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test generation (võtmesõna)
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1
artikkel kogumikus
Aspect-oriented testing of a rehabilitation system
Sarna, Külli
;
Vain, Jüri
VALID 2014 : the Sixth International Conference on Advances in System Testing and Validation Lifecycle : October 12-16, 2014, Nice, France
2014
/
p. 73-78 : ill
artikkel kogumikus
2
artikkel kogumikus
At-speed functional built-in self-test methodology for processors [Electronic resource]
Ubar, Raimund-Johannes
;
Indus, Viljar
;
Kalmend, Oliver
Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka
2012
/
p. 168-172 : ill [CD-ROM]
artikkel kogumikus
3
artikkel kogumikus
Exploiting aspects in model-based testing
Sarna, Külli
;
Vain, Jüri
FOAL'12 : proceedings of the eleventh workshop on Foundations of Aspect-Oriented Languages : March 26, 2012, Potsdam, German
2012
/
p. 45-47 : ill
https://www.researchgate.net/publication/254007794_Exploiting_aspects_in_model-based_testing
artikkel kogumikus
4
artikkel kogumikus EST
/
artikkel kogumikus ENG
GUARD: An ABC-GA hybrid approach utilizing mAchine LeaRning and dimensionality reduction for hardware Trojan detection
Hosseini, Mostafa
;
Azarpeyvand, Ali
;
Bagheri, Foad
;
Ghasempouri, Tara
2025 IEEE East-West Design & Test Symposium (EWDTS)
2025
/
8 p
http://doi.org/10.1109/EWDTS67441.2025.11303691
artikkel kogumikus EST
/
artikkel kogumikus ENG
5
artikkel kogumikus
High-level test data generation for software based self-test in microprocessors
Oyeniran, Adeboye Stephen
;
Jasnetski, Artjom
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 2017
2017
/
p. 86-91 : ill
https://doi.org/10.1109/MECO.2017.7977167
artikkel kogumikus
6
artikkel kogumikus
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
artikkel kogumikus
7
artikkel kogumikus
Implementation-independent functional test for transition delay faults in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia
2020
/
p. 646-650
https://doi.org/10.1109/DSD51259.2020.00105
artikkel kogumikus
8
artikkel kogumikus
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
artikkel kogumikus
9
artikkel kogumikus
Multiple control fault testing in digital systems with high-level decision diagrams
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings
2016
/
[6] p. : ill
http://dx.doi.org/10.1109/AQTR.2016.7501287
artikkel kogumikus
10
artikkel kogumikus
A novel random approach to diagnostic test generation
Osimiry, Emmanuel Ovie
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark
2016
/
[4] p. : ill
https://doi.org/10.1109/NORCHIP.2016.7792915
artikkel kogumikus
11
artikkel kogumikus EST
/
artikkel kogumikus ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
Article at Scopus
artikkel kogumikus EST
/
artikkel kogumikus ENG
12
artikkel kogumikus EST
/
artikkel kogumikus ENG
PATROL: an evolutionary APproach to Automatic Test Pattern Generation for hardware TROjan detection leveraging PSO-GA hybrid techniques
Hosseini, Mostafa
;
Azarpeyvand, Ali
;
Ghasempouri, Tara
Proceedings of the 2024 IEEE 33rd Asian Test Symposium : ATS 2024 : Ahmedabad, India, 17-20 December 2024
2024
/
6 p.
https://doi.org/10.1109/ATS64447.2024.10915294
Conference proceedings at Scopus
Article at Scopus
Article at WOS
artikkel kogumikus EST
/
artikkel kogumikus ENG
13
artikkel kogumikus
Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
2013
/
p. 36-41 : ill [CD-ROM]
artikkel kogumikus
14
artikkel kogumikus
Teaching advanced test issues in digital electronics
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Raik, Jaan
;
Wuttke, Heinz-Dietrich
Proceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic
2005
/
p. S2B-1 - S2B-6 : ill
http://dx.doi.org/10.1109/ITHET.2005.1560318
artikkel kogumikus
15
artikkel kogumikus
Teaching digital system test
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Kruus, Margus
The 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble
2017
/
[6] p
artikkel kogumikus
16
artikkel kogumikus
A tool set for teaching design-for-testability of digital circuits
Kostin, Sergei
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
2016
/
[6] p. : ill
https://doi.org/10.1109/EWME.2016.7496466
artikkel kogumikus
Kirjeid leitud 16, kuvan
1 - 16
võtmesõna
223
1.
behaviour level test generation
2.
functional test generation
3.
Hierarchical Multi-level Test Generation
4.
highlevel test generation
5.
implementation-independent test generation
6.
offline test generation
7.
provably correct test generation
8.
test generation
9.
test generation and fault diagnosis
10.
adaptive test strategy generation
11.
automated test pattern generation
12.
automatic test case generation
13.
automatic test pattern generation
14.
automatic test program generation
15.
high-level test data generation
16.
Test Group Generation for Detecting Multiple Faults
17.
test program generation
18.
Activity-based demand generation
19.
automated code generation
20.
automatic code generation
21.
Automatic generation control
22.
automatic GUI model generation
23.
building and urban form generation
24.
business model generation
25.
code generation
26.
data set generation
27.
decentralized key generation
28.
disaster alert generation
29.
distributed electricity generation
30.
distributed generation
31.
Distributed Generation (DG)
32.
distributed generation systems
33.
distributed power generation
34.
distrubuted power generation
35.
droplet generation
36.
droplet generation rate control
37.
electric power generation
38.
electricity generation
39.
energy generation
40.
extreme penetration level of non synchronous generation
41.
feasible path generation
42.
fifth generation computer
43.
food waste generation
44.
fourth generation district heating
45.
frequent item generation
46.
generation
47.
generation and transmission expansion planning
48.
Generation Costs
49.
generation of electric energy
50.
generation scheduling
51.
generation succession
52.
heat generation
53.
hydroelectric power generation
54.
hydrogen generation
55.
I–III generation
56.
job generation
57.
knowledge generation
58.
multisine generation
59.
next generation 4D printing
60.
next generation sequencing
61.
Next-generation probiotics
62.
next-generation sequencing
63.
oil-shale power generation
64.
pattern Generation
65.
photovoltaic (PV) generation
66.
photovoltaic generation dispatch
67.
power generation
68.
power generation dispatch
69.
power generation economics
70.
power generation planning
71.
PV generation
72.
PV power generation
73.
Renewable energy generation
74.
renewable generation
75.
residual generation
76.
rule generation
77.
Second generation bioethanol
78.
second generation of tribology models
79.
second generation sequencing
80.
signal generation
81.
silver generation
82.
sixth-generation (6G)
83.
solar power generation
84.
space generation advisory council
85.
template based sql generation
86.
trajectory generation
87.
waste generation
88.
wave generation
89.
WEEE generation
90.
white light generation
91.
wind energy generation
92.
wind generation
93.
wind power generation
94.
16S rRNA gene amplicon next-generation sequencing
95.
4GDH (4th generation district heating)
96.
4th generation district heating
97.
5th generation district heating
98.
accelerated shelf-life test
99.
antigen test
100.
Applications in Test Engineering
101.
ASTM G65 dry sand rubber wheel abrasion test
102.
Automated Synthesis of Software-based Self-test
103.
automated test environment
104.
Auvergne test-bed
105.
battery test
106.
behavioral test
107.
bending test
108.
bit-error rate test
109.
Board and System Test
110.
board test
111.
bounds test
112.
built-in self-test
113.
capillary condensation redistribution test
114.
chi-square test
115.
closed bottle test
116.
cognitive screening test
117.
compartment fire test
118.
compartment test
119.
cone penetration test (CPT)
120.
COVID-19 antigen test
121.
cutting test
122.
cybersecurity test bed
123.
DDR4 interconnect test
124.
design and test
125.
design-for-test
126.
deterministic test sequences
127.
diagnostic test
128.
digital test
129.
Digital test and testable design
130.
double-pulse test
131.
drawing test
132.
dry droplet antimicrobial test
133.
embedded test
134.
fan pressurisation test
135.
final test result prediction
136.
four-point bending test
137.
FPGA based test
138.
FPGA-Assisted Test
139.
FPGA-centric test
140.
functional self-test
141.
Granger causality test
142.
hardness test
143.
high-level synthesis for test
144.
high-speed serial link test
145.
IEEE 9 bus test system
146.
in situ tensile test in SEM
147.
industrial field test
148.
in-situ tensile test in SEM
149.
Johansen cointegration test
150.
Kolmogorov-Smirnov test
151.
load test
152.
logic built-in self-test
153.
Luria alternating series test
154.
Mann–Kendall test
155.
Mann-Kendall trend test
156.
memory interconnect test
157.
microprocessor test
158.
Model test
159.
multiplier test
160.
orthogonal test
161.
package test analysis
162.
parallel design and test
163.
performance test
164.
piezocone penetration test (CPTu)
165.
Point Load Test index
166.
pressurisation test
167.
processor-centric board test
168.
progressive damage test
169.
pseudo-exhaustive test
170.
purity test
171.
real-time room temperature test
172.
rolling thin film oven test
173.
rtioco-based timed test sequences
174.
seasonal Mann Kendall test
175.
seismic piezocone penetration test
176.
self-test
177.
self-test architectures
178.
sentence writing test
179.
serial sevens test
180.
ship towing test tank
181.
similar material simulation test
182.
small-scale fire test
183.
small‐scale test
184.
software based self-test
185.
software-based self-test
186.
software-based self-test (SBST)
187.
soil phosphorus (P) test
188.
standard test method
189.
static load test
190.
static-dynamic probing test (SDT)
191.
stress test
192.
system level test
193.
teaching design and test of systems
194.
tensile test
195.
tensile test
196.
test
197.
test and evaluation platform
198.
test automation
199.
test bench
200.
test coverage
201.
test driven development
202.
test driven modelling
203.
test embankment
204.
test equipment
205.
test groups
206.
test model design
207.
test optimization
208.
test packets
209.
test path synthesis
210.
test patterns
211.
test point insertion
212.
test reference year
213.
test replication
214.
test scenario description language
215.
test-bed
216.
test-chips
217.
test-house
218.
test-pattern
219.
test-suite reduction
220.
Three-point bending test
221.
unit root test
222.
usability platform test
223.
1995 ECC benchmark test
märksõna
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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