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32701
book article
Hierarchical defect-oriented fault simulation for digital circuits
Blyzniuk, M.
;
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Lobur, M.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE European Test Workshop : 23-26 May 2000, Cascais, Portugal : ETW 2000 : proceedings
2000
/
p. 69-74 : ill
https://ieeexplore.ieee.org/document/873781
book article
32702
book article
Hierarchical defect-oriented fault simulation for digital circuits
Blyzniuk, M.
;
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Lobur, M.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE European Test Workshop
2000
/
p. 151-156
https://ieeexplore.ieee.org/document/873781
book article
32703
book article
Hierarchical design error diagnosis in combinational circuits by stuck-at fault test patterns
Ubar, Raimund-Johannes
;
Jutman, Artur
Proceedings of the 6th International Conference on Mixed Design of Integrated Circuits and Systems : MIXDES'99 : Krakow, Poland, 17-19 June 1999
1999
/
p. 437-442 : ill
https://www.sciencedirect.com/science/article/pii/S0026271499002036
book article
32704
book article
A hierarchical Dirichlet process model for joint part-of-speech and morphology induction
Sirts, Kairit
;
Alumäe, Tanel
NAACL HLT 2012 : the 2012 Conference of the North American Chapter of the Association for Computational Linguistics : Human Language Technologies : proceedings of the conference : June 3-8, 2012, Montreal, Canada
2012
/
p. 407-416 : ill
https://www.researchgate.net/publication/262277910_A_hierarchical_Dirichlet_process_model_for_joint_part-of-speech_and_morphology_induction
book article
32705
book article
Hierarchical fault diagnosis in embedded digital systems with multi-level decision diagrams [Electronic resource]
Ubar, Raimund-Johannes
;
Evartson, Teet
;
Lensen, Harri
;
Aarna, Margit
5th International Conference on Industrial Automation = Cinquieme Conference Internationale sur l'Automatisation Industrielle : June 11-13, 2007, Montreal, Canada
2007
/
[6] p. [CD-ROM]
book article
32706
book article
Hierarchical fault simulation for finite state machines
Brik, Marina
;
Raik, Jaan
;
Ubar, Raimund-Johannes
The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings
2000
/
p. 145-148 : ill
book article
32707
book article
Hierarchical fault simulation in digital systems
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Ivask, Eero
;
Brik, Marina
International Symposium on Signals, Circuits and Systems : SCS 2001 : July 10-11, 2001, Iasi, Romania : proceedings
2001
/
p. 181-184 : ill
book article
32708
book article
Hierarchical identification of NBTI-critical gates in nanoscale logic
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014
2014
/
[6] p. : ill
book article
32709
book article
Hierarchical identification of untestable faults in sequential circuits
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Krivenko, Anna
;
Kruus, Margus
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings
2007
/
p. 668-671 : ill
http://dx.doi.org/10.1109/DSD.2007.4341539
book article
32710
book article
Hierarchical language for development of distributed algorithms
Kaldma, Tarmo
The 3rd Baltic Summer School on Information Technology and Systems Engineering, 1-5 August, 1995, Klaipeda : theses
1995
/
p. 25-28
book article
32711
book article
Hierarchical language for development of distributed algorithms
Kaldma, Tarmo
Proceedings of the Fourth Symposium on Programming Languages and Software Tools, Visegrad, Hungary, June 9-10, 1995
1995
/
p. 195-208
book article
32712
journal article EST
/
journal article ENG
Hierarchical microstructures and strengthening mechanisms of nano-TiC reinforced CoCrFeMnNi high-entropy alloy composites prepared by laser powder bed fusion
Chen, Hongyu
;
Kosiba, Konrad
;
Lu, Twen
;
Yao, Ning
;
Liu, Yang
;
Wang, Yonggang
;
Prashanth, Konda Gokuldoss
;
Suryanarayana, Challapalli
Journal of Materials Science & Technology
2023
/
p. 245-259 : ill
https://doi.org/10.1016/j.jmst.2022.06.053
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
32713
journal article EST
/
journal article ENG
Hierarchical nanostructures of ZnO obtained by spray pyrolysis
Dedova, Tatjana
;
Krunks, Malle
;
Oja Acik, Ilona
;
Klauson, Deniss
;
Volobujeva, Olga
;
Mere, Arvo
Materials chemistry and physics
2013
/
p. 69-75 : ill
https://doi.org/10.1016/j.matchemphys.2013.04.026
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
32714
journal article EST
/
journal article ENG
Hierarchical optimization configuration strategy of synchronous condenser in high penetration wind power sending systems
Sun, Zhenglong
;
Qiao, Jianhua
;
Meng, Xin
;
Pan, Chao
;
Li, Zewei
;
Belikov, Juri
;
Levron, Yoash
Electronics (Switzerland)
2024
/
art. 4359
https://doi.org/10.3390/electronics13224359
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
32715
journal article
Hierarchical physical defect reasoning in digital circuits
Kostin, Sergei
;
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Brik, Marina
Estonian journal of engineering
2011
/
3, p. 185-200
journal article
32716
book article
Hierarchical regions of interest
Järv, Priit
;
Tammet, Tanel
;
Tall, Marten
2018 IEEE 19th International Conference on Mobile Data Management : MDM 2018, 26–28 June 2018, Aalborg University, Denmark : proceedings
2018
/
p. 86-95
https://doi.org/10.1109/MDM.2018.00025
book article
32717
book article
Hierarchical temporal memory implementation on FPGA using LFSR based spatial pooler
Kerner, Madis
;
Tammemäe, Kalle
Proceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany
2017
/
p. 92-95
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553
book article
32718
book article
Hierarchical test generation based on alternative graph model
Ubar, Raimund-Johannes
Proceedings of the Second Workshop on Hierarchical Test Generation : Microelectronics Technology Park, Duisburg, Germany, September 25-26, 1995
1995
/
p. 18
book article
32719
journal article
Hierarchical test generation for combinational circuits with real defects coverage
Cibakova, Tatiana
;
Fischerova, Maria
;
Gramatova, Elena
;
Kuzmicz, W.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Microelectronics reliability
2002
/
p. 1141-1149 : ill
https://www.sciencedirect.com/science/article/pii/S002627140200080X
journal article
32720
book article
Hierarchical test generation for complex digital systems with control and data processing parts
Ubar, Raimund-Johannes
;
Raik, Jaan
"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 1999
1999
/
p. 43-52
book article
32721
dissertation
Hierarchical test generation for digital circuits represented by Decision Diagrams : thesis on informatics and system engineering
Raik, Jaan
2001
https://www.ester.ee/record=b1578107*est
dissertation
32722
book article
Hierarchical test generation for digital systems
Brik, Marina
;
Jervan, Gert
;
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Mixed design of integrated circuits and systems
1998
/
p. 131-136: ill
https://link.springer.com/chapter/10.1007/978-1-4615-5651-0_20
book article
32723
book article
Hierarchical test generation for digital systems based on combining bottom-up and top-down approaches
Raik, Jaan
;
Ubar, Raimund-Johannes
World Multiconference on Systemics, Cybernetics and Informatics, July 12-16, 1998, Orlando, Florida : proceedings. Vol. 1
1998
/
p. 374-381: ill
book article
32724
book article
Hierarchical test generation for finite state machines
Brik, Marina
;
Ubar, Raimund-Johannes
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 319-324: ill
book article
32725
book article
Hierarchical test generation with multi-level decision diagram models
Jervan, Gert
;
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the 7th IEEE North Atlantic Test Workshop, West Greenwich RI, USA, May 28-29, 1998
1998
/
p. 26-33
https://www.academia.edu/67811738/Hierarchical_Test_Generation_with_Multi_Level_Decision_Diagram_Models?hb-g-sw=7883185
book article
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