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journal article EST
/
journal article ENG
Inverse source problem with a posteriori boundary measurement for fractional diffusion equations
Janno, Jaan
;
Kian, Yavar
Mathematical methods in the applied sciences
2023
/
p. 15868-15882
https://doi.org/10.1002/mma.9432
Journal metrics at Scopus
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journal article EST
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journal article ENG
Number of records 1, displaying
1 - 1
keyword
131
1.
memory effect
2.
activation memory
3.
cache memory
4.
Digital Object Memory
5.
in-memory databases
6.
learning and memory
7.
long short term memory
8.
long short -term memory (LSTM)
9.
long short-term memory
10.
long short-term memory (LSTM)
11.
Long Short-Term Memory Networks (LSTMs)
12.
long-short term memory
13.
long-short-term memory (LSTM)
14.
material with memory
15.
memory
16.
memory architecture
17.
memory bottleneck
18.
memory efficiency
19.
memory interconnect test
20.
memory kernels
21.
memory management
22.
memory network
23.
memory overhead
24.
memory systems
25.
memory testing
26.
memory-induced resonance
27.
National memory
28.
non-volatile memory
29.
processing-in-memory
30.
random access memory
31.
relaxed memory
32.
shape memory alloy
33.
Shape memory alloys
34.
shape memory efect
35.
Ageing effect
36.
amplification effect
37.
ampli-fication effect
38.
anticompetitive object/effect
39.
attenuation effect
40.
axial end effect
41.
binding effect of national decisions
42.
Buffer effect
43.
bullwhip effect
44.
butterfly effect
45.
cascading effect
46.
climate effect
47.
combinatorial effect (CE)
48.
company size effect
49.
Computational effect
50.
dead-time effect
51.
disposition effect
52.
Doppler effect
53.
Dunning-Kruger effect
54.
dysynergistic effect
55.
economic effect
56.
edge effect
57.
effect
58.
effect concentrations bioaccumulation
59.
effect measurement
60.
effect of cellulose type and DP
61.
effect of high bide
62.
effect of national decisions on actions for competition damages
63.
effect of preparation procedure
64.
effect of surfactant
65.
effect of Ti and Nb
66.
effect on competition
67.
EMF effect
68.
exchange rate effect
69.
Failure mode and effect analysis (FMEA)
70.
failure modes and effect analysis
71.
family background effect
72.
field effect transistor
73.
fixed country-effect model
74.
ground effect
75.
ground effect vehicle (GEV)
76.
Hall–Petch effect
77.
hexokinase Warburg effect
78.
horizontal effect doctrine
79.
housemoney effect prospect theory
80.
incentive effect
81.
indirect effect
82.
isotope effect
83.
junction field-effect transistor (JFET)
84.
leverage effect
85.
local layout effect (LLE)
86.
longitudinal end effect
87.
magneto-elastic effect
88.
mass loading effect
89.
matrix effect
90.
mediation effect
91.
metal-oxide-semiconductor field-effect transistors (MOSFETs)
92.
microwave effect
93.
mineral matter effect
94.
mitigation strategies of UHI effect
95.
moderating effect
96.
multiple stressor effect sizes
97.
multiple stressor effect types
98.
multiplier effect
99.
peer effect
100.
Phonon Drag Effect
101.
photoelectric effect
102.
placebo effect
103.
plasmonic effect
104.
pseudo-Jahn-Teller effect
105.
real estate wealth effect
106.
rebound effect
107.
reflection effect
108.
reservoir effect
109.
Sandelin effect
110.
school effect
111.
size effect
112.
skin effect
113.
skin-effect
114.
snappy effect
115.
solvent effect
116.
stack effect
117.
standardized effect size
118.
Streisand effect
119.
substituent effect
120.
surface plasmon resonance effect
121.
synergetic effect
122.
synergistic effect
123.
Talbot effect
124.
temperature effect
125.
temperature effect component
126.
the Diderot effect
127.
thickness effect
128.
transverse edge effect
129.
Warburg effect
130.
well proximity effect (WPE)
131.
wind effect
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