Machine learning to tackle the challenges of transient and soft errors in complex circuits
statement of authorship
Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
source
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019, Greece
location of publication
Danvers
publisher
year of publication
pages
p. 7-14 : ill
conference name, date
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019
conference location
Rhodes, Greece
subject term
keyword
single-event effects
k-NN
CART
ridge regression
ISSN
1942-9401
ISBN
978-1-7281-2490-2
notes
Bibliogr.: 15 ref
TTÜ department
language
inglise
Lange, T., Balakrishnan, A., Glorieux, M. et al. Machine learning to tackle the challenges of transient and soft errors in complex circuits // 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019, Greece. Danvers : IEEE, 2019. p. 7-14 : ill.