Dependence of the carrier removal rate in 4H-SIC PN structures on irradiation temperature
                                            autor
                                    
                                    
Davydovskaya, Klavdya S.
                                                    
                                                    
                                                    
                                                    
                                                    
                                            
                                            vastutusandmed
                                    
                                    
Alexander A. Lebedev, Klavdya S. Davydovskaya, Vitali V. Kozlovski, Oleg Korolkov, Natalja Sleptsuk, Jana Toompuu
                                                    
                                            
                                            ilmumiskoht
                                    
                                    
Zurich
                                                    
                                            
                                            kirjastus/väljaandja
                                    
                                    
                                
                                            ilmumisaasta
                                    
                                    
                                
                                            leheküljed
                                    
                                    
p. 730-733
                                                    
                                            
                                            seeria-sari
                                    
                                    
                                
                                            konverentsi nimetus, aeg
                                    
                                    
12th European Conference on Silicon Carbide and Related Materials (ECSCRM 2018) 2-6 September 2018
                                                    
                                            
                                            konverentsi toimumispaik
                                    
                                    
Birmingham, UK
                                                    
                                            
                                            ISSN
                                    
                                    
0255-5476
                                                    
                                            
                                            ISBN
                                    
                                    
978-303571332-9
                                                    
                                            
                                            märkused
                                    
                                    
Bibliogr.: 7 ref
                                                    
                                            
                                            teaduspublikatsioon
                                    
                                    
teaduspublikatsioon
                                                    
                                            
                                            TTÜ struktuuriüksus
                                    
                                    
                                
                                            keel
                                    
                                    
inglise
                                                    
                                            
                                    Lebedev, A.A., Davydovskaya, K.S., Kozlovski, V.V., Korolkov, O., Sleptsuk, N., Toompuu, J. Dependence of the carrier removal rate in 4H-SIC PN structures on irradiation temperature // Silicon Carbide and Related Materials 2018 : 12th European Conference on Silicon Carbide and Related Materials (ECSCRM 2018) : Selected, peer reviewed papers from the European Conference on Silicon Carbide and Related Materials (ECSCRM 2018), September 2-6, 2018,Birmingham, UK. Zurich : Trans Tech Publications, 2019. p. 730-733. (Materials science forum ; 963).