Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
Bottom Contact (keyword)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publications
..
year
year of publication
Loading..
author
Loading..
TalTech department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
1
Look more..
(1/39)
Export
export all inquiry results
(1)
Save TXT fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
book article
Investigation of silicon carbide diode structures via numerical simulations including anisotropic effects
Velmre, Enn
;
Udal, Andres
;
Masszi, F.
;
Nordlander, E.
Simulation of semiconductor devices and processes. Vol. 6
1995
/
p. 340-343: ill
https://link.springer.com/chapter/10.1007/978-3-7091-6619-2_83
book article
Number of records 1, displaying
1 - 1
keyword
39
1.
Bottom Contact
2.
bottom boundary layer
3.
bottom shear stress
4.
bottom waters
5.
bottom-of-the-pyramid
6.
bottom-up
7.
bottom-up control
8.
bottom-up effects
9.
bottom-up models
10.
bottom‐up participation
11.
bottom-up process management
12.
double bottom damage
13.
ice bottom communities
14.
near-bottom velocity
15.
non-reflecting bottom profile
16.
quartic bottom profile
17.
Triple bottom line
18.
triple bottom line (TBL)
19.
al contact
20.
Back contact
21.
contact acoustic nonlinearity
22.
contact angle
23.
contact co-culture
24.
contact reaction
25.
contact resistance
26.
Contact Stiffness
27.
contact tracing
28.
contact travel
29.
FEM Hertz contact and wear models
30.
gas-liquid contact surface
31.
Herzian contact
32.
non-contact co-culture
33.
non-contact optical measurement
34.
Non-emergency Contact Center
35.
plastic contact
36.
rolling contact fatigue (RCF)
37.
Semiconductor/electrolyte contact
38.
temperature in contact area
39.
two and four contact-point
×
match
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TalTech department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TalTech department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT