Raik, J., Nõmmeots, T., Ubar, R.-J.

prindi

New method of testability calculation to guide RT-level test generation

autor

Raik, Jaan

Nõmmeots, Tanel

Ubar, Raimund-Johannes

vastutusandmed

Jaan Raik, Tanel Nõmmeots, Raimund Ubar

allikas

4th IEEE Latin-American Test Workshop : LATW2003 : Natal, Brazil, February 16-19, 2003

ilmumiskoht

[S. l.]

ilmumisaasta

2003

leheküljed

p. 46-51 : ill

leitav

https://link.springer.com/article/10.1007/s10836-005-5288-5

märksõna

digitaaltehnika

testimine

otsustusdiagrammid

märkused

Bibliogr.: 12 ref

keel

inglise

Raik, J., Nõmmeots, T., Ubar, R.-J. New method of testability calculation to guide RT-level test generation // 4th IEEE Latin-American Test Workshop : LATW2003 : Natal, Brazil, February 16-19, 2003. [S. l.], 2003. p. 46-51 : ill. https://link.springer.com/article/10.1007/s10836-005-5288-5