Nanoelectronics aging mitigation using SSBDD based techniques and dedicated sensors
vastutusandmed
Raimund Ubar, Fabian Luis Vargas, Maksim Jenihhin, Jaan Raik
allikas
MEDIAN Workshop on Circuit Reliability : Modeling and Monitoring, Rome, Italy, February 25, 2013
ilmumiskoht
[S.l.]
ilmumisaasta
leheküljed
[1] p
konverentsi nimetus, aeg
MEDIAN Workshop on Circuit Reliability: Modeling and Monitoring, February 25, 2013
konverentsi toimumispaik
Rome, Italy
märksõna
TTÜ struktuuriüksus
keel
inglise
Ubar, R., Vargas, F.L., Jenihhin, M., Raik, J. Nanoelectronics aging mitigation using SSBDD based techniques and dedicated sensors // MEDIAN Workshop on Circuit Reliability : Modeling and Monitoring, Rome, Italy, February 25, 2013. [S.l.], 2013. [1] p.