prindi

Test cost minimization for hybrid BIST

autor
Jervan, Gert
Peng, Zebo
Ubar, Raimund-Johannes
vastutusandmed
Gert Jervan, Zebo Peng, Raimund Ubar
allikas
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 25-27 October 2000, Yamanashi, Japan : proceedings
ilmumiskoht
Los Alamitos, CA
kirjastus/väljaandja
IEEE Computer Society
ilmumisaasta
2000
leheküljed
p. 283-298 : ill
leitav
https://ieeexplore.ieee.org/abstract/document/887168
märksõna
integraallülitused
testimine
algoritmid
ISBN
0-7695-0719-0
märkused
Bibliogr.: 8 ref
keel
inglise
Jervan, G., Peng, Z., Ubar, R. Test cost minimization for hybrid BIST // IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 25-27 October 2000, Yamanashi, Japan : proceedings. Los Alamitos, CA : IEEE Computer Society, 2000. p. 283-298 : ill. https://ieeexplore.ieee.org/abstract/document/887168