Machine learning to tackle the challenges of transient and soft errors in complex circuits
vastutusandmed
Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
allikas
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019, Greece
ilmumiskoht
Danvers
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 7-14 : ill
konverentsi nimetus, aeg
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019
konverentsi toimumispaik
Rhodes, Greece
võtmesõna
single-event effects
k-NN
CART
ridge regression
ISSN
1942-9401
ISBN
978-1-7281-2490-2
märkused
Bibliogr.: 15 ref
TTÜ struktuuriüksus
keel
inglise
Uurimisrühm
Lange, T., Balakrishnan, A., Glorieux, M. et al. Machine learning to tackle the challenges of transient and soft errors in complex circuits // 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019, Greece. Danvers : IEEE, 2019. p. 7-14 : ill.