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30426
book article
Hidden champions of Estonia
Riisalu, Rein
;
Leppiman, Anu
Hidden champions in CEE and Turkey : carving out a global Niche
2013
/
p. 183-199 : tab
book article
30427
journal article EST
/
journal article ENG
The hidden power of emotions : How psychological factors influence skill development in smart technology adoption
Gerli, Paolo
;
Clement, Jessica
;
Esposito, Giovanni
;
Mora, Luca
;
Crutzen, Nathalie
Technological Forecasting and Social Change
2022
/
Article nr. 121721
https://doi.org/10.1016/j.techfore.2022.121721
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
30428
book article
Hidden secrets of transverse coastal upwelling jets revealed using a synergy of data in the Gulf of Finland, Baltic Sea
Delpeche-Ellmann, Nicole Camille
;
Soomere, Tarmo
Abstracts : [BSSC 2019]
2019
/
p. 112
https://www.su.se/polopoly_fs/1.446756.1566224624!/menu/standard/file/abstracts_A5_ny.pdf
book article
30429
book article
A hierarchical algorithm for moving vehicle identification based on acoustic noise analysis
Astapov, Sergei
;
Riid, Andri
Proceedings of the 19th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2012 : Warsaw, Poland, 24-26 May, 2012
2012
/
p. 467-472 : ill
https://ieeexplore.ieee.org/document/6226235
book article
30430
book article
Hierarchical analysis of short defects between metal lines in CMOS IC
Pleskacz, Witold A.
;
Jenihhin, Maksim
;
Raik, Jaan
;
Rakowski, Michal
;
Ubar, Raimund-Johannes
;
Kuzmicz, Wieslaw
Proceedings : 11th EUROMICRO Conference on Digital System Design : Architectures, Methods and Tools : (DSD 2008) : September 3-5, 2008, Parma, Italy
2008
/
p. 729-734 : ill
https://ieeexplore.ieee.org/document/4669309
book article
30431
book article
A hierarchical approach for devising area efficient concurrent online checkers
Niazmand, Behrad
;
Azad, Siavoosh Payandeh
;
Ghasempouri, Tara
;
Raik, Jaan
;
Jervan, Gert
Proceedings 2nd IEEE International Test Conference in Asia : ITC-Asia 2018, 15-17 August 2018, Harbin, China
2018
/
p. 139-144 : ill
https://doi.org/10.1109/ITC-Asia.2018.00034
book article
30432
book article
Hierarchical approach to test generation for digital systems at system, circuit and defect levels
Ubar, Raimund-Johannes
45. Internationales Wissenschaftliches Kolloquium, 04.-06.10.2000 : Tagungsband
2000
/
S. 711-716 : Ill
book article
30433
journal article
Hierarchical approaches to test generation and fault simulation
Ubar, Raimund-Johannes
Radioelectronics and informatics
2003
/
p. 204
journal article
30434
book article
Hierarchical attention network to manage processing resources of CPSs
Tammemäe, Kalle
SelPhyS Program
2017
https://www.ict.tuwien.ac.at/selphys2017/program
book article
30435
book article
A hierarchical automatic test pattern generator based on using alternative graphs
Brik, Marina
;
Jervan, Gert
;
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the 4th International Workshop Mixed Design of Integrated Circuits and Systems : MIXDES'97 : Poznan, Poland, 12-14 June 1997
1997
/
p. 415-420
book article
30436
book article
Hierarchical calculation of malicious faults for evaluating the fault-tolerance
Ubar, Raimund-Johannes
;
Devadze, Sergei
;
Jenihhin, Maksim
;
Raik, Jaan
;
Jervan, Gert
;
Ellervee, Peeter
Proceedings : Fourth IEEE International Symposium on Electronic Design, Test and Applications : [DELTA 2008] : 23-25 January 2008, Hong Kong, SAR, China
2008
/
p. 222-227 : ill
https://ieeexplore.ieee.org/document/4459544
book article
30437
journal article
Hierarchical conceptual clustering based on quantile method for identifying microscopic details in distributional data
Umbleja, Kadri
;
Ichino, Manabu
;
Yaguchi, Hiroyuki
Advances in data analysis and classification
2020
/
30 p. : ill
https://doi.org/10.1007/s11634-020-00411-w
journal article
30438
book article
Hierarchical concurrent test generation for synchronous sequential circuits
Ubar, Raimund-Johannes
;
Brik, Marina
Proceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 2000
2000
/
p. 533-538 : ill
book article
30439
book article
Hierarchical defect level test quality analysis
Blyzniuk, M.
;
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Lobur, M.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
VILAB User Forum
2000
/
[11] p
book article
30440
book article
Hierarchical defect-oriented fault simulation for digital circuits
Blyzniuk, M.
;
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Lobur, M.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE European Test Workshop
2000
/
p. 151-156
https://ieeexplore.ieee.org/document/873781
book article
30441
book article
Hierarchical defect-oriented fault simulation for digital circuits
Blyzniuk, M.
;
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Lobur, M.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE European Test Workshop : 23-26 May 2000, Cascais, Portugal : ETW 2000 : proceedings
2000
/
p. 69-74 : ill
book article
30442
book article
Hierarchical design error diagnosis in combinational circuits by stuck-at fault test patterns
Ubar, Raimund-Johannes
;
Jutman, Artur
Proceedings of the 6th International Conference on Mixed Design of Integrated Circuits and Systems : MIXDES'99 : Krakow, Poland, 17-19 June 1999
1999
/
p. 437-442 : ill
book article
30443
book article
Hierarchical fault diagnosis in embedded digital systems with multi-level decision diagrams [Electronic resource]
Ubar, Raimund-Johannes
;
Evartson, Teet
;
Lensen, Harri
;
Aarna, Margit
5th International Conference on Industrial Automation = Cinquieme Conference Internationale sur l'Automatisation Industrielle : June 11-13, 2007, Montreal, Canada
2007
/
[6] p. [CD-ROM]
book article
30444
book article
Hierarchical fault simulation for finite state machines
Brik, Marina
;
Raik, Jaan
;
Ubar, Raimund-Johannes
The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings
2000
/
p. 145-148 : ill
book article
30445
book article
Hierarchical fault simulation in digital systems
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Ivask, Eero
;
Brik, Marina
International Symposium on Signals, Circuits and Systems : SCS 2001 : July 10-11, 2001, Iasi, Romania : proceedings
2001
/
p. 181-184 : ill
book article
30446
book article
Hierarchical identification of NBTI-critical gates in nanoscale logic
Kostin, Sergei
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014
2014
/
[6] p. : ill
book article
30447
book article
Hierarchical identification of untestable faults in sequential circuits
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Krivenko, Anna
;
Kruus, Margus
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings
2007
/
p. 668-671 : ill
http://dx.doi.org/10.1109/DSD.2007.4341539
book article
30448
book article
Hierarchical language for development of distributed algorithms
Kaldma, Tarmo
The 3rd Baltic Summer School on Information Technology and Systems Engineering, 1-5 August, 1995, Klaipeda : theses
1995
/
p. 25-28
book article
30449
book article
Hierarchical language for development of distributed algorithms
Kaldma, Tarmo
Proceedings of the Fourth Symposium on Programming Languages and Software Tools, Visegrad, Hungary, June 9-10, 1995
1995
/
p. 195-208
book article
30450
journal article EST
/
journal article ENG
Hierarchical microstructures and strengthening mechanisms of nano-TiC reinforced CoCrFeMnNi high-entropy alloy composites prepared by laser powder bed fusion
Chen, Hongyu
;
Kosiba, Konrad
;
Lu, Twen
;
Yao, Ning
;
Liu, Yang
;
Wang, Yonggang
;
Prashanth, Konda Gokuldoss
;
Suryanarayana, Challapalli
Journal of Materials Science & Technology
2023
/
p. 245-259 : ill
https://doi.org/10.1016/j.jmst.2022.06.053
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
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