Comparison of Si and SiC devices surge current capability by means of numerical simulations

vastutusandmed
Enn Velmre and Andres Udal
ilmumiskoht
[Tallinn]
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 77-80: ill
ISBN
9985-59-026-0
märkused
Bibl.: 11 ref
TTÜ struktuuriüksus
keel
inglise
Velmre, E., Udal, A. Comparison of Si and SiC devices surge current capability by means of numerical simulations // BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings. [Tallinn] : Tallinn Technical University, 1996. p. 77-80: ill.