla, Tõnu; Möller, TaaviEPE-PEMC 2006 : 12th International Power Electronics and Motion Control Conference : Portorož, Slovenia, August 30 - September 1, 2006 : proceedings2006 / p. 1751-1756 : ill. [CD-ROM]

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207

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Research and training environment for digital design and testUbar, Raimund-Johannes; Wuttke, Heinz-DietrichProceedings of the Eighth IASTED International Conference on Computers and Advanced Technology in Education : August 29-31, 2005, Oranjestad, Aruba2005 / p. 232-237 : ill https://ieeexplore.ieee.org/document/1408779

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208

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Research environment for teaching digital testIvask, Eero; Jutman, Artur; Orasson, Elmet; Raik, Jaan; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichSynergies between Information and Automation : 49. Internationales Wissenschaftliches Kolloquium, 27.-30.9.2004, Technische Universität Ilmenau, Germany. Volume 22004 / p. 468-473 : ill https://pld.ttu.ee/dildis/publications/IWK'2004_res_inv.pdf

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209

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Results of thermographic diagnostics of electric grid contact junctions and generators of oil shale power plantsDorovatovski, Nikolai; Liik, OlevOil shale2005 / 2S, p. 243-257 : ill https://artiklid.elnet.ee/record=b2346725*est

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210

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Review of electrical machine diagnostic methods applicability in the perspective of Industry 4.0Asad, Bilal; Vaimann, Toomas; Rassõlkin, Anton; Kallaste, Ants; Belahcen, AnouarScientific Journal of Riga Technical University. Electrical, control and communication engineering2018 / p. 108–116 : ill https://doi.org/10.2478/ecce-2018-0013

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211

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Review of high voltage instrument transformer condition monitoringAsefi, Sajjad; Asad, Bilal; Leinakse, Madis; Manninen, Henri; Kilter, Jako; Vaimann, Toomas; Kallaste, Ants; Tealane, Marko; Landsberg, MartIEEE Transactions on Dielectrics and Electrical Insulation2024 / 12 p https://doi.org/10.1109/TDEI.2024.3422260

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212

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SAPDEC: a program devoted to automatic fault diagnosis of electric circuitsLiberatore, A.; Manetti, S.; Piccirilli, Maria Cristina; Reatti, A.Automation, simulation & measurement : ASM'91 : 3rd biennal conference, Tallinn, October 7-11, 1991. Section A. Section M / Tallinn Technical University1992 / p. 16-22: ill

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213

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Scalable algorithm for structural fault collapsing in digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Orasson, Elmet; Raik, Jaan2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) : October 5-7, 2015, Daejeon, Korea2015 / p. 171-176 : ill

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214

dissertation

Self-diagnosis in digital systems = Isediagnoosivad digitaalsüsteemidKostin, Sergei2012 https://www.ester.ee/record=b2757857*est

dissertation

215

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Self-healing photovoltaic microconverter with zero redundancy and accurate low-cost fault detectionBakeer, Abualkasim Ahmed Ali; Chub, Andrii; Vinnikov, DmitriIEEE transactions on industrial electronics2024 / p. 646-656 https://doi.org/10.1109/TIE.2023.3250836

journal article

Seotud publikatsioonid 1

Fault-tolerant galvanically isolated DC‑DC converters with zero redundancy = Null-liiasusega veatolerantsed galvaanilise isolatsiooniga alalispingemuundurid

216

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Sensorless detection of induction motor faults using the clarke vector approachVaimann, Toomas; Kallaste, Ants; Kilk, AleksanderScientific journal of Riga Technical University. Serija 4, Power and electrical engineering2011 / p. 43-48 : ill https://www.researchgate.net/publication/258547195_Sensorless_Detection_of_Induction_Motor_Rotor_Faults_Using_the_Clarke_Vector_Approach

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217

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7-valued algebra for transition delay fault analysisKõusaar, Jaak; Ubar, Raimund-JohannesBEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia2014 / p. 89-92 : ill

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218

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Shared Structurally Synthesized BDDs for speeding-up parallel pattern simulation in digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Raik, Jaan2015 Nordic Circuits and Systems Conference (NORCAS) : NORCHIP & International Symposium on System-on-Chip (SoC) : 1st IEEE NORCAS Conference : 26-28 October 2015, Oslo, Norway2015 / [4] p. : ill http://dx.doi.org/10.1109/NORCHIP.2015.7364406

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219

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Shift register based TPG for at-speed interconnect BISTJutman, ArturMIEL 2004 : 24th International Conference on Microelectronics : Niš, Serbia and Montenegro, 16-19 May 2004 : proceedings. Volume 22004 / p. 751-754 : ill https://ieeexplore.ieee.org/document/1314941?signout=success

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220

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Simple event correlator - best practices for creating scalable configurationsVaarandi, Risto; Blumbergs, Bernhards; Caliskan, Emin2015 IEEE International Multi-Disciplinary Conference on Cognitive Methods in Situation Awareness and Decision (CogSIMA 2015) : 9-12 March 2015, Orlando, Florida, USA2015 / p. 96-100 http://dx.doi.org/10.1109/COGSIMA.2015.7108181

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221

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Simulating system for minicomputer diagnostic programsKitsnik, Peeter; Ubar, Raimund-Johannes; Viilup, AguPreprints 1st IFAC/IFIP Symposium on Software for Computer Control, SOCOCO-76 : Tallinn, USSR, May 25-28, 19761976 / lk. [?] https://www.ester.ee/record=b1291026*est http://www.digar.ee/id/nlib-digar:451346

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222

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Single gate design error diagnosis in combinational circuitsUbar, Raimund-Johannes; Borrione, DominiqueProceedings of the Estonian Academy of Sciences. Engineering1999 / 1, p. 3-21: ill https://artiklid.elnet.ee/record=b1000315*est

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223

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Sisseehitatud isetestimine digitaalsüsteemidesKruus, HelenaA & A2011 / lk. 32-37 : ill https://artiklid.elnet.ee/record=b2472216*est

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224

dissertation

Software-based self-test for microprocessors with high-level decision diagrams = Mikroprotsessorite tarkvara-põhine enesetestimine kõrgtasandi otsustusdiagrammide põhjalJasnetski, Artjom2018 https://digi.lib.ttu.ee/i/?10629 https://www.ester.ee/record=b5151486*est

dissertation

225

journal article EST / journal article ENG

State-of-the-Art techniques for fault diagnosis in electrical machines: Advancements and future directionsAkbar, Siddique; Vaimann, Toomas; Asad, Bilal; Kallaste, Ants; Sardar, Muhammad Usman; Kudelina, KarolinaEnergies2023 / Art. 6345 https://doi.org/10.3390/en16176345 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG

diagnostika (tehnika) (subject term)

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