prindi

At-speed functional built-in self-test methodology for processors [Electronic resource]

autor
Ubar, Raimund-Johannes
Indus, Viljar
Kalmend, Oliver
vastutusandmed
Raimund Ubar, Viljar Indus, Oliver Kalmend
allikas
Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka
ilmumiskoht
[S.l.]
kirjastus/väljaandja
IASTED
ilmumisaasta
2012
leheküljed
p. 168-172 : ill [CD-ROM]
seeria-sari
A publication of the international Association of Science and Technology for Development ; 785
konverentsi nimetus, aeg
IASTED International Conference on Engineering and Applied Science, December 27-29, 2012
konverentsi toimumispaik
Columbo, Sri Lanka
märksõna
protsessorid
testimine
võtmesõna
processor testing
functional self-test
test generation
ISBN
978-0-88986-941-7
märkused
Bibliogr.: 18 ref
TTÜ struktuuriüksus
arvutitehnika instituut
keel
inglise
Ubar, R., Indus, V., Kalmend, O. At-speed functional built-in self-test methodology for processors [Electronic resource] // Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka. [S.l.] : IASTED, 2012. p. 168-172 : ill [CD-ROM]. (A publication of the international Association of Science and Technology for Development ; 785).