Combining dynamic slicing and mutation operators for ESL correction
vastutusandmed
Urmas Repinski, Hanno Hantson, Maksim Jenihhin, Jaan Raik, Raimund Ubar, ... [et al.]
allikas
Proceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th-June 1st, 2012, Annecy, France
ilmumiskoht
Los Alimitos
kirjastus/väljaandja
ilmumisaasta
leheküljed
[6] p. : ill
konverentsi nimetus, aeg
2012 17th IEEE European Test Symposium (ETS), May 28th-June 1st, 2012
konverentsi toimumispaik
Annecy, France
ISBN
978-1-4673-0697-3
märkused
Bibliogr.: 28 ref
keel
inglise
Repinski, U., Hantson, H., Jenihhin, M., Raik, J., Ubar, R. et al. Combining dynamic slicing and mutation operators for ESL correction // Proceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th-June 1st, 2012, Annecy, France. Los Alimitos : IEEE Computer Society, 2012. [6] p. : ill.