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book article EST
/
book article ENG
Special session: reliability assessment recipes for DNN accelerators
Ahmadilivani, Mohammad Hasan
;
Bosio, Alberto
;
Deveautour, Bastien
;
Dos Santos, Fernando Fernandes
;
Guerrero-Balaguera, Juan-David
;
Jenihhin, Maksim
;
Kritikakou, Angeliki
;
Sierra, Robert Limas
;
Raik, Jaan
;
Taheri, Mahdi
42nd IEEE VLSI Test Symposium, VTS 2024 : proceedings
2024
/
11 p. : ill
https://doi.org/10.1109/VTS60656.2024.10538707
Conference proceedings at Scopus
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book article EST
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Related publications
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Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
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keyword
43
1.
error emulation
2.
emulation
3.
fault emulation
4.
assessment error
5.
automatic error correction
6.
bit error rate
7.
Bit Error Rate (BER)
8.
bit-error rate test
9.
conversion error
10.
design error localization
11.
error
12.
error analysis
13.
error correction
14.
error correction code
15.
error detection
16.
error localization
17.
error management
18.
error message
19.
error propagation
20.
error quantification
21.
error source
22.
Estimation error
23.
gating-aware error injection
24.
human error
25.
machine error
26.
maximum permissible error (deviation) of measurement result
27.
mean squared error estimation
28.
measurement error in household surveys
29.
online design error debug
30.
output error
31.
packet error rate
32.
packet error ratio
33.
sampling error
34.
soft error protection
35.
soft-error reliability
36.
symbol error rate
37.
symbol error rate (SER)
38.
tool inclination angle error
39.
truncation error
40.
vector error correction
41.
Vector Error Correction Model
42.
weighted prediction error
43.
word error rate
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