Sequential circuit test generation using decision diagram models
author
statement of authorship
Jaan Raik, Raimund Ubar
location of publication
Los Alamitos
publisher
year of publication
pages
p. 736-740: ill
url
ISBN
0-7695-0078-1
notes
Bibl. 8 ref
language
inglise
subject term
Raik, J., Ubar, R. Sequential circuit test generation using decision diagram models // Design, Automation and Test in Europe : DATE : Conference and Exhibition 1999 : Munich, Germany, March 9-12, 1999 : proceedings. Los Alamitos : IEEE Computer Society, 1999. p. 736-740: ill.