Sequential circuit test generation using decision diagram models
vastutusandmed
Jaan Raik, Raimund Ubar
ilmumiskoht
Los Alamitos
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 736-740: ill
leitav
ISBN
0-7695-0078-1
märkused
Bibl. 8 ref
keel
inglise
Raik, J., Ubar, R. Sequential circuit test generation using decision diagram models // Design, Automation and Test in Europe : DATE : Conference and Exhibition 1999 : Munich, Germany, March 9-12, 1999 : proceedings. Los Alamitos : IEEE Computer Society, 1999. p. 736-740: ill.